Patent classifications
G01N2201/105
SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO
A system for non-invasively interrogating an in vivo sample for measurement of analytes comprises a pulse sensor coupled to the in vivo sample for detect a blood pulse of the sample and for generating a corresponding pulse signal, a laser generator for generating a laser radiation having a wavelength, power and diameter, the laser radiation being directed toward the sample to elicit Raman signals, a laser controller adapted to activate the laser generator, a spectrometer situated to receive the Raman signals and to generate analyte spectral data; and a computing device coupled to the pulse sensor, laser controller and spectrometer which is adapted to correlate the spectral data with the pulse signal based on timing data received from the laser controller in order to isolate spectral components from analytes within the blood of the sample from spectral components from analytes arising from non-blood components of the sample.
EUV mask inspection apparatus and method, and EUV mask manufacturing method including EUV mask inspection method
Provided are a method and an apparatus for inspecting an extreme ultraviolet (EUV) mask at a high speed with high optical efficiency, and a method of manufacturing the EUV mask, wherein the method of inspecting the EUV mask is included in the method of manufacturing the EUV mask. The apparatus for inspecting the EUV mask includes a light source configured to generate and output light, a linear zone plate configured to convert the light from the light source to light having a linear form, a slit plate configured to output the light having the linear form by removing a higher-order diffracted light component from the light having the linear form, a stage on which the EUV mask is located, and a detector configured to detect the light reflected from the EUV mask, in response to the light being irradiated onto and reflected from the EUV mask.
Fluorescence lifetime sensor module and method of determining a fluorescence lifetime using a sensor module
A fluorescence lifetime sensor module comprises an opaque housing having a first chamber and a second chamber which are separated by a light barrier. An optical emitter is arranged in the first chamber and configured to emit through a first aperture. Emission of pulses of light of a specified wavelength is arranged to optically excite a fluorescent probe to be positioned in front of the sensor module. A detector is arranged in the second chamber and configured to detect through a second aperture received photons from the fluorescent probe. A measurement block is configured to determine respective difference values representative of an arrival time of one of the received photons with respect to the emission pulses. A histogram block is configured to accumulate the difference values in a histogram. A processing circuit is configured to compute time-of-flight values based on an evaluation of the histogram, compute a fluorescence lifetime from the time-of-flight values and generate an output signal being indicative of the fluorescence lifetime of the fluorescent probe. A control unit is configured to initiate pulsed emission of the optical emitter.
FAST MULTIPHOTON MICROSCOPE
The invention provides improved systems and methods for multiphoton microscopy including pixel clocking techniques for minimizing pixel integration time and providing consistent signal intensity with maximized imaging speeds. Various systems and method are described for optimizing laser repetition rate based on dye lifetime, combining polygonal mirror scanning and stage translation, using the laser pulse signal to time pixel collection, and minimizing laser pulses and dye usage based on signal to background ratios.
Scanning type laser induced spectrum analysis and detection system
A scanning type laser induced spectrum surface range analysis and detection system includes a laser emitting head connected to an external laser inducing light source, which generates lasers emitted through the laser emitting head, so as to generate laser induced plasma. A focusing optical device converges induction excited laser beams emitted by the laser emitting head onto a surface of a tested sample. Then, a reflector collects wide spectral range induced plasma scattered light signals of the tested sample and converges the signals into a light collecting device. The light collecting device converges induced plasma scattered light into an optical fiber and transmits the induced plasma scattered light to an external spectrograph; and the external spectrograph divides a spectrum formed by the plasma to obtain spectral strength data of different wavelengths.
Light collection arrangement for optical emission spectroscopy
In accordance with an example embodiment of the invention, a detector assembly for an analyzer device for analysis of elemental composition of a sample using optical emission spectroscopy is provided. The detector assembly comprises an exciter for generating an excitation focused at a target position to invoke an optical emission from a surface of the sample at the target position; and a light collection arrangement for transferring the optical emission to a spectrometer. The light collection arrangement comprises a concave spherical mirror, an optical receiver arranged in an image point in the principal axis of the concave spherical mirror and a folding mirror including at least one aperture. The exciter is arranged with respect to the light collection arrangement such that the excitation is transferred towards the target position through said at least one aperture, and the folding mirror is arranged between the concave spherical mirror and the optical receiver such that the folding mirror folds the principal axis of the concave spherical mirror towards the target position and such that said at least one aperture is aligned with the principal axis of the concave spherical mirror to allow transferring optical emission reflected from the concave spherical mirror therethrough towards the optical receiver.
PROCESS AND SYSTEM FOR MEASURING MORPHOLOGICAL CHARACTERISTICS OF FIBER LASER ANNEALED POLYCRYSTALLINE SILICON FILMS FOR FLAT PANEL DISPLAY
A method of measuring morphological characteristics of a laser annealed film having a crystalline structure, which is defined by at least one row of side-to-side positioned grains each having a length (Lg), which is uniform for the grains, and width (Wg), wherein a length of the row (Lr) corresponds to a cumulative width Wg of the grains and creates a diffraction of various orders of diffraction, the method includes generating a monochromatic light; training the monochromatic light onto a surface of the laser annealed film at an angle varying in a range between 0 (incident) and grazing angles; and measuring variations of properties of the monochromatic light diffracted from the surface, thereby measuring the morphological characteristics of the laser annealed film along the length (Lr) of the one row.
SCANNING INFRARED MEASUREMENT SYSTEM
An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.
MEASUREMENT OF TREATMENT AGENT IN A PROCESS STREAM USING ULTRAVIOLET-VISIBLE (UV-VIS) SPECTROSCOPY, AND RELATED SYSTEMS AND PROCESSES
The present application provides a method of detecting an amount of a treatment agent, such as a flocculating agent, in a process stream comprising the step of measuring at least one absorption property of a sample obtained from the process stream at a wavelength of less than about 250 nm. Processes and systems for monitoring and regulating addition of treatment agents to process streams are also provided.
DEVICE FOR INSPECTING LARGE AREA HIGH SPEED OBJECT
A high-speed device, for inspecting a large area of an object, which includes: a terahertz wave generation portion configured to generate a terahertz wave; a ring beam forming portion configured to form a ring beam by using the terahertz wave incident from the terahertz wave generation portion; a rotary mirror configured to reflect the ring beam formed by the ring beam forming portion while rotating to allow the ring beam to be incident on an inspection target object; and a detector configured to detect a ring beam generated from the inspection target object.