Patent classifications
G01N2201/105
Multiplexed Single Molecule Analyzer
Analyzers and analyzer systems that include an analyzer for determining multiple label species, methods of using the analyzer and analyzer systems to analyze samples, are disclosed herein. The analyzer includes one or more sources of electromagnetic radiation to provide electromagnetic radiation at wavelengths within the excitation bands of one or more fluorophore species to an interrogation space that is translated through the sample to detect the presence or absence of molecules of different target analytes. The analyzer may also include one or more detectors configured to detect electromagnetic radiation emitted from the one or more fluorophore species. The analyzer for determining multiple target molecule species provided herein is useful for diagnostics because the concentration of multiple species of target molecules may be determined in a single sample and with a single system.
Apparatus for optical detection of bio-contaminants based upon measurement of saturation of light intensities at fluorescence wavelength relative to light intensities at a predetermined wavelength
A method for optical detection of residual soil on articles (such as medical instruments and equipment), after completion of a washing or a rinsing operation by a washer. A soil detection system provides an indication of soil on the articles by detecting luminescent radiation emanating from the soil in the presence of ambient light.
Method and apparatus for optical detection of bio-contaminants within a lumen
A method for optical detection of residual soil in lumens of lumened or cannulated devices such as surgical endoscopes, after undergoing a decontamination process (e.g., a washing or rinsing operation). A soil detection system provides an indication of the presence of residual soil within a lumen by detecting luminescent radiation emanating from the soil on the interior of the lumen in response to excitation light.
Laser scanning microscope apparatus
A laser scanning microscope apparatus includes an irradiation unit including an objective lens, a photodetector unit, an XY-scanning unit, and a Z-scanning unit. The irradiation unit focuses a laser beam with the objective lens to a specimen. The photodetector unit detects light generated from a position irradiated with the laser beam focused. The XY-scanning unit scans the laser beam in an X-direction perpendicular to an optical axis of the objective lens and in a Y-direction perpendicular to the optical axis and the X-direction. The Z-scanning unit scans the laser beam in a Z-direction parallel to the optical axis. When acquiring XY-two-dimensional image data by detecting the light while scanning the irradiated position in the X-direction and the Y-direction, the apparatus detects the light while scanning the irradiated position also in the Z-direction.
HIGH SPEED DEEP TISSUE IMAGING SYSTEM USING MULTIPLEXED SCANNED TEMPORAL FOCUSING
A tissue imaging system includes a laser module for outputting a laser pulse, an optical delay module configured to split a laser pulse received from the laser module into a plurality of time-delayed sub-pulses, a telescope for delivering the sub-pulses from the optical delay module to a target volume and a photodetector configured to collect photons generated within the target volume in response to excitation of the target volume by the first and second sub-pulses. The system may further include a spatial multiplexing module configured to receive the temporally multiplexed laser pulse from the optical delay module and splitting the temporally multiplexed laser pulse into a plurality of sub-beams including a first sub-beam and a second sub-beam, wherein the first sub-beam and the second sub-beam are spatially separated with respect to a first image plane formed at a first depth within the target volume and with respect to a second image plane formed at a second depth within the target volume.
Scanning infrared measurement system
An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.
Fast multiphoton microscope
The invention provides improved systems and methods for multiphoton microscopy including pixel clocking techniques for minimizing pixel integration time and providing consistent signal intensity with maximized imaging speeds. Various systems and method are described for optimizing laser repetition rate based on dye lifetime, combining polygonal mirror scanning and stage translation, using the laser pulse signal to time pixel collection, and minimizing laser pulses and dye usage based on signal to background ratios.
Surface Sensing Systems and Methods for Imaging a Scanned Surface of a Sample Via Sum-Frequency Vibrational Spectroscopy
Surface sensing methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy are disclosed herein. The methods include exposing a sampled location of the scanned surface to a visible light beam and exposing the sampled location to a tunable infrared beam such that the tunable infrared beam is at least partially coincident with the visible light beam. The methods also include varying a frequency of the tunable infrared beam an inducing optical resonance within an imaged structure that extends at least partially within the sampled location. The methods further include receiving at least a portion of an emitted light beam from the sampled location and scanning the visible light beam and the runnable infrared beam across the scanned portion of the scanned surface. The methods also include generating an image of the scanned portion of the scanned surface based upon the receiving and the scanning.
LIGHT COLLECTION ARRANGEMENT FOR OPTICAL EMISSION SPECTROSCOPY
In accordance with an example embodiment of the invention, a detector assembly for an analyzer device for analysis of elemental composition of a sample using optical emission spectroscopy is provided. The detector assembly comprises an exciter for generating an excitation focused at a target position to invoke an optical emission from a surface of the sample at the target position; and a light collection arrangement for transferring the optical emission to a spectrometer. The light collection arrangement comprises a concave spherical mirror, an optical receiver arranged in an image point in the principal axis of the concave spherical mirror and a folding mirror including at least one aperture. The exciter is arranged with respect to the light collection arrangement such that the excitation is transferred towards the target position through said at least one aperture, and the folding mirror is arranged between the concave spherical mirror and the optical receiver such that the folding mirror folds the principal axis of the concave spherical mirror towards the target position and such that said at least one aperture is aligned with the principal axis of the concave spherical mirror to allow transferring optical emission reflected from the concave spherical mirror therethrough towards the optical receiver.
Nondestructive inspection method for coatings and ceramic matrix composites
A method for nondestructive inspection of ceramic structures present as either a ceramic matrix composite structure or a ceramic based coating. Such non-metallic structures are used to provide thermal protection or weight reduction or both to aircraft and their components. The nonmetallic structure is scanned with an electromagnetic pulse in the range of 200 GHz to 4 THz. The electromagnetic pulse includes a plurality of frequencies within the Terahertz range and is not restricted to a single designated frequency. The frequency range is sensitive to changes in impedances and refractive index within the structure. After the electromagnetic pulse passes through the nonmetallic structure, it may be evaluated for changes in impedance in the nonmetallic structure at different locations, and, when present, whether the changes in impedance impact the ability of the structure to perform the function for which it was designed.