Patent classifications
G01N2201/126
Receiver, early anomaly detection system and method, and computer-readable medium
A detection unit receives an optical signal that has passed through a space to be measured. A spectrum extraction unit extracts a range to be measured from the optical signal received by the detection unit. The spectrum extraction unit extracts an optical signal formed as a gas molecule of a gas to be measured absorbs energy of the optical signal. A determination unit determines the presence of an anomaly in the space to be measured based on a waveform of the optical signal extracted by the spectrum extraction unit.
Native fluorescence detection methods, devices, and systems for organic compounds
Naphthalene, benzene, toluene, xylene, and other volatile organic compounds VOCs have been identified as serious health hazards. Embodiments of the invention are directed to methods and apparatus for near-real-time in-situ detection and accumulated dose measurement of exposure to naphthalene vapor and other hazardous gaseous VOCs. The methods and apparatus employ excitation of fluorophors native or endogenous to compounds of interest using light sources emitting in the ultraviolet below 300 nm and measurement of native fluorescence emissions in distinct wavebands above the excitation wavelength. The apparatus of some embodiments are cell-phone-sized sensor/dosimeter badges to be worn by personnel potentially exposed to hazardous VOCs. The badge sensor of some embodiments provides both real time detection and data logging of exposure to naphthalene or other VOCs of interest from which both instantaneous and accumulated dose can be determined.
DETECTION SYSTEMS AND METHOD FOR MULTI-CHEMICAL SUBSTANCE DETECTION USING ULTRAVIOLET FLUORESCENCE, SPECULAR REFLECTANCE, AND ARTIFICIAL INTELLIGENCE
Embodiments of this invention relate generally to detection systems and a method for chemical substance detection using UV fluorescence, specular reflectance, and artificial intelligence. In one example, a handheld detection system comprises single or multiple excitation light sources at discrete wavelengths operating in an ultraviolet portion of an electromagnetic spectrum. The single or multiple excitation light sources are operated intermittently, either all in concert or individually, at a frequency of about 100 Hz to 1000 Hz. Multiple detectors are configured as channels to operate at discrete wavelengths to detect a multiplicity of emissions produced by the excitation energy. A multi-channel electronic or software-implemented detector is synchronized in both phase and frequency with the excitation light sources so that a signal of interest is detected in the multiplicity of emissions.
FLUORESCENCE-LIFETIME IMAGING MICROSCOPY METHOD HAVING TIME-CORRELATED SINGLE-PHOTON COUNTING
A fluorescence-lifetime imaging microscopy method with time-correlated single-photon counting includes using excitation light pulses separated in each case by a measurement interval to excite a sample to emit fluorescence photons. A detector signal that represents the captured fluorescence photons is generated. Detection times are determined based on the detector signal. Imaging is performed based on the detection times. The detection times of all captured fluorescence photons are compiled in a first data memory, common to a plurality of image pixels. The detection times of only those fluorescence photons which were captured in a predetermined number within the respective measurement intervals are compiled in a second data memory, common to the same plurality of image pixels. The detection times compiled in the data memories are combined within a calculation step. The results of the calculation step are stored in a third data memory.
Detection of compounds in material samples utilizing a transformation and subsequent decomposition
A method of detecting a compound in a material sample is presented. A transformation is generated from a set of IR spectra of a set of identified compounds, in which the compound is one of the set of identified compounds. The transformation is applied to an IR spectrum of the material sample to form a transformed IR spectrum. A decomposition is applied to the transformation. Results indicative of a presence or an absence of the compound are generated based on an output of the decomposition.
IMAGING REFLECTOMETER
An imaging reflectometer includes a source module configured to generate a plurality of input beams at different nominal wavelengths. An illumination pupil having a first numerical aperture (NA) is arranged so that each of the plurality of input beams passes through the illumination pupil. A large field lens is configured to receive at least a portion of each of the plurality of input beams and provide substantially telecentric illumination over a sample being imaged. The large field lens is also configured to receive reflected portions of the substantially telecentric illumination reflected from the sample. The reflected portions pass through an imaging pupil having a second NA that is lower than the first NA and are received by an imaging sensor module that generates image information.
ALARM THRESHOLD ORGANIC AND MICROBIAL FLUORIMETER AND METHODS
In-situ fluorimeters and methods and systems for collecting and analyzing sensor data to predict water source contamination are provided. In one embodiment, a method is provided that includes receiving sensor data regarding a water source. Changepoints may then be calculated within the sensor data and the sensor data may be split into intervals at the changepoints. A machine learning model may then be used to classify the intervals and a predicted contamination event for the water source may be identified based on the classified intervals. In another embodiment, an in-situ fluorimeter is provided. The in-situ fluorimeter comprises one or more UV LEDs centered around a pre-set excitation wavelength (e.g., a TLF excitation wavelength), a bandpass filter, a lens, a photodiode system, a machine learning platform; and an alarm triggered by contamination events, wherein the alarm is calibrated through the machine learning system.
Imaging reflectometer
An imaging reflectometer includes a source module configured to generate a plurality of input beams at different nominal wavelengths. An illumination pupil having a first numerical aperture (NA) is arranged so that each of the plurality of input beams passes through the illumination pupil. A large field lens is configured to receive at least a portion of each of the plurality of input beams and provide substantially telecentric illumination over a sample being imaged. The large field lens is also configured to receive reflected portions of the substantially telecentric illumination reflected from the sample. The reflected portions pass through an imaging pupil having a second NA that is lower than the first NA and are received by an imaging sensor module that generates image information.
MUELLER MATRIX ELLIPSOMETER
Embodiments of the present invention relate to an ellipsometer that includes a combination of a plurality of reflective devices to measure a Mueller matrix reflectance of a material in the VUV and EUV region. Ellipsometer in accordance with embodiments of the present invention relate to an ellipsometer that includes a multi-mirror polarization state generator combined with a multi-mirror polarization state analyzer and a detector to realize a Mueller matrix ellipsometer. Embodiments of the present invention utilize two rotating assemblies with each assembly including multiple mirrors that combine to act as amplitude and phase retarders.
METHOD FOR CHARACTERIZING A PART THROUGH NON-DESTRUCTIVE INSPECTION
A method is provided for characterizing a part. The method includes a) carrying out non-destructive measurements using a sensor, the sensor being placed on the part or facing the part; b) using the measurements as input data of a neural network; and c) depending on the value of each node of the output layer of the neural network, characterizing the part. The method further includes prior to steps b) and c): constructing a first database, on a first model part; employing a first neural network parametrized by a first training operation, using the first database; constructing a second database, containing experimental measurements of the physical quantity performed on the part to be characterized; a second training operation, using the second database, so as to parametrize a second neural network, using the parametrization of the first neural network. In step c), the neural network used is the second neural network.