A luminometer (400) includes a light detector (630) configured to sense photons (135). The luminometer (400) includes an analog circuit (915a) configured to provide an analog signal (965) based on the photons (135) emitted from assay reactions over a time period and a counter circuit (915b) configured to provide a photon count (970) based on the photons (135) emitted from the assay reactions over the time period. The luminometer (400) includes a luminometer controller (905) configured to, in response to an analog signal value of the analog signal (965) being greater than a predetermined value, determine and report a measurement value of the photons (135) emitted from the assay reactions over the time period based on the analog signal value of the analog signal (965) and a linear function (1010). Optionally, the linear function (1010) is derived from a relationship between the analog signal (965) and the photon count (970).

Methods and apparatus to generate calibration models in a cloud environment are disclosed. An example apparatus includes training circuitry to generate a calibration model based on a correlation of reference data and spectra, the reference data based on physical samples collected by one or more vehicles, the spectra associated with the physical samples, and distribution circuitry to provide, via a network communication, the calibration model to the one or more vehicles.

Methods and systems for automatically adjusting a sample position in a spectrometer, such as a Fourier-transform infrared (FTIR) spectrometer, are described. The sample may be automatically positioned using an auto-focusing procedure. For example, images including an aperture marker are acquired by directing light towards the sample via an aperture. The sample position may be adjusted based on features extracted from the aperture marker images.

A method of analyzing a mixed fluorescence response of a plurality of fluorophores in a microscopic sample includes reconstructing individual fluorescence responses from a mixed fluorescence response using spectral un-mixing based on reference emission spectra for fluorophores to be reconstructed, and a procedure for determining and validating reference emission spectra including providing a plurality of image acquisition settings for a sequence of images of the sample equal to, or greater than, the plurality of fluorophores and including an illumination setting for each image, acquiring the sequence of images using the plurality of image acquisition settings and storing each image together with the corresponding illumination setting, determining candidate reference emission spectra for the fluorophores to be reconstructed from the sequence of images of the sample using one or more reference emission spectra determination algorithms, and conditionally using the candidate reference emission spectra as the reference emission spectra in the spectral un-mixing.

Systems and methods for reducing fluorescence and systematic noise in time-gated spectroscopy are disclosed. Exemplary methods include: a method for reducing fluorescence and systematic noise in time-gated spectroscopy may comprise: providing first light using an excitation light source; receiving, by a detector, first scattered light from a material responsive to the first light during a first time window; detecting a peak intensity of the first scattered light; receiving, by the detector, second scattered light from the material responsive to the first light during a second time window; detecting a peak intensity of the second scattered light; recovering a spectrum of the material by taking a ratio of the peak intensity of the first scattered light and the peak intensity of the second scattered light; and identifying at least one molecule of the material using the recovered spectrum and a database of identified spectra.

There are provided a state determination device, a state determination method, and a state determination program capable of determining a state of an object to be inspected. A state determination device 10 includes an irradiation unit 12 which irradiates an object to be inspected with excitation light under a predetermined irradiation condition, a measurement unit 13 which measures light emission data of light emission from the object to be inspected, which is generated with a delay with respect to the irradiation with the excitation light, and a determination unit 15 which determines a state of the object to be inspected by checking the light emission data against light emission data of light emission from the object to be inspected, which is measured in the case where the excitation light is emitted under an irradiation condition common to the light emission data for each state of a substance constituting the object to be inspected.

The disclosed techniques include obtaining a first signal generated by an electrochemical glucose sensor and a second signal generated by an optical glucose sensor, and obtaining a glucose value indicative of a user's blood glucose level, where the glucose value and the second signal are obtained at different times. The disclosed techniques further cause calculating a mapped value for the second signal based on the first signal, and calibrating the mapped value of the second signal based on the glucose value.

Methods and apparatus for obtaining a corrected digital mode spectrum for a chemically strengthened (CS) substrate having a curved surface are disclosed. The methods include digitally capturing transverse magnetic (TM) and transverse electric (TE) mode spectra of the CS substrate to form a digital mode spectrum image using an evanescent prism coupling system having a system calibration for measuring flat CS substrates. The method further includes establishing a calibration correction based on the difference in the digitally captured TM and TE mode spectra as compared to a reference TM and TE mode spectra for a reference CS substrate. The calibration correction is applied to the digital mode spectrum image to form the corrected digital mode spectrum image, which can be processed using the system calibration for measuring flat CS substrates to determine a refractive index profile and stress characteristics for the curved CS substrate.

A gas sensing system measures a concentration of first and second gasses in a gas sample disposed in a cavity containing a porous scattering material. The first and second gas each have an absorption peak at a different wavelength. First and second emitters emit light having a spectrum that includes one of the different wavelengths. A single sensor, or multiple sensors, detect at least some of the light emitted by the first and second emitters. A processor determines concentration of the first and second gases from signals from the sensor that indicate intensities of the light from the first and second emitters. When a single sensor is used, the first and second emitters are driven, and the sensor signal detected, at different times. When multiple sensors are used, the sensors detect signals at one of the absorption peaks.

An instrument calibration apparatus and a calibration method using same. The apparatus comprises a physical quantity input/output unit, a physical quantity measurement unit, a physical quantity configuration unit, a display unit, a man-machine interaction unit, a storage unit, and a control unit. The apparatus can be widely applied to automatic calibration of multivariable instruments.