Patent classifications
G01N2203/0016
REAL-TIME VIDEO EXTENSOMETER
This disclosure relates to a real-time video extensometer. Typically, the apparatus of the disclosure combines the image source, data processing and electrical output on to a single processing board in order to achieve high frequency images and low latency times on data flow. Further, the video processing engine processes the image on a pixel basis and updating the output the intermediate extension/strain result so that after receipt of the final image pixel, a final extension/strain value is achieved and immediately output for evaluation.
MATERIAL TESTING MACHINE AND RADIATION CT DEVICE
A grip portion configured to support a test piece is disposed at a central part of a base, and a plurality of pillars are erected on the base. The disposition and number of the pillars are adjusted so that an X-ray emitted from an X-ray source and transmitting through the test piece transmits through zero or one pillar in an optional image capturing direction. It is possible to avoid a situation in which the attenuation rate of the X-ray largely differs due to difference in an image capturing direction to the test piece. Thus, it is possible to prevent a strong artifact from overlapping a CT image of the test piece in an X-ray CT image. Moreover, a material testing machine is supported by the plurality of pillars to have an accessible state around the test piece. This configuration facilitates handling of the material testing machine.
SELF-HEALING METHOD FOR FRACTURED SiC AMORPHOUS NANOWIRES
The present invention provides a self-healing method for fractured SiC amorphous nanowires. A goat hair in a Chinese brush pen of goat hair moves and transfers single crystal nanowires under an optical microscope. On an in-situ nanomechanical test system of a TEM, local single crystal nanowires are irradiated with an electron beam for conducting amorphization transformation. Amorphous length of a single crystal after transformation is 60-100 nm. A fracture strength test is conducted on the amorphous nanowires in the single crystal after transformation in the TEM; and fracture strength of the amorphous nanowires is 9-11 GPa. After the amorphous nanowires are fractured, unloading causes a slight contact between the fractured end surfaces; and self-healing of the nanowires is conducted after waiting for 16-25 min in a vacuum chamber of the TEM. Atom diffusion is found at a healed fracture through in-situ TEM representation; and recrystallization is found in the amorphous nanowires. The present invention provides a method for realizing self-healing for fractured SiC amorphous nanowires without external intervention.
Material testing machines with movable lower crossbeams
Described herein are examples of improved material (and/or universal) testing machines having a lower crossbeam that may be moved via a drive system of the material testing machine. In some examples, this may be accomplished via drive shafts with different threading in upper and lower portions, and/or independent drive systems for upper and lower crossbeams. The ability to dynamically adjust (e.g., raise) the lower crossbeam may allow an operator to interact with test samples at a more comfortable height, and reduce the need for an operator to repeatedly bend and/or kneel.
Real-time video extensometer
This disclosure relates to a real-time video extensometer. Typically, the apparatus of the disclosure combines the image source, data processing and electrical output on to a single processing board in order to achieve high frequency images and low latency times on data flow. Further, the video processing engine processes the image on a pixel basis and updating the output the intermediate extension/strain result so that after receipt of the final image pixel, a final extension/strain value is achieved and immediately output for evaluation.
Methodology and Instrumentation for Thin Film Mechanical Analysis
The invention provides for a material characterization system, method, and instrumentation for measuring the mechanical properties of nano-scale thin films. The thin film mechanical characterization system, method, and instrumentation of the present invention for ultra-thin films includes a motor and load cell. The instrumentation device includes a bath that can be filled or used with liquid so that a thin film can float via the surface tension and can be stretched until permanent deformation occurs, while recording the amount of force applied by the motor and other parameters. Further, the invention provides a process that transfers the nano-scale thin film to the tensile testing instrument and a process to obtain the physical mechanical properties of thin films that are at the nanoscale level.
MATERIAL TESTING MACHINE
A material testing machine is provided. A screen for numerical value input is provided with numerical value input keys that are composed of a decimal point key, number keys of 0-9 and a symbol changing key for changing symbols of plus or minus of input numerical values, operation keys assigned to four arithmetic operations, an equal key for obtaining a calculation result, an input column in which values that are input using numerical value input keys and so on are displayed, a clear key for deleting the numerical values or operations input previously and emptying the input column, a backspace key for deleting the numerical values in the input column character by character, and parameter buttons assigned to parameters stored in a storage part.
SAFETY SYSTEMS REQUIRING INTENTIONAL FUNCTION ACTIVATION AND MATERIAL TESTING SYSTEMS INCLUDING SAFETY SYSTEMS REQUIRING INTENTIONAL FUNCTION ACTIVATION
Safety systems requiring intentional function activation and material testing systems including safety systems requiring intentional function activation are disclosed. An example material testing system includes: an actuator configured to control an operator-accessible component of the material testing system; an operator interface comprising a plurality of inputs; a pressure sensitive surface configured to: detect the presence of a pressure on the surface; and output a pressure signal in response to detecting the pressure; and one or more processors configured to: control the actuator based on at least one of a material testing process or an input from the operator interface; and require two or more inputs to be received to permit at least one operation of the actuator, at least one of the two or more inputs comprising the non-detection signal.
MATERIAL TESTING MACHINES WITH MOVABLE LOWER CROSSBEAMS
Described herein are examples of improved material (and/or universal) testing machines having a lower crossbeam that may be moved via a drive system of the material testing machine. In some examples, this may be accomplished via drive shafts with different threading in upper and lower portions, and/or independent drive systems for upper and lower crossbeams. The ability to dynamically adjust (e.g., raise) the lower crossbeam may allow an operator to interact with test samples at a more comfortable height, and reduce the need for an operator to repeatedly bend and/or kneel.
TEST RESULT EVALUATING METHOD AND MATERIAL TESTER
A material tester is provided. A personal computer, as functional blocks of a program installed in a memory, includes a filtering processing part that eliminates noise from raw data acquired by digitalizing an input signal from a load cell or an extensometer, a filter setting part that sets a filtering condition applied to the raw data in the filtering processing part, and a display control part that displays the raw data and the processed data, for which the filtering process has been performed by the filtering processing part, at the same scale and in different forms on a display device in an overlapping manner.