A device for testing impact resistance includes: a shrink film supporting member, disposed on a horizontal platform, and including a main body, a supporting part, and fixing parts disposed on a sidewall of the main body, the supporting part is configured to support a tested shrink film, the plurality of fixing parts is sequentially disposed in parallel at positions of different heights on the sidewall of the main body, and the fixing parts disposed at the positions of different heights represent different impact resistance levels; a level plate, detachably fixed inside the main body by means of any one of the plurality of fixing parts; and an impact member, configured to move downward from a position above a geometric center of the supporting part at a preset speed to exert a frontal impact on the shrink film supported on the supporting part.

Provided is a deformation tester where a specimen is deformed after starting and can be observed and analyzed in any deformation state without removal. The tester includes: a detachable part repeating a relative displacement cycle of a second part to a first part, two portions of the specimen attached to a first and a second attachment portion of the first and the second part, the specimen deformed from a first to a second shape state and back to the first shape state during the cycle; and a main body part the detachable part is detachably attached to; wherein state retaining means for fixing a relative position of the second to the first part in at least one shape state is freely attachable to the detachable part mounted on the main body part and the detachable part with the state retaining means is freely attachable to the main body part.

An electric actuator includes a stationary support and a guide system having a single stationary guide joined to the stationary support having an axis. The actuator also includes a stationary assembly secured to the stationary support. A moving assembly is movable relative to the stationary support on the guide, where the moving assembly and the stationary assembly provide at least two sets of interacting magnetic fields disposed about the guide at equal angular intervals. A test specimen support is joined to the moving assembly and disposed on one side of the stationary support so as to move along the axis with movement of the moving assembly, the axis extending through the test specimen support.

A system for evaluating a bond includes first and second electrodes. A dielectric material layer is positioned at least partially between the first and second electrodes. A power source is connected to the first and second electrodes. The power source is configured to cause the first and second electrodes to generate an electrical arc. The electrical arc is configured to at least partially ablate a sacrificial material layer to generate a plasma.

A measurement apparatus for micro- and nano-scale materials and a measurement method thereof are provided. The measurement apparatus for the micro- and nano-scale material includes a transmission electron microscope to generate a magnetic field, and a conductive flat punch and a sample which are arranged in the magnetic field. The sample includes the micro- and nano-scale materials. When the current passes through the sample and the conductive flat punch, the conductive flat punch deflects laterally relative to the sample with controllable displacement driven by the electromagnetic force. The required lateral displacement of the present invention is controllable, so that the utilization rate of equipment is greatly increased, and the cost is reduced. In addition, the whole test is performed in the transmission electron microscope, so that a measurement process can be observed in real time.

Disclosed is a peel strength measurement apparatus using an electromagnet, the peel strength measurement apparatus including a test piece fixing unit configured to fix a test piece including at least two layers, a magnetic material attached to at least one surface of the test piece, an electromagnet configured to apply magnetic force to the magnetic material, a power supply unit configured to supply electric power to the electromagnet such that the electromagnet can generate a magnetic field, and a current controller configured to control the supply of electric power from the power supply unit to the electromagnet.

A measuring device for detecting measuring signals during either a scanning across a surface to determine a surface profile or a penetration movement of an indenter into a surface of the specimen to determine hardness, and, scanning with sufficient force to determine the scratch resistance of the specimen is described. All of the measurements can be done on the same specimen without unmounting the specimen from a holder. A camera mounted to the same framework as the measuring device enables further documentation of the specimen being tested.

The present invention provides a self-healing method for fractured SiC amorphous nanowires. A goat hair in a Chinese brush pen of goat hair moves and transfers single crystal nanowires under an optical microscope. On an in-situ nanomechanical test system of a TEM, local single crystal nanowires are irradiated with an electron beam for conducting amorphization transformation. Amorphous length of a single crystal after transformation is 60-100 nm. A fracture strength test is conducted on the amorphous nanowires in the single crystal after transformation in the TEM; and fracture strength of the amorphous nanowires is 9-11 GPa. After the amorphous nanowires are fractured, unloading causes a slight contact between the fractured end surfaces; and self-healing of the nanowires is conducted after waiting for 16-25 min in a vacuum chamber of the TEM. Atom diffusion is found at a healed fracture through in-situ TEM representation; and recrystallization is found in the amorphous nanowires. The present invention provides a method for realizing self-healing for fractured SiC amorphous nanowires without external intervention.

A measurement apparatus for micro- and nano-scale materials and a measurement method thereof are provided. The measurement apparatus for the micro- and nano-scale material includes a transmission electron microscope to generate a magnetic field, and a conductive flat punch and a sample which are arranged in the magnetic field. The sample includes the micro- and nano-scale materials. When the current passes through the sample and the conductive flat punch, the conductive flat punch deflects laterally relative to the sample with controllable displacement driven by the electromagnetic force. The required lateral displacement of the present invention is controllable, so that the utilization rate of equipment is greatly increased, and the cost is reduced. In addition, the whole test is performed in the transmission electron microscope, so that a measurement process can be observed in real time.

The present invention provides a self-healing method for fractured SiC amorphous nanowires. A goat hair in a Chinese brush pen of goat hair moves and transfers single crystal nanowires under an optical microscope. On an in-situ nanomechanical test system of a TEM, local single crystal nanowires are irradiated with an electron beam for conducting amorphization transformation. Amorphous length of a single crystal after transformation is 60-100 nm. A fracture strength test is conducted on the amorphous nanowires in the single crystal after transformation in the TEM; and fracture strength of the amorphous nanowires is 9-11 GPa. After the amorphous nanowires are fractured, unloading causes a slight contact between the fractured end surfaces; and self-healing of the nanowires is conducted after waiting for 16-25 min in a vacuum chamber of the TEM. Atom diffusion is found at a healed fracture through in-situ TEM representation; and recrystallization is found in the amorphous nanowires. The present invention provides a method for realizing self-healing for fractured SiC amorphous nanowires without external intervention.