A hardness tester loads a predetermined test force on an indenter and presses into a surface of a sample to form an indentation. The indenter includes an indenter memory storing indenter information specific to the indenter. The indenter is detachably mounted to an indenter shaft. A CPU acquires, from the indenter memory, the indenter information of the indenter mounted to the indenter shaft, and uses the acquired indenter information to perform a predetermined operation and calculate hardness.

Disclosed is an electro-magneto-thermo-mechanical dynamic and synchronous loading device based on a wedge-shaped rotating body. The device comprises a carrier, a wedge-shaped rotating body and a pulse power supply, wherein the wedge-shaped rotating body is positioned above the carrier, the pulse power supply is connected to the carrier and the wedge-shaped rotating body through conductors, a test object is fixed on the carrier, the top of the wedge-shaped rotating body is connected to the output end of a driving shaft through a transmission shaft, the driving shaft drives the wedge-shaped rotating body to rotate and can apply downward pressure, and the wedge-shaped rotating body can be pressed against the test object and rotate on the surface of the test object.

Disclosed is a synchronous and dynamic loading method in electro-magneto-thermo-mechanical multi-field coupling conditions. The method comprises the following steps: applying maximum pulse current to a test object by a pulse power supply to realize loading in extreme electric field and magnetic field conditions; meanwhile, generating a large amount of friction heat by the high-speed rotation of a rotating body and the friction of the test object to realize loading in an extreme-temperature field combined with a large amount of Joule heat and arc heat; synchronously applying pressure to the rotating body by a pressure device to realize loading of extreme force combined with the gravity of the rotating body and the friction force between the rotating body and the test object.

Provided is a dynamic true triaxial electromagnetic Hopkinson bar leveling and centering system and method. The system comprises a supporting base, a micrometer adjusting knob, a sliding platform, an auxiliary supporting plate, a fixing groove, at least two auxiliary centering targets and a lamp source. According to the auxiliary centering system, a principle that light rays are straight lines and two points form one line is adopted, and adjacent perpendicularity and coaxial centering leveling of a bar piece are determined by respectively adjusting a center of a loading end surface of the bar piece and an upper surface of the bar piece.

Provided is a fixture applied to sticking a strain gauge on a Hopkinson square bar and a use method of the fixture. The invention is specially designed for a square waveguide bar, and the fixture further ensures consistency of the same group of strain gauges along a cross-section position of the bar. The fixture has important practical value in application in a dynamic true triaxial electromagnetic Hopkinson bar test, especially in a high-end material testing field requiring high-precision and high-reliability test data.

An ultrasound vibrating-type defect detection apparatus (100) for detecting a defect in a semiconductor apparatus (10) is provided with: an ultrasound vibrator (42); a high-frequency power supply (40); a camera (45); and a controller (50) for adjusting the frequency of high-frequency power supplied from the high-frequency power supply (40) to the ultrasound vibrator (42), and for performing detection of a defect in the semiconductor apparatus (10). The controller (50) causes the camera (45) to capture an image of the semiconductor apparatus (10) while varying the frequency of high-frequency power supplied from the high-frequency power supply (40) to the ultrasound vibrator (42), and performs detection of a defect in the semiconductor apparatus (10) on the basis of the captured image.

A system and method for evaluating a bond is provided. The system uses an adjustable submerged plasma probe to generate a compression wave in a first vessel containing a liquid. The system further includes a second vessel in which a vacuum is pulled to hold the first vessel against a bonded structure being inspected. The compression wave is directed to propagate from the liquid into the bonded structure to apply a known force to the bond being inspected. The adjustable submerged plasma probe allows the intensity of the compression wave to be increased or decreased at the bonded structure.

A method for quantitatively measuring a physical characteristic of a material includes applying a force to a material sample according to an interrogation profile comprising a set of one or more interrogation parameters. The method further includes measuring a displacement over time of the material sample that occurs as a result of applying the force according to the interrogation profile. The method further includes using the interrogation profile and the measured displacement over time of the material sample to derive a quantitative value of a physical characteristic of the material sample.

An accelerated wear device for a ceramic tile and a wear test method thereof. The accelerated wear device includes an X-axis drive mechanism; a Z-axis drive mechanism, disposed on the X-axis drive mechanism; a rotary friction mechanism, disposed on the Z-axis drive mechanism; and an abrasive tool seat, disposed on the rotary friction mechanism, where the abrasive tool seat is used for mounting a wearing part, and drives the wearing part to perform a friction motion with a to-be-tested ceramic tile under the drive of the X-axis drive mechanism, the Z-axis drive mechanism and the rotary friction mechanism.

There is provided a microscope comprising a micromanipulator, comprising a first electromagnet comprising a first magnetic core; a second electromagnet comprising a second magnetic core, wherein the first magnetic core and the second magnetic core are configured to generate a magnetic force on magnetic probes arranged within a biological matrix arranged in between the first magnetic core and the second magnetic core; and wherein the microscope comprises imaging means configured to capture images of the biological matrix comprising the magnetic probes for detection of displacements of the magnetic probes caused by the magnetic force.