A master unit includes a synchronization signal source that generates a synchronization signal and a synchronization signal distribution adjustment circuit that adjusts a distribution timing of the synchronization signal to each of slave units. The synchronization signal distribution adjustment circuit includes a period measurement circuit that measures a period of the synchronization signal output from the synchronization signal source, a time difference measurement circuit that measures a time difference between a time point of the synchronization signal issued from the master unit to the slave units and a time point of the synchronization signal returned from the slave units to the master unit, and a delay circuit that delays the issuing time point of the synchronization signal to be transmitted from the master unit to the slave units based on the period of the synchronization signal and the time difference.

A specimen heating apparatus includes a heater unit configured to heat a test specimen held in a material testing machine, a heater holding unit configured to hold the heater unit in a set position relative to the test specimen for heating, a specimen temperature measurement unit attached to the heater unit and configured to measure temperature of the test specimen when the heater unit is in the set position, a temperature controller configured to control heating of the heater unit in response to a temperature measured by the specimen temperature measurement unit, and a thermal insulation unit configured to cover the heater unit, wherein the heater holding unit holds the heater unit in such a way that the heater unit is allowed to be brought to and removed from the set position while the test specimen is being held in the material testing machine.

Disclosed is a material testing system that includes a fixture, a frame, a load sensor, a displacement sensor and a computer system coupled to the material testing system. The computer system includes one or more processors, one or more memory devices coupled to the one or more processors, one or more computer readable storage devices coupled to the one or more processors, wherein the one or more storage devices contain program code executable by the one or more processors via the one or more memory devices to implement a method for detecting a change in a material testing sequence. A computer program product that implements a method for detecting a change in a material test sequence, and methods for detecting a change in a material test sequence or fatigue test is further disclosed.

A testing system for evaluating the performance of an electrical/electronic UUT under dynamic operating conditions. The testing system includes a dynamic testing component (e.g., a centrifuge) for applying a stimulus to the UUT, and an iDAQ system configured to perform in situ data acquisition and real-time data analysis. The iDAQ system may also be subject to the stimulus. The iDAQ system includes a processor (e.g., an SoC) component, a power supply, a CR/I component, an IR component, and a single enclosure. The processor component may control the dynamic testing component, including varying in real-time the stimulus applied to the UUT. The processor component may include multiple input channels, and a high current/voltage subcomponent of the power supply may be configured to supply up to five hundred volts.

A fatigue test apparatus includes a control system configured to receive, during a first iteration of a fatigue test of an article under test, a command signal corresponding to a particular test step of the fatigue test. The control system is configured to generate, based on the command signal and during the first iteration, a test output signal to cause a force to be applied to the article under test. The control system is configured to generate an error signal associated with the particular test step during the first iteration. A gain calculation device is configured to generate, based on the error signal, a gain adjustment value associated with the particular test step. A variable gain feedforward device is configured to provide, during a second iteration of the fatigue test and based on the gain adjustment value, a stabilization gain to the control system.

According to an embodiment of the present invention, there is provided a material testing system, comprising: a material testing apparatus configured to receive an electrical supply, wherein the material testing apparatus comprises: guide means; sample holding means configured for holding a sample; force means configured for applying force to the sample; a crosshead arranged to support at least a portion of one or both of the sample holding means and the force means, wherein the crosshead is moveable about the guide means; wherein the material testing system comprises a three phase switched-mode power supply unit arranged to provide the electrical supply to the material testing apparatus.

Methods and systems are provided for a torsional material testing system, which includes a rotatable actuator, such as a motor, configured to perform a torsional material testing operation. During a torsional material testing operation, a virtual interlock is configured to engage or disengage with the actuator to prevent or allow rotational movement of the actuator (e.g., during a setup state or during a torsional material testing operation, respectively). A control circuitry is employed to control the virtual interlock as well as the torsional testing system based on one or more operational states before, during, or after a material testing process.

A master unit includes a synchronization signal source that generates a synchronization signal and a synchronization signal distribution adjustment circuit that adjusts a distribution timing of the synchronization signal to each of slave units. The synchronization signal distribution adjustment circuit includes a period measurement circuit that measures a period of the synchronization signal output from the synchronization signal source, a time difference measurement circuit that measures a time difference between a time point of the synchronization signal issued from the master unit to the slave units and a time point of the synchronization signal returned from the slave units to the master unit, and a delay circuit that delays the issuing time point of the synchronization signal to be transmitted from the master unit to the slave units based on the period of the synchronization signal and the time difference.

A specimen heating apparatus includes a heater unit configured to heat a test specimen held in a material testing machine, a heater holding unit configured to hold the heater unit in a set position relative to the test specimen for heating, a specimen temperature measurement unit attached to the heater unit and configured to measure temperature of the test specimen when the heater unit is in the set position, a temperature controller configured to control heating of the heater unit in response to a temperature measured by the specimen temperature measurement unit, and a thermal insulation unit configured to cover the heater unit, wherein the heater holding unit holds the heater unit in such a way that the heater unit is allowed to be brought to and removed from the set position while the test specimen is being held in the material testing machine.

A complex pressure environment test device, comprising a test table and a hydraulic control system. The test table comprises a base for fastening a closure head under test, and an outer cover; the base has water inlets and outlets. The hydraulic control system comprises a watering hydraulic pump, a pressurizing hydraulic pump, and a pilot-operated overflow valve; the watering hydraulic pump is separately connected to a first two-position two-way valve and a second two-position two-way valve; the second two-position two-way valve is connected to a second one-way valve; the second one-way valve is separately connected to a water inlet and a first pilot-operated pressure regulating valve; the first pilot-operated pressure regulating valve is separately connected to a first remote pressure regulating valve and a first one-way valve. There is also a hydraulic circuit is present and used for testing.