A method for imaging an object is presented. The method includes acquiring a first projection image of the object using a source and a detector, positioning a scatter rejecting aperture plate between the object and the detector, and acquiring a second projection image of the object with the scatter rejecting aperture plate disposed between the object and the detector. A scatter image of the object is generated based on the first projection image and the second projection image, and stored for subsequent imaging. A volumetric CT system for imaging an object is also presented. The system is configured to acquire a plurality of projection images of the object from a plurality of plurality of projection angles.

A method for X-ray scatterometry includes receiving a first distribution of an X-ray beam scattered from a sample. The first distribution exhibits asymmetry with respect to a reference axis. A correction is applied to the first distribution, so as to produce a second distribution in which a level of the asymmetry is reduced relative to the first distribution. One or more parameters of the sample are estimated based on the second distribution.

A method for X-ray scatterometry includes receiving a first distribution of an X-ray beam scattered from a sample. The first distribution exhibits asymmetry with respect to a reference axis. A correction is applied to the first distribution, so as to produce a second distribution in which a level of the asymmetry is reduced relative to the first distribution. One or more parameters of the sample are estimated based on the second distribution.

Disclosed is a method for identifying the molecular configuration of ganoderic acid A which comprises extracting ganoderic acid A from fruit bodies of Ganoderma lucidum, producing crystals of the Ganoderic Acid, analyzing the crystals of the ganoderic acid A by X-ray structural analysis to obtain values of the three-dimensional coordinate of the crystals of the ganoderic acid A and using the values of the three-dimensional coordinate of the crystals of the ganoderic acid A obtained from the X-ray structural analysis as initial coordinates in the input to the calculation program of the B3LYP method included in the Gaussian 03 package software together with the 6-31G* basis set function of the density functional theory (DFT).

Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.

Methods for quantitatively separating x-ray images of a subject having three or more component materials into component images using spectral imaging or multiple-energy imaging with 2D radiographic hardware implemented with scatter removal methods. The multiple-energy system may be extended by implementing DRC multiple energy decomposition and K-edge subtraction imaging methods.

A method of analysis of X-ray spectra in an instrument fits a measured sample spectrum using a combination of at least one measured reference spectrum with at least one calculated function. The method includes measuring a reference spectrum as a plurality of measured values R.sub.pr(i) for a plurality of energy bins i from at least one reference sample; selecting n.sub.pr region or regions of interest indexed by j corresponding to a plurality of bins i and recording the profile R.sub.pr.sup.j(i) for the respective plurality of bins from the measured reference spectrum, where n.sub.pr is a positive integer; measuring a sample spectrum as a plurality of intensity values R.sub.spe(i) for a plurality of energy bins i; and fitting the measured sample spectrum R.sub.spe(i) to a fit function including the at least one profile R.sub.pr.sup.j(i) in at least one respective region of interest as well as at least one calculated function R.sub.gr.sup.j(i).

An apparatus for generating corrected X-ray projection data from target X-ray projection data obtained by performing an X-ray scan with a detector having an anti-scatter grid, and a method for creating a lookup table and generating corrected X-ray projection data. The apparatus includes a detector configured to detect incident X-rays, an anti-scatter grid configured to suppress scattered radiation incident on the detector, and an X-ray source configured to irradiate the target with X-rays. Processing circuitry is configured to cause the X-ray source to scan, using a peak kilovoltage (kVp), the target to produce the target projection data, determine a patient-to-detector distance (PDD) and an area irradiated (FS), transform the target projection data into a spatial frequency domain, determine scatter values by accessing the lookup table using the kVp, PDD, and FS values, and subtract the scatter values from the frequency components to obtain the corrected X-ray projection data.

A method for imaging an object is presented. The method includes acquiring a first projection image of the object using a source and a detector, positioning a scatter rejecting aperture plate between the object and the detector, and acquiring a second projection image of the object with the scatter rejecting aperture plate disposed between the object and the detector. A scatter image of the object is generated based on the first projection image and the second projection image, and stored for subsequent imaging. A volumetric CT system for imaging an object is also presented. The system is configured to acquire a plurality of projection images of the object from a plurality of plurality of projection angles.

An example method includes obtaining one or more three dimensional computer models that model geometric and material properties of a component, and model beam properties of a beam of radiation to be applied to the component; utilizing the one or more three dimensional computer models to obtain simulated radiation imaging data, which includes simulated elastic scattering data, resulting from a simulated application of the beam having the beam properties on a plurality of discretized samples of the component, and which accounts for sequential interactions of rays of the beam with multiple ones of the plurality of discretized samples; obtaining actual radiation imaging data, which includes actual elastic scattering data, of an output beam pattern caused by application of a non-simulated beam of radiation having the beam properties to the component; and performing at least one of: determining whether an anomaly exists in a crystalline structure of the component based a comparison of the simulated elastic scattering data to the actual elastic scattering data; and modifying the actual radiation imaging data based on the simulated elastic scattering data to at least partially remove the actual elastic scattering data from the actual radiation imaging data. A corresponding system is also disclosed.