Patent classifications
G01N2223/053
Radiation detector
Disclosed herein is a detector, comprising: a pixel comprising a first subpixel and a second subpixel, wherein the first subpixel is configured to generate a first electrical signal upon exposure to radiation, and wherein the second subpixel is configured to generate a second electrical signal upon exposure to the radiation; wherein the detector is configured to determine a number of particles of the radiation incident on the first subpixel over a first period of time, based on the first electrical signal; wherein the detector is configured to determine an intensity of the radiation by integrating the second electrical signal over a second period of time.
METHOD FOR TEMPERATURE MONITORING IN CRYO-ELECTRON MICROSCOPY
Temperatures of cryo-electron microscopy samples are assessed based on images portions associated with high temperature superconductor (HTSC) areas or other thermal sensor materials that are thermally coupled to or thermally proximate the samples. Such thermal areas can be provided on sample mounts such as metallic grids, carbon films, or on sample stages. In examples using HTSCs, HTSCs having critical temperatures between −175° C. and −135° C. are typically used.
METHOD FOR CHANGING THE SPATIAL ORIENTATION OF A MICRO-SAMPLE IN A MICROSCOPE SYSTEM, AND COMPUTER PROGRAM PRODUCT
A method is carried out with the aid of a particle beam microscope which includes a particle beam column for producing a beam of charged particles, the particle beam column having an optical axis. Furthermore, the particle beam microscope includes a holding device for holding the extracted micro-sample. The method includes holding the extracted micro-sample and an adjacent hinge element via the holding device. The micro-sample adopts a first spatial orientation relative to the optical axis. The method also includes producing a bending edge in the hinge element by way of irradiation with a beam of charged particles such that the adjacent micro-sample is moved in space and the spatial orientation of the micro-sample is altered. The method further includes holding the micro-sample in a second spatial orientation relative to the optical axis, wherein the second spatial orientation differs from the first spatial orientation.
Methods and means for casing integrity evaluation using backscattered x-ray radiation in a wellbore environment
An x-ray-based casing imaging tool, defined by a combination of source collimators, located cylindrically around an X-ray source and a rotatable two-dimensional per-pixel collimated imaging detector array, is provided, the tool including at least an x-ray source; a radiation shield to define the output form of produced x-rays; a direction controllable two-dimensional per-pixel collimated imaging detector array; an imaging window within the tool housing that reduces attenuation of x-rays passing through said tool housing; sonde-dependent electronics; and a plurality of tool logic electronics and PSUs. A method of using an x-ray-based casing imaging tool to determine the integrity of well casing or tubing is also provided, the method including at least: producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from materials surrounding the wellbore; controlling two-dimensional per-pixel collimated imaging detector arrays; and converting image data from said detectors into consolidated images of the wellbore materials.
Non-destructive inspection methods, systems and apparatuses using focusable x-ray backscatter detectors
Methods, apparatuses, and systems are disclosed for generating X-ray backscatter images of a target by employing a flexible, deformable and flexible X-ray backscatter detector comprising a scintillating material layer comprising a scintillating jet print ink.
Reconfigurable backscatter detector
Provided are backscatter detection systems and methods implementing sensor arrays comprising flexible scintillators, and associated methods of operations. Specifically, an apparatus for detecting backscatter of a radiation beam formed in response to the radiation beam encountering an object comprises a structure configured to change from a first shape to a second shape. The apparatus further comprises a sensor array which comprises a flexible scintillating panel covering an area of the structure, and configured to conform to the shape of the structure form the first shape to the second shape. The flexible scintillating panel may comprise a plurality of optical fibers enclosed in a semi-rigid casing and coupled to a light detector. The plurality of optical fibers may be arranged in one or more layers. A layer of optical fibers may be arranged in a plurality of clusters or in an interwoven configuration.
FATIGUE ESTIMATING METHOD, AND METHOD OF CREATING DATABASE FOR FATIGUE ESTIMATION
A fatigue estimating method of estimating a degree of fatigue of a metallic material includes: estimating a fatigue portion in which fatigue appears in a section of the metallic material, obtaining a crystal grain size of each of a plurality of crystal grains in a measurement area set in the fatigue portion, based on crystal misorientation in the measurement area, obtaining a fatigue portion existence rate indicating an existence proportion of particular crystal grains of which the crystal grain size is within a predetermined numeral range, in the measurement area, and obtaining an estimated degree of fatigue of the metallic material, based on at least one of the fatigue portion existence rate, and a change rate of the fatigue portion existence rate before and after fatigue of the metallic material.
BEAM ALIGNMENT SYSTEMS AND METHOD
The present disclosure relates to a downhole tool that includes a first photon flux detector disposed at a first radial position about a longitudinal axis of the downhole tool that measures a first signal indicative of an x-ray flux of the x-ray photons. The downhole tool also includes a second photon flux detector disposed at a second radial position about the longitudinal axis of the downhole tool that measures a second signal indicative of the x-ray flux of the x-ray photons. Further, the downhole tool includes a controller communicatively coupled to the first photon flux detector and the second photon flux detector that determines a condition associated with the electron beam based at least in part on a relative x-ray flux from the first photon flux detector and the second photon flux detector.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Method and Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
In a squeegeeing step of the three-dimensional powder bed fusion additive manufacturing (PBF-AM) method, a powder sample is supplied onto a base plate to stack powder layers. In a main melting step, a powder bed which is a top layer of the powder layers is irradiated with an electron beam to melt a two-dimensional shape area, which is a single layer obtained by slicing a shaping model. In a shaping surface checking step, a backscattered electron that is generated when the melted area is irradiated with the electron beam is detected and, based on the backscattered electron, it is determined whether the melting state is normal or not. When it is determined in the shaping surface checking step that the melting state is not normal, a re-melting step is performed to re-irradiate the area melted in the main melting step with an electron beam generated by the beam generation unit.
RADIATION DETECTOR
Disclosed herein is a detector, comprising: a pixel comprising a first subpixel and a second subpixel, wherein the first subpixel is configured to generate a first electrical signal upon exposure to radiation, and wherein the second subpixel is configured to generate a second electrical signal upon exposure to the radiation; wherein the detector is configured to determine a number of particles of the radiation incident on the first subpixel over a first period of time, based on the first electrical signal; wherein the detector is configured to determine an intensity of the radiation by integrating the second electrical signal over a second period of time.