Disclosed are fibers which contain identification fibers. The identification fibers can comprise one or more chemical markers, or taggants, which may vary among the fibers or be incorporated throughout all of the fibers. The disclosure also relates to the method for making and characterizing the fibers. Characterization of the fibers can include identifying chemical markers and correlating the chemical markers and a taggant chemical marker amounts of at least one of the chemical markers to manufacturer-specific taggants to determine supply chain information. The supply chain information can be used to track the fibers from manufacturing through intermediaries, conversion to final product, and/or the consumer.

There is provided a molded article containing an amorphous resin, wherein a peak position change rate r (%) of the molded article defined by Equation: Peak position change rate r (%)=100×(Q1−Q2)/Q2 is 1 or more. In the equation, Q1 and Q2 are peak positions (nm.sup.−1) of the molded article and a predetermined reference molded article, respectively, the peak position being determined by a wide angle X-ray diffraction method. The peak position is a peak derived from the amorphous resin in a scattering vector magnitude Q-intensity profile calculated from a diffraction image obtained by a transmission method and measured by the wide angle X-ray diffraction method and obtained after background correction and transmittance correction, and the peak position is a value of Q at a peak at which Q is the smallest among peaks at which Q is in a range of 5 nm.sup.−1 to 25 nm.sup.−1.

A back-reflection Laue apparatus and a method are provided. The apparatus includes a source for generating X-ray radiation, a collimator for collimating the X-ray radiation into an X-ray beam; a back-reflection Laue chamber for transmitting the beam therethrough towards a sample, and back-reflecting visible radiation obtained from the beam being diffracted off the sample and converted to visible radiation upon re-entering the chamber, the chamber comprising a reflection side wall having an exterior surface and a reflective interior surface for back-reflecting the visible radiation, the wall being provided with a through-hole extending from the exterior surface to the reflective interior surface; and a detector assembly for detecting the back-reflected visible radiation. The collimator has a first end connected to the source and a second end terminating between the exterior surface and the reflective interior surface of the wall, within the through-hole, the beam exiting the collimator at the second end.

An X-ray analyzer includes an X-ray source, a straight tube type multi-capillary, a flat plate spectroscopic crystal, a parallel/point focus type multi-capillary X-ray lens, and a Fresnel zone plate. A qualitative analysis is performed over an area on the sample, the flat plate spectroscopic crystal and the Fresnel zone plate are removed from the X-ray optical path, and X-rays are collected by the multi-capillary lens and the sample is irradiated. When analyzing the chemical morphology of an element, the multi-capillary lens retracts from the optical path, the source rotates, and the flat plate spectroscopic crystal and the Fresnel zone plate are inserted on the optical path. A narrow sample area is irradiated by the Fresnel zone plate with X-rays having energy extracted from the flat plate spectroscopic crystal. This makes it possible to carry out accurate qualitative analysis on the sample and perform detailed analysis of more minute parts.

There is provided a control apparatus 40 that controls a tilt of a sample, the control apparatus comprising an input section 41 that receives an input of inclination information representing inclination of the sample with respect to a ϕ axis; an adjustment amount determination section 43 that determines adjustment amounts of a ω value and a χ value for correcting a deviation amount between a scattering vector and a normal line to a sample surface or a lattice plane with respect to a ϕ value that varies, using the inclination information; and a drive instruction section 47 that drives a goniometer according to ϕ axis rotation of the sample, based on the determined adjustment amounts of the ω value and the χ value, during an X-ray diffraction measurement.

A measuring arrangement (20) for x-ray radiation, comprising—a sample position (3), which can be illuminated by xray radiation (2) and—an x-ray detector (13) for detecting x-ray radiation emitted from the sample position (3), comprising at least one detector module (21-24), wherein the detector module (21-24) has a plurality of sensor elements (14; 14a-14e) arranged successively in a measuring direction (MR), each sensor element having a centroid (18), wherein the sensor elements (14; 14a-14e) are arranged in a common sensor plane (16) of the detector module (21-24), is characterized in that at least a majority of the sensor elements (14; 14a-14e) of the detector module (21-24), preferably all the sensor elements (14; 14a-14e) of the detector module (21-24), are designed as uniformly spaced sensor elements (14; 14a-14e), wherein the centroids (18) of the sensor elements (14; 14a-14e) have an equal distance R0 from the sample position (3). The measuring arrangement according to the invention can be implemented having flat detector modules, in particular semiconductor detector modules, and is less susceptible to measurement errors.

A method for X-ray measurement includes generating and directing an X-ray beam to a sample including at least first and second layers stacked on one another, the X-ray beam incident on a sample location at which the first and second layers include respective first and second high aspect ratio (HAR) structures. X-ray scatter profiles are measured, that are emitted from the sample location in response to the X-ray beam as a function of tilt angle between the sample and the X-ray beam. A shift is estimated, between the first and second layers and a characteristic tilt of the first and second layers, based on the X-ray scatter profiles measured as a function of the tilt angle.

A diffraction analysis device and a method for a full-field X-ray fluorescence imaging analysis are disclosed. The device includes a switching assembly, collimation assemblies, an X-ray source, an X-ray detector, a laser indicator, and a computer control system. The switching assembly combines with the collimation assemblies to achieve a functional effect that is previously achieved by two different types of devices through only one device by changing the positioning layout of the X-ray source and the X-ray detector. The full-field X-ray fluorescence imaging analysis can be realized, and the crystal phase composition information and the element distribution imaging information of the sample can be quickly obtained through the same device without scanning, which not only greatly improves the utilization rate of each assembly in the device, reduces the assemblies cost of the device, makes the device structure more compact, but also greatly improves the analysis efficiency and detection accuracy.

An evaluation device includes an X-ray diffraction measuring device configured to acquire a first X-ray locking curve having a first main peak and a first sub-peak partially overlapping the first main peak by measuring an X-ray locking curve of a first portion of a sample having a crystalline material. The evaluation device includes an analysis device configured to separate the first sub-peak from the first main peak, perform first evaluation of a crystal defects or distortion of the sample based on a peak position, peak intensity, or a half width of the separated first sub-peak, and output the first evaluation.

Disclosed is a sulfate corrosion-resistant concrete, a method for optimizing proportion and application thereof. The concrete is formed by mixing and stirring base stocks, aggregates, admixtures, external additives and water. The base stock of the concrete is 17.4-17.5 parts of Portland cement; the aggregates include 38.9 parts of basalt with aggregate size of 5-10 mm and 33.1-33.2 parts of basalt medium sand; the admixtures are 1.9-1.95 parts of silica fume or fly ash, and further including 0.23-0.24 part of polycarboxylate water reducer and 1.34-1.35 part of sulfate corrosion-resistant liquid preservative. Optimized proportion method: according to the corrosion characteristics of sulfate and corrosion environment parameters, determine the composition and proportion of basic samples and comparison samples, make and cure sample components, test the deep components of the samples, and obtain the optimal composition and proportion according to the test results.