Various aspects include methods compensating for Compton scattering effects in pixel radiation detectors. Various aspects may include determining whether gamma ray detection events occurred in two or more detector pixels within an event frame, determining whether the detection events occurred in detector pixels within a threshold distance of each other in response to determining that detection events occurred in two or more detector pixels within the event frame, and recording the two or more detection events as a single detection event having an energy equal to the sum of the measured energies of the two or more detection events located in the detector pixel having a highest measured energy in response to determining that the detection events occurred in detector pixels within the threshold distance of each other.

An apparatus for cosmogenic neutron sensing to detect moisture includes a thermal neutron proportional counter. A housing is formed at least partially from a moderating material, which is positioned around the thermal neutron proportional counter. A proportional counter electronics unit is within the housing and has a preamplifier and a shaping amplifier. The preamplifier and shaping amplifier are directly connected to the thermal neutron proportional counter. At least one photovoltaic panel provides electrical power to the thermal neutron proportional counter. A data logger is positioned vertically above the thermal neutron proportional counter and proportional counter electronics unit. A signal from the thermal neutron proportional counter is transmitted through the proportional counter electronics unit and is received by the data logger. The signal indicates a moisture content within a measurement surface of the thermal neutron proportional counter.

A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.

An object is to provide a measurement device using X-ray reflection that can reduce space required for measurement, simplify the setting procedure, and improve measurement accuracy. The measurement device using X-ray reflection includes an X-ray tube 1 configured to emit an X-ray beam, a detector 7 configured to detect a reflected beam of the X-ray beam, a rotational driving unit configured to rotate the X-ray tube 1 and the detector 7, a calibration plate 22 configured to reflect the X-ray beam emitted from the X-ray tube 1 toward the detector 7, and a control unit configured to perform a predetermined computation. The control unit controls the rotational driving unit to direct the X-ray tube 1 and the detector 7 toward a measurement object 21, causes the detector 7 to detect a reflected beam of an X-ray beam emitted from the X-ray tube 1 toward the measurement object 21, directs the X-ray tube 1 and the detector 7 toward the calibration plate 22, causes the detector 7 to detect a reflected beam of an X-ray beam emitted from the X-ray tube 1 toward the calibration plate 22, and determines a measurement value on the measurement object 21 by a computation using a signal representing the reflected beam from the measurement object 21 and a signal representing the reflected beam from the calibration plate 22.

The method of inspecting a degraded area of a metal structure covered by a composite repair generally comprises operating a Compton scattering inspection device onto the degraded area, including emitting a beam of radiation particles directed towards and across the composite repair, detecting at least some backscattered photons scattered back from the metal structure, and acquiring Compton scattering data from the detected backscattered photons, the Compton scattering data being indicative of remaining wall thickness of the degraded area.

A multi-modality imaging system allows for selectable photoelectric effect and/or Compton effect detection. The camera or detector is a module with a catcher detector. Depending on the use or design, a scatter detector and/or a coded physical aperture are positioned in front of the catcher detector relative to the patient space. For low energies, emissions passing through the scatter detector continue through the coded aperture to be detected by the catcher detector using the photoelectric effect. Alternatively, the scatter detector is not provided. For higher energies, some emissions scatter at the scatter detector, and resulting emissions from the scattering pass by or through the coded aperture to be detected at the catcher detector for detection using the Compton effect. Alternatively, the coded aperture is not provided. The same module may be used to detect using both the photoelectric and Compton effects where both the scatter detector and coded aperture are provided with the catcher detector. Multiple modules may be positioned together to form a larger camera, or a module is used alone. By using modules, any number of modules may be used to fit with a multi-modality imaging system. One or more such modules may be added to another imaging system (e.g., CT or MR) for a multi-modality imaging system.

A foreign substance analysis system capable of accurately and easily analyzing a foreign substance contained in a sample. The foreign substance analysis system includes an infrared spectrum acquisition step of acquiring infrared spectrum information of a sample measured by an infrared spectrophotometer; and a fluorescent X-ray spectrum acquisition step of acquiring fluorescent X-ray spectrum information of the sample measured by a fluorescent X-ray analyzer; and a determination step of determining whether or not an organic element is contained in the sample by comparing a ratio of an intensity of a Compton scattered ray and an intensity of a Rayleigh scattered ray in the fluorescent X-ray spectrum information with a set threshold value.

A detection pixel includes a material that is chosen so that its (averaged) atomic number density leads to the Compton process being the dominant scattering mechanism in response to incident photons, leading to production of Compton electrons with sufficient number and kinetic energy to produce an electric or magnetic response in the material. The incident photon and Compton electrons each have a characteristic travel distance in the material, and the detection pixel has at least one dimension that is selected according to a range defined by these characteristic travel distances. The detection pixels may be arranged in an array for imaging.

A multi-modality imaging system allows for selectable photoelectric effect and/or Compton effect detection. The camera or detector is a module with a catcher detector. Depending on the use or design, a scatter detector and/or a coded physical aperture are positioned in front of the catcher detector relative to the patient space. For low energies, emissions passing through the scatter detector continue through the coded aperture to be detected by the catcher detector using the photoelectric effect. Alternatively, the scatter detector is not provided. For higher energies, some emissions scatter at the scatter detector, and resulting emissions from the scattering pass by or through the coded aperture to be detected at the catcher detector for detection using the Compton effect. Alternatively, the coded aperture is not provided. The same module may be used to detect using both the photoelectric and Compton effects where both the scatter detector and coded aperture are provided with the catcher detector. Multiple modules may be positioned together to form a larger camera, or a module is used alone. By using modules, any number of modules may be used to fit with a multi-modality imaging system. One or more such modules may be added to another imaging system (e.g., CT or MR) for a multi-modality imaging system.

A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.