Patent classifications
G01N2223/076
SPECTROMETER
The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.
XFR ANALYZER INSTRUMENT
Disclosed is an X-ray fluorescence analyzer instrument for analyzing the elemental composition of a sample, including: a measurement chamber including air and a measurement aperture sealed by a sample window; a radiation source inside the measurement chamber to invoke secondary radiation from the sample adjacent to the sample window exterior of the measurement chamber; a radiation detector having its receiver inside the measurement chamber, the radiation detector receiving the secondary radiation from the sample window and providing a measurement signal describing intensity of the received radiation; a controller analyzing composition of the sample based on an energy spectrum of the measurement signal based on a calibration established at a reference air density inside the measurement chamber; and a device adjusting a volume of the measurement chamber restoring the reference air density inside the measurement chamber after a change in air density inside the measurement chamber to maintain calibration validity.
Identification Of Mycotoxin Absorption Materials In Clay Deposits
A method for determining absorption properties in clay deposits is provided that includes obtaining a clay sample, preparing the clay sample, analyzing the clay sample, and applying one or more correlative models to the clay sample. Additionally a system for use in determining absorption properties in clay deposits is provided that includes a plurality of inorganic particles, an analytical instrument configured to gather physical and/or chemical data about the inorganic particles, and a computer system configured to accept the physical and/or chemical data and/or generate correlations between the inorganic particles based on the data.
ANALYSIS DEVICE AND ANALYSIS METHOD
An analysis and observation device includes an analysis unit, a primary storage device that reads a substance library in which types of substances are associated with a plurality of characteristics, and a processor that executes processing based on the substance library. The substance library is configured by storing hierarchical information of superclasses each of which represents a general term of a substance and subclasses each of which represents a type of the substance. A processor includes: a spectrum acquirer that acquires an intensity distribution spectrum; a characteristic extractor that extracts a characteristic of a substance based on the intensity distribution spectrum; a substance estimator that estimates the type of the substance from subclasses based on the extracted characteristic; and a user interface controller that causes a display to display the estimated subclass and the superclass to which the subclass belongs in a hierarchical manner.
Energy dispersive x-ray fluorescent spectrometer, evaluation method, and evaluation program
Provided is an energy-dispersive X-ray fluorescence spectrometer capable of easily determining reliability of a result of quantitative analysis and quickly recognizing an abnormality in measurement conditions, an X-ray fluorescence spectrometer, a sample, preprocessing for the sample, or the like. The energy-dispersive X-ray fluorescence spectrometer includes: a spectrum acquisition unit configured to acquire a spectrum; a calculation unit configured to execute quantitative analysis for an element included in the sample based on a peak included in the spectrum; and an evaluation unit configured to calculate a plurality of evaluation values obtained using different calculation methods for a series of processes, being the process of acquiring the spectrum by the spectrum acquisition unit, and the process of executing the quantitative analysis by the calculation unit, and to calculate a comprehensive evaluation value obtained by composing the plurality of evaluation values.
SYSTEM AND METHOD FOR PROBABILITY-BASED DETERMINATION OF STRATIGRAPHIC ANOMALIES IN A SUBSURFACE
A method for determining a stratigraphic anomaly in a subsurface of the earth includes receiving raw data x, assigning the rock samples to corresponding stratigraphic units of the subsurface, transforming the raw data x to a centred log-ratios clr(x) dataset, calculating p-values with a pairwise sum rank test between populations of the centred log-ratios clr(x) dataset, selecting a set of fingerprint elements from the elements of the rock samples, converting raw concentrations corresponding to the set of fingerprint elements to isometric log-ratios ilr data, determining a number of ilr sub-populations within each stratigraphic unit, applying mixture discriminant analysis to the isometric log-ratios ilr data, using the ilr sub-populations to calculate posterior probabilities of the rock samples, and identifying the stratigraphic anomaly based on the posterior probabilities.
X-RAY FLUORESCENCE SPECTROSCOPY ANALYSIS
Multivariate machine learning (ML) techniques can be applied to an XRF spectra and mitigate matrix effects and enable simultaneous quantification of composition, even when markers elements or ions of interest are imperceptible in the XRF spectra. Physical (e.g., density) and chemical (e.g., total dissolved solids and hardness) properties of the material can be also quantified using ML techniques.
Sensors and sensor arrays for detection of analytes
Methods, apparatus and compositions are described for the measurement of metal and/or metalloid elements, including selenium in samples. More specifically, the present disclosure provides a sensor and/or array of sensors to measure metal and/or metalloid analytes, e.g., sensor and/or array of sensors having a chelator molecule, the chelator molecule including a peptide.
QUANTITATIVE ANALYSIS METHOD, QUANTITATIVE ANALYSIS PROGRAM, AND X-RAY FLUORESCENCE SPECTROMETER
Provided are a quantitative analysis method, a quantitative analysis program, and an X-ray fluorescence spectrometer. The quantitative analysis method includes: a step of acquiring a representative composition set to represent contents of analysis components; a step of acquiring a plurality of comparative compositions, in each of which the content of one of the analysis components of the representative composition is changed by a predetermined content; a detection intensity calculation step of calculating a detection intensity indicating an intensity of fluorescent X-rays detected under the influence of the geometry effect through use of an FP method with respect to a virtual sample having a thickness set in advance and being indicated by each of the representative composition and the comparative compositions; and a step of calculating a matrix correction coefficient for each of the analysis components based on the detection intensity.
X-ray analysis apparatus and x-ray generation unit
The X-ray analysis apparatus contains an X-ray generation unit. The X-ray generation unit includes a target plate having a target that is irradiated with an electron beam from an electron beam source and generates X-rays, X-ray convergence optics that converges X-rays generated from the target in conjunction with a movement of the target plate, and a driving unit that changes a position of the target plate or the X-ray convergence optics relative to the electron beam source.