A method of generating physical component qualification data using computed tomography (CT) includes obtaining qualified CT data from a CT scanner for at least one qualified physical component. Qualification data is generated based on the qualified CT data, where the qualification data defines a qualification envelope.

A method and system are disclosed to determine a concentration of one or more target elements in a sample, using gamma activation analysis comprising: simultaneously irradiating the sample and a reference material containing at least two reference elements X-rays, detecting deactivation gamma-rays from the irradiated sample and the irradiated reference material; determining the concentration of the or each target element in the sample by correcting the number of detected deactivation gamma-rays from any of the or each target element present in the irradiated sample based on the number of detected deactivation gamma-rays from the at least two reference elements, wherein the at least two reference elements have a variation in activation rate over a pre-defined X-ray end-point energy range which differs from one another.

An X-ray collimator (30) that comprises: a collimator body (31) comprising: a collimation conduit (32) provided with an inlet (320), configured to be connected to an X-ray source (20) for the inlet of a beam (B) of X-rays, and an outlet (321), configured to emit a collimated portion (B1) of the X-ray beam (B); and a derivation conduit (33) inclined with respect to the collimation conduit (32), wherein the derivation conduit (33) is provided with an inlet (330), configured to be connected to the X-ray source (20) for the inlet of a peripheral portion (B2) of the same X-ray beam (B) emitted by the source (20), and an outlet (331); a reference detector (40) fixed to the collimator body (31) and provided with an inlet window (41) facing the outlet (331) of the derivation conduit (33).

Methods and systems for characterizing dimensions and material properties of semiconductor devices by full beam x-ray scatterometry are described herein. A full beam x-ray scatterometry measurement involves illuminating a sample with an X-ray beam and detecting the intensities of the resulting zero diffraction order and higher diffraction orders simultaneously for one or more angles of incidence relative to the sample. The simultaneous measurement of the direct beam and the scattered orders enables high throughput measurements with improved accuracy. The full beam x-ray scatterometry system includes one or more photon counting detectors with high dynamic range and thick, highly absorptive crystal substrates that absorb the direct beam with minimal parasitic backscattering. In other aspects, model based measurements are performed based on the zero diffraction order beam, and measurement performance of the full beam x-ray scatterometry system is estimated and controlled based on properties of the measured zero order beam.

Devices and methods are disclosed for identifying compounds using spectra generated by X-rays at two different voltage levels.

A system and method of sorting mineral streams, for example laterite mineral ores, into appropriately classified valuable and waste streams for maximum recovery of value from the mineral stream, e.g., a stream of minerals includes receiving response data indicating reflected, absorbed or backscattered energy from a mineral sample exposed to a sensor, where the mineral sample is irradiated with electromagnetic energy. The system determines spectral characteristics of the mineral sample by performing spectral analysis on the response data of the mineral sample and identifies a composition of the mineral sample by comparing the spectral characteristics of the mineral sample to previously developed spectral characteristics of samples of known composition. The system then generates a sort decision for the mineral sample based on the comparison, where the sort decision is used in diverting the mineral sample to a desired destination e.g. pyrometallurgical treatment stages, or to a waste stream.

A method of qualifying physical components using computed tomography (CT) includes obtaining qualified CT data from a CT scanner for at least one qualified physical component. Qualification data is generated based on the qualified CT data, where the qualification data defines a qualification envelope. Candidate CT data is obtained from the CT scanner for a candidate physical component. Comparison data is then generated based on the candidate CT data and the qualification data, where the comparison data indicates whether the candidate CT data is within the qualification envelope defined by the qualification data. An acceptance signal is generated if the comparison data meets acceptance criteria.

A method is provided for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material. The method includes acquiring an energy spectrum transmitted through the sample, located in an X and/or gamma spectral band; for each spectrum of a plurality of calibration spectra, calculating a likelihood from said calibration spectrum, and from the spectrum transmitted through the sample, each calibration spectrum corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; and estimating the characteristic thicknesses associated with the sample according to the criterion of maximum likelihood.

An X-ray inspection apparatus includes an X-ray generator; an X-ray detector; and a determination unit determining a quality state of an inspection object, based on an X-ray detection signal. The apparatus has an X-ray image storing unit storing a first inspection image, corresponding to the X-ray detection signal outputted from the X-ray detector, whose observation direction is the direction in which the X-rays transmits the inspection object; a pseudo three-dimensional information generation model generating pseudo three-dimensional information regarding a type of object to be learned; and an inspection image generation unit creating a second inspection image regarding the type of object to be learned having an observation direction different from the first inspection image, based on the first inspection image regarding the type of object to be learned. The determination unit performs the determination based on at least the second inspection image created by the inspection image generation unit.

A system and method for producing period-coded glass containers is disclosed. One method comprises producing a glass container from a traceable material composition associated with a predetermined time period, manufacturing facility, and/or time of container manufacture, where the glass container is configured to be analyzed for the traceable material composition, and at least one of constituents of or amounts of materials in the traceable material composition is configured to be identified and cross-referenced to a cross-reference schedule for identifying the time period, manufacturing facility, and/or time of container manufacture in which the glass container was produced.