A method and apparatus for diagnosing and/or calibrating underperforming pixels in detectors in a small pixelated photon counting CT system utilizes a series of tests on image data acquired in-situ as part of a series of calibration scans in the CT system. Tests are performed on the acquired data to determine the existence of underperforming pixels within the detectors such that the information acquired by those pixels can be replaced by alternate data from surrounding pixels (e.g. by interpolation). The underperforming pixels are stored in “bad” pixel tables and may be specific to a type of image (e.g., spectral or counting) and a specific protocol.

An x-ray tomography system which can generate a qualitative 3D image of a region of interest using a an x-ray source, the x-ray source configured to emit x-ray radiation at the region of interest. The x-ray radiation or the x-ray source or the relative position of the x ray source configured to be moved in a two dimensional plane. An x-ray detector including a plurality of detector elements arranged in a two dimensional plane opposite the x-ray source, the x-ray detector configured to detect x-ray radiation after attenuation by the subject and provide an indication of the detected x-rays. And a processor configured to receive the indication of the detected x-rays and resolve the detected x-ray radiation into a three dimensional image. The three dimensional image is qualitative in nature.

This disclosure presents systems and processes to collect elemental composition of target fluid and solid material located downhole of a borehole. Waveguides can be utilized that include capillary optics to deliver emitted high energy into a container or a conduit and then to detect the high energy. A source waveguide can be used to emit the high energy into the target fluid and a detector waveguide can collect resulting measurements. Each waveguide can include a protective sheath and a pressure cap on the end of the capillary optics that are proximate the target fluid, to protect against abrasion and target fluid pressure. In other aspects, a pulsed neutron tool can be utilized in place of the waveguides to collect measurements. The collected measurements can be utilized to generate chemical signature results that can be utilized to determine the elemental composition of the target fluid or of the solid material.

An X-ray analyzer includes: a specimen stage; a spectrometer having a spectroscopic element and an X-ray detector; a temperature measuring unit including at least one of a first temperature sensor for measuring a temperature of the specimen stage and a second temperature sensor for measuring a temperature of the spectrometer; a storage unit which stores calibration data of the spectrometer, and a previous measurement result by the temperature measuring unit at the time of execution of the calibration of the spectrometer; and a notifying unit which acquires a measurement result by the temperature measuring unit, calculates a temperature variation amount of the acquired measurement result with respect to the previous measurement result stored in the storage unit, and notifies that calibration is needed, based on the temperature variation amount.

A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.

A method and a system for a two-step calibration method for the polychromatic semiconductor-based PCD forward counting model, to account for various pixel summing readout modes for imaging at different resolutions. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at plural tube voltage settings for each detector pixel. To correct the variation of the detector response due to different PCD sub-pixel summing schemes, the embodiments calibrate forward model parameters based on the various pixel readout modes.

Provided is a portable XRF data screening method for heavy metal contaminated soil, relating to the technical field of heavy metal contamination test. The method includes the following steps: (1) laboratory test; (2) XRF test; and (3) calculation of a recheck interval: dividing test data into four areas by a contaminant screening value X.sub.c as a horizontal line and a correlation-derived site screening value as a vertical line to calculate the recheck interval. The method is simple and efficient, and is beneficial to saving investigation costs and shortening a project cycle.

The invention provides a sensitivity correction coefficient calculating system for an X-ray detector with which the sensitivity correction coefficient can be calculated using a multipurpose X-ray source instead of a specific X-ray source. In the sensitivity correction coefficient calculating system for an X-ray detector having a detection surface where detection elements for detection the X-ray intensity are aligned one-dimensionally or two-dimensionally, fitting is carried out on the measured X-ray intensity detected by a detection element using an approximation function so as to calculate the sensitivity correction coefficient using the calculated X-ray intensity calculated from the approximation function and the measured X-ray intensity.

The system for in-situ real-time measurements of microstructure properties of 3D-printing objects during 3-D printing processes. An intensive parallel X-ray beam (with an adjustable beam size) impinges on a printing object and is diffracted on a crystal lattice of the printing material. The diffracted radiation impinges on a reflector formed with an array of reflector crystals mounted on an arcuated substrate. The diffracted beams reflected from the reflector crystals correspond to the diffraction intensity peaks produced by interaction of the crystal lattice of the printing material with the impinging X-ray beam. The intensities of the diffraction peaks are observed by detectors which produce corresponding output signals, which are processed to provide critical information on the crystal phase composition, which is closely related to the defects and performance of the printing objects. The subject in-situ technology provides an effective and efficient way to monitor, in real-time, the quality of 3D-printing parts during the 3-D printing process, with a significant potential for effective process control based on the reliable microstructure feedback.

A system and method can determine one or more CT scanner calibration parameters from a plurality of calibration object projections in a plurality of radiographs.