The present disclosure relates to systems and methods for determining rotation angles. The systems may perform the methods to: obtain a rotation speed of a radioactive scanning source in a CT scanner; obtain a plurality of original projection acquisition times corresponding to a plurality of projection samples, the plurality of projection samples being associated with rotation of the radioactive scanning source; determine a plurality of original rotation angles corresponding to the plurality of projection samples based on the plurality of original projection acquisition times and the rotation speed of the radioactive scanning source; and determine a plurality of modified rotation angles corresponding to the plurality of projection samples by modifying the plurality of original rotation angles.

Systems and methods of adaptively controlling filament current in an x-ray tube of an imaging system include the x-ray tube having a filament being calibrated. Calibration data from the calibration of the x-ray tube is stored at the imaging system, the calibration data including a filament current value that determines a tube current value for a tube voltage value at a plurality of stations. A resistance value of the filament over a period of time is monitored. A change in the resistance value of the filament over the period of time is determined, and the filament current value of at least one of the plurality of stations is adjusted based on the changed resistance value.

A control unit of an electronic cassette switches the power supply state of a plurality of blocks BL which share a signal processing of a signal processing circuit between an operating state and a non-operating state. The control unit switches the block BL from the non-operating state to the operating state before a predetermined time TW necessary for stable operation of the block BL from a timing when the reading of charge starts in the block BL.

A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.

A correction apparatus for correcting a structure factor includes a structure factor acquisition section that acquires the structure factor; a PDF calculation section that calculates PDF from the acquired structure factor; a correction function preparation section that prepares a first correction function that is Fourier-transformed in a predetermined range, and a second correction function that is Fourier-transformed in the predetermined range, the first correction function comprising data of the PDF and a cut-off function for cutting off data on a long distance side of the PDF and the second correction function comprising the cut-off function; a correction amount calculation section that calculates a correction amount comprising the first correction function, the second correction function, and a scale factor; a structure factor correction section that corrects the structure factor; and an R-factor value calculation section that calculates an R-factor value indicating correction accuracy.

A x-ray micro tomography system provides the ability to proscriptively determine regularization parameters for iterative reconstruction of a sample, from projection data of the sample. This allows a less experienced operator to determine the regularization parameters with adequate precision.

An apparatus or method determines a content of the one or more elements of a solid matrix by scanning the solid matrix using a PXRF spectrometer and a color sensor, receiving a PXRF spectra from the PXRF spectrometer and a numerical color data from the color sensor, extracting a value for each of the one or more elements the PXRF spectra, determining the content of the one or more elements of the solid matrix using one or more processors and a predictive model that relates the value of each of the one or more elements and the numerical color data to the content of the one or more elements of the solid matrix, and providing the content of the one or more elements of the solid matrix to one or more input/output interfaces.

Provided are a quantitative analysis method, a quantitative analysis program, and an X-ray fluorescence. The quantitative analysis method includes: a step of acquiring a representative composition set to represent contents of analysis components; a step of acquiring a plurality of comparative compositions, in each of which the content of one of the analysis components of the representative composition is changed by a predetermined content; a detection intensity calculation step of calculating a detection intensity indicating an intensity of fluorescent X-rays detected under the influence of the geometry effect through use of an FP method with respect to a virtual sample having a thickness set in advance and being indicated by each of the representative composition and the comparative compositions; and a step of calculating a matrix correction coefficient for each of the analysis components based on the detection intensity.

The present invention relates to method of identifying a selective BRISC inhibitor. The present invention also relates to a stable BRISC dimer. The present invention further relates to use of the stable BRISC dimer to generate cryo-Electron Microscopy (cryo-EM), crystallography, nuclear magnetic resonance and/or X-ray crystallography structures for structure guided drug design.

A measurement system and method are presented for measuring one or more parameters of a sample. The measurement system comprises an excitation system and a detection system. The excitation system is configured to generate combined exciting radiation comprising one- or multi-parameter modulation of multiple exciting signals of different types to be applied to at least a portion of a sample under measurements to thereby induce electron emission response of said at least portion of the sample to said combined exciting radiation. The detection system is configured for detecting the electron emission response of the at least portion of the sample and generating measured data indicative of a modulated change of an electrical state of the at least portion of the sample, thereby enabling determination of one or more parameters of the sample from the measured data.