A measurement processing device used for an x-ray inspection apparatus that detects an x-ray passing through a specimen with a detection unit to sequentially inspect a plurality of specimens on the basis of an acquired transmission image, includes a setting unit that sets a region to be inspected on a portion of the specimen; a determination unit that determines the non-defectiveness of the region to be inspected by using a transmission image of the x-ray that passed through the region to be inspected; a correction unit that performs a correction on the region to be inspected on the basis of a determination result by the determination unit; and a display control unit that displays the corrected region to be inspected corrected by the correction unit.

A method for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material, including acquiring an energy spectrum (S.sup.ech) transmitted through this sample, located in an X and/or gamma spectral band; for each spectrum of a plurality of calibration spectra (s.sup.base(L.sub.k; L.sub.t)) calculating a likelihood from said calibration spectrum (S.sup.base(L.sub.k; L.sub.t)), and from the spectrum transmitted through the sample (S.sup.ech), each calibration spectrum (S.sup.base(L.sub.k; L.sub.t)) corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; estimating the characteristic thicknesses (L.sub.1, L.sub.2) associated with the sample according to the criterion of maximum likelihood.

A hybrid inspection system of the present invention is an inspection system including a first inspection device (1) for inspecting a sample (11) based on X-ray measurement data obtained by irradiating the sample (11) with X-rays, and a second inspection device (2) for inspecting the sample (11) by a measuring method using no X-rays. The X-ray measurement data obtained by the first inspection device or an analysis result of the X-ray measurement data is output to the second inspection device (2). In the second inspection device (2), the structure of the sample (11) is analyzed by using the X-ray measurement data input from the first inspection device (1) or the analysis result of the X-ray measurement data.

There is provided an X-ray measurement apparatus (X-ray diffractometer 2) constituting a measurement system of X-ray analysis from a plurality of components, the X-ray measurement apparatus comprising an apparatus body directly or indirectly attaching each of target components and each of non-target components; each of the target components (selection slit 41) to be attached, the type of the attached target component being recognized by the apparatus body, and each of the non-target components to be attached, the type of the attached non-target component not being recognized by the apparatus body a measurement category; and an indicator (indicator 41a for the selection slit) that indicates whether attachment of each of the target components is appropriate for a measurement category.

A magnetoscop inspection system includes a magnetoscop, a computed tomography unit, and a corrosion model unit. The magnetoscop measures a permeability at a plurality of inspection points of a turbine component. The computed tomography unit generates a measured profile of a hollowed portion of the turbine component based at least in part on the permeability at the measured inspection points. The corrosion model unit stores in memory at least one reference computed tomography profile of a known turbine component. The magnetoscop inspection system determines a structural integrity of the turbine component based on a comparison between the measured profile and the reference profile corresponding to the turbine component currently under inspection.

An apparatus or method determines a content of the one or more elements of a solid matrix by scanning the solid matrix using a PXRF spectrometer and a color sensor, receiving a PXRF spectra from the PXRF spectrometer and a numerical color data from the color sensor, extracting a value for each of the one or more elements the PXRF spectra, determining the content of the one or more elements of the solid matrix using one or more processors and a predictive model that relates the value of each of the one or more elements and the numerical color data to the content of the one or more elements of the solid matrix, and providing the content of the one or more elements of the solid matrix to one or more input/output interfaces.

The present disclosure provides a method for analyzing the signal of a neutral atom imaging unit, including: preparing a neutral atom imaging unit, which includes a semiconductor detector array and modulation grids disposed at intervals in front of the semiconductor detector array; preparing a neutral atom source plane, energetic neutral atoms emitted by the neutral atom source plane are received by the semiconductor detector array after passing through the modulation grids, and the modulation grids form a projection on the semiconductor detector array; obtaining a response function of the imaging unit according to the projection; calculating the data signal obtained by the neutral atom imaging unit; and performing inversion imaging on the neutral atom emission source according to the response function of the imaging unit and the data signal. The method well inverts the neutral atom emission source to obtain the intensity and size of the neutral atom emission source.

The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.

Chemical components in a mixture are analysed using scattering data representing the results of a diffraction experiment performed on the mixture. Using non-negative matrix factorisation or another optimisation technique, the scattering data is deconvolved into non-negative basis components that represent contributions to the scattering data from each chemical component and fitting coefficients are derived in respect of the basis components that represent the proportions of chemical components in the mixture.

A system for high-resolution high-contrast x-ray ghost diffraction comprises: A) a laboratory x-ray source configured to provide an input beam; B) a diffuser configured to induce intensity fluctuations in the input beam; C) a beam splitter configured to split the input beam into: i) a test arm comprising an object and a single-pixel detector; and ii) a reference arm comprising one of: (a) a multi-pixel detector and (b) a single-pixel detector and an aperture or a scanning slit configured to simulate a one or two dimensional multi-pixel detector; and D) a processor configured to receive output intensity measurements of the detectors in the test arm and the reference arm, to record the output intensity measurements at different rotational positions of the rotating diffuser, to correlate the output intensity measurements, and to use the correlated output measurements to reconstruct a diffraction pattern of the object; wherein the object is placed as close as possible to the beam splitter and the detectors in the test arm and the reference arm are equidistant from the beam splitter.