Provided is an electronic device including an emission circuit configured to emit a first X-ray based on a clock in a second period when the period of the clock is changed from a first period to a second period and a processing circuit configured to output a first image data value based on a second X-ray received corresponding to the first X-ray or update a correction data value used to correct a first image data value, based on a control signal synchronized with the clock based on the first period.

Three ROIs, ROI-c, ROI-d, and ROI-e, are set for an L peak and an L peak reflecting an electron state of a valance band. Accumulated values in the ROI-c, ROI-d, and ROI-e are respectively normalized with reference to an accumulated value in an ROI-a, to determine a sample vector. The sample vector is compared to a plurality of compound vectors corresponding to a plurality of compounds, and a compound forming the sample is estimated based on a compound vector having the highest similarity.

An X-ray inspection apparatus includes an X-ray source that radiates X-rays to a product, an X-ray detection unit that detects X-rays penetrating the product, and an uninterruptible power supply that supplies electric power during an electric power failure. The uninterruptible power supply is not electrically connected to the X-ray source.

An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).

A system and method for producing period-coded glass containers is disclosed. One method comprises producing a glass container from a traceable material composition associated with a predetermined time period, manufacturing facility, and/or time of container manufacture, where the glass container is configured to be analyzed for the traceable material composition, and at least one of constituents of or amounts of materials in the traceable material composition is configured to be identified and cross-referenced to a cross-reference schedule for identifying the time period, manufacturing facility, and/or time of container manufacture in which the glass container was produced.

Various aspects include methods compensating for Compton scattering effects in pixel radiation detectors. Various aspects may include determining whether gamma ray detection events occurred in two or more detector pixels within an event frame, determining whether the detection events occurred in detector pixels within a threshold distance of each other in response to determining that detection events occurred in two or more detector pixels within the event frame, and recording the two or more detection events as a single detection event having an energy equal to the sum of the measured energies of the two or more detection events located in the detector pixel having a highest measured energy in response to determining that the detection events occurred in detector pixels within the threshold distance of each other.

A radiation image imaging apparatus which generates an image from irradiated radiation, the radiation image imaging apparatus including: a communication unit which directly communicates by wireless communication with an information processing apparatus which performs wireless communication, and receives installation setting information transmitted from the information processing apparatus to perform predetermined setting at the time of installation; and a hardware processor which performs setting of the radiation image imaging apparatus in accordance with the installation setting information received by the communication unit.

A method for generating cross-sectional profiles using a scanning electron microscope (SEM) includes scanning a sample with an electron beam to gather an energy-dispersive X-ray spectroscopy (EDS) spectrum for an energy level to determine element composition across an area of interest. A mesh is generated to locate positions where a depth profile will be taken. EDS spectra are gathered for energy levels at mesh locations. A number of layers of the sample are determined by distinguishing differences in chemical composition between depths as beam energies are stepped through. A depth profile is generated for the area of interest by compiling the number of layers and the element composition across the mesh.

A method for displaying measurement results from X-ray diffraction measurement, in which a sample is irradiated with X-rays and the X-rays diffracted by the sample are detected by an X-ray detector, comprises: (1) forming a one-dimensional diffraction profile by displaying, on the basis of output data from an X-ray detector, a profile in which one orthogonal coordinate axis shows 2 angle values and another orthogonal coordinate axis shows X-ray intensity values; (2) forming a two-dimensional diffraction pattern by linearly displaying X-ray intensity data, for each 2 angle value and on the basis of output data from the X-ray detector; the X-ray intensity data being present in the circumferential direction of a plurality of Debye rings formed at each 2 angle by diffracted X-rays; and (3) displaying the two-dimensional diffraction pattern and the one-dimensional diffraction profile so as to be aligned such that the 2 angle values of both coincide with each other.

A magnetoscop inspection system includes a magnetoscop, a computed tomography unit, and a corrosion model unit. The magnetoscop measures a permeability at a plurality of inspection points of a turbine component. The computed tomography unit generates a measured profile of a hollowed portion of the turbine component based at least in part on the permeability at the measured inspection points. The corrosion model unit stores in memory at least one reference computed tomography profile of a known turbine component. The magnetoscop inspection system determines a structural integrity of the turbine component based on a comparison between the measured profile and the reference profile corresponding to the turbine component currently under inspection.