An apparatus and method are described which enable real time measurements to measure the margin to criticality in a process for manufacturing fissile materials. An exemplary apparatus includes a neutron source capable of being modulated, an optional moderator to reduce the thermal energy of neutrons from the neutron source, a collimator for controlling the direction of any neutrons emanating in use from the target, a plurality of detector arrays positioned in predetermined locations relative to a process vessel for detecting process variables and for sending signals representative of the process variables in real time to a processor for receiving the signals and converting the detected process variables into margin to criticality measurements.

A metrology system is disclosed. In one embodiment, the metrology system includes a controller communicatively coupled to a reference metrology tool and an optical metrology tool, the controller including one or more processors configured to: generate a geometric model for determining a profile of a test HAR structure from metrology data from a reference metrology tool; generate a material model for determining one or more material parameters of a test HAR structure from metrology data from the optical metrology tool; form a composite model from the geometric model and the material model; measure at least one additional test HAR structure with the optical metrology tool; and determine a profile of the at least one additional test HAR structure based on the composite model and metrology data from the optical metrology tool associated with the at least one HAR test structure.

An X-ray imaging device includes a color sensor configured to generate a color signal indicating a particular color sensed, an imaging matrix of pixel detector elements that are each configured to detect photon energy and generate an image signal, and a controller that is coupled to the color sensor, the imaging matrix, and the wireless transceiver. The controller is configured to receive a color signal from the color sensor, determine an identifier of the computing device external to the X-ray imaging device based on the color signal, and change at least one operational setting of the X-ray imaging device based on the identifier.

A system for detecting gold in a sample using X-ray fluorescence can comprise an X-ray device having an X-ray tube assembly. The X-ray tube assembly can comprise a target material. The target material can comprise uranium (e.g., U-238). The X-ray device is configured to emit X-rays at a core or rock sample.

A system and method for a Computed Tomography (CT) process for calculating a dose of radiation to which an object is expected to be exposed when performing a CT scan on the object is disclosed. The CT apparatus includes a scanner that performs a scout scan on the object; an image processor that acquires image data for the shape of the object based on a scout scan image, compares the acquired image data to pre-stored image data, and selects an image data having greater similarity than predetermined similarity to the acquired image data from among the pre-stored image data; and a controller that calculates a dose of radiation to which the object is expected to be exposed, based on a dose of radiation corresponding to the selected at least one image data, and performs a CT scan on the object based on the calculated dose of radiation.

A method for determining a CT system parameter: controlling a mould body to move between an X-ray source and a detection surface of a detector, and acquiring X-ray projections of the mould body during movement on the detection surface, wherein the mould body has a first plane and a second plane perpendicular to each other, and the first plane and the second plane are always perpendicular to the detection surface during the movement of the mould body; determining a first straight line and a second straight line according to the acquired X-ray projections; and determining an intersection point of the first straight line and the second straight line as a pedal coordinate of a focus of the X-ray source on the detection surface, a CT coordinate system parameter including the coordinates of the foot of the perpendicular.

A method of examining a sample using a charged particle microscope is provided comprising scanning a charged particle beam over an area of the sample, detecting spectral emissions from the sample in response to scanning of the charged particle beam, and identifying a first plurality of substantially similar spectral emissions. A first chemical element is determined that is associated with the substantially similar spectral emissions. A first base spectral number value associated with said first chemical element is provided that is related to the number of similar spectral emissions that are required for confidently determining said first chemical element. The first base spectral number value is used for dividing at least a part of the scanned area of the sample into a first number of segments. The method includes providing a graphical representation of the sample, wherein said graphical representation includes said first chemical element and corresponding segments.

An X-ray inspection apparatus with is configured to suppress the incidence of anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an article using detection data obtained by detecting X-rays with which the article has been irradiated. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable.

The present disclosure relates to a time-gated fast neutron transmission radiography system and method. The system makes use of a pulsed neutron source for producing neutrons in a plurality of directions, with at least a subplurality of the neutrons being directed at an object to be imaged. The system also includes a neutron detector system configured to time-gate the detection of neutrons emitted from the pulsed neutron source to within a time-gated window.

An X-ray thin film inspection device according to the present invention has an X-ray irradiation unit 40 mounted in a first rotation arm 32, an X-ray detector 50 mounted in a second rotation arm 33, a fluorescence X-ray detector 60 for detecting fluorescent X-ray occurring from an inspection target due to irradiation of X-ray, a temperature measuring unit 110 for measuring the temperature corresponding to the temperature of the X-ray thin film inspection device, and a temperature correcting system (central processing unit 100) for correcting an inspection position on the basis of the temperature measured by the temperature measuring unit 110.