An X-ray detector according to a present embodiment includes: an optical sensor array configured to generate an electric signal by receiving X-rays; a substrate including at least an element that performs A/D conversion on the electric signal; a first support plate configured to hold a separator for removing scattered radiation; and a second support plate that is formed of a material being higher in thermal conductivity than the first support plate and is provided in contact with the substrate at least in part.

The present disclosure relates to a security inspection device and a transfer method, and the security inspection device includes an arm frame, provided with detectors, and configured to form an inspection channel; a first compartment, internally provided with a radiation source and connected with the arm frame, a protection wall, connected with the first compartment or the arm frame, and configured to perform radiation protection for an object to be protected, and a tire assembly, configured to enable the security inspection device to move relative to the ground, and the arm frame, the first compartment, the protection wall and the tire assembly are set to be transported together in a connected state.

A radiation treatment apparatus, comprising a gantry structure comprising a beam member extending between first and second ends of the gantry structure. The radiation treatment apparatus also includes a radiation treatment head movably mounted to the beam member in a manner that allows (i) translation of the radiation treatment head along the beam member between the first and second ends, and (ii) gimballing of the radiation treatment head relative to the beam member, the gimballing comprising pivotable movement in at least one independent pivot direction defined with respect to the beam member. The radiation treatment apparatus also includes a patient couch operative coupled with the radiation treatment head in manner to provide movement of the patient couch relative to the radiation treatment head.

A method, apparatus, and system for scanning an elongate structure. A scanner in a scanning system is moved axially along the elongate structure using a translating structure in the scanning system. The elongate structure is scanned axially using an x-ray beam emitted by the scanner as the scanner moves axially along the elongate structure to perform an axial scan. The x-ray beam has a first orientation. A location on the elongate structure having an inconsistency is detected while scanning the elongate structure axially. The elongate structure is scanned at the location with the x-ray beam in a second orientation.

A method for operating a measurement system (100) comprises: generating a beam of electromagnetic radiation (25) directed along a central ray (27) using a radiation source (19); moving the radiation source (19) relative to an object region (35) so that the central ray (27) is directed onto a radiation detector (31) during the movement; wherein the moving of the radiation source (19) relative to the object region (35) comprises: rotating the radiation source (19) about a first axis of rotation (D1), wherein the radiation source (19) is disposed eccentrically to the first axis of rotation (D1); rotating the radiation source (19) about a second axis of rotation (D2), wherein the first axis of rotation (D1) and the second axis of rotation (D2) together enclose an acute angle () amounting to at most 80.

The device includes a first X-ray source, configured to illuminating a measurement cell with a first beam of X photons; a first detector, placed opposite the first X-ray source along a first illumination axis; a second X-ray source, configured to illuminating the measurement cell with a second beam of X photons simultaneously with the first X-ray source; a second detector, placed opposite the second X-ray source along a second illumination axis; and a tray carrying the first X-ray source, the first detector, the second X-ray source, and the second detector, the tray being rotatable around the cell axis.

A method for operating a measurement system (100) comprises: generating a beam of electromagnetic radiation (25) directed along a central ray (27) using a radiation source (19); moving the radiation source (19) relative to an object region (35) so that the central ray (27) is directed onto a radiation detector (31) during the movement; wherein the moving of the radiation source (19) relative to the object region (35) comprises: rotating the radiation source (19) about a first axis of rotation (D1), wherein the radiation source (19) is disposed eccentrically to the first axis of rotation (D1); rotating the radiation source (19) about a second axis of rotation (D2), wherein the first axis of rotation (D1) and the second axis of rotation (D2) together enclose an acute angle (?) amounting to at most 80?.

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.

An X-ray generator includes: a line X-ray source; a multilayer film mirror; and a side-by-side reflecting mirror including two concave mirrors joined together so as to share a join line. A cross section of a reflecting surface of the multilayer film mirror has a parabolic shape, and a focus of the parabolic shape is located at the line X-ray source. Cross sections of reflecting surfaces of the two concave mirrors of the side-by-side reflecting mirror each have a parabolic shape, and each of focuses of the parabolic shapes is located on a side opposite to the multilayer film mirror. An extended line of the join line of the side-by-side reflecting mirror passes through the multilayer film mirror and the line X-ray source as viewed in a plan view.

An X-ray diffraction apparatus for measuring crystal orientation of crystalline samples is provided. The apparatus comprises a turntable comprising at least one tray; a turntable support platform defining a plane; and a motorized turntable displacement system for remotely displacing the turntable linearly along a first axis parallel to the plane, linearly along a second axis perpendicular to the plane, and rotatably about the second axis; an X-ray assembly provided within the enclosure; and a motorized X-ray assembly displacement system for displacing the X-ray assembly linearly along a third axis, the third axis being parallel to the plane and non-parallel to the first axis; wherein for each one of the crystalline samples, at least one of the motorized turntable displacement system and the motorized X-ray assembly displacement system is actuated to align the collimated X-ray beam with the corresponding measuring position and measure the crystal orientation of the crystalline sample.