A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector.

An X-ray fluorescence analyzer includes a sample stage having an opening, the sample stage being configured to place a sample thereon so that the sample is exposed from the opening, an X-ray source for irradiating the sample with primary X-rays from below the sample stage through the opening, and a detector for detecting fluorescence X-rays generated from the sample. It further includes an analyzer for analyzing the constituent elements based on the fluorescence X-rays, a measuring device for measuring a height of a surface of the sample exposed from the opening, a determination unit for determining whether a height difference between the height measured by the measuring device and a height of the upper surface of the sample stage is within a tolerance, and a notification unit for notifying a determination result of the determination unit. With this, the reliability of the analysis result can be recognized.

An x-ray inspection system includes an x-ray source, a sample support for supporting a sample to be inspected, where the sample support includes a support surface extending in a horizontal plane, an x-ray detector, and a sample support positioning assembly for positioning the sample support relative to the x-ray source or x-ray detector. The sample positioning assembly includes a vertical positioning mechanism for moving the sample support in a vertical direction, orthogonal to the horizontal plane, and a first horizontal positioning mechanism for moving both the sample support and the vertical positioning mechanism in a first horizontal direction. This arrangement allows for accurate movement of the sample to different imaging positions in the horizontal plane and a low power vertical positioning mechanism to be used.

A sample holder (10) filled with a sample is held in a base member (20), and an airtight member (30) is mounted on the base member (20) so as to cover the surroundings of the sample holder (10), thereby forming a sample holding structure in a closed space. The airtight member (30) includes a fitting portion (35) which is configured to be fitted and mounted in a mounting portion (21).

A measurement X-ray CT apparatus calibrates a geometrical positional relationship between a focus of an X-ray source, an X-ray detector, and a rotation center of a rotating table in advance. The measurement X-ray CT apparatus then obtains projection images by irradiating the object to be measured with X-rays to perform a CT scan, and generates a three-dimensional image of the object to be measured by CT reconstruction of the projection images. The measurement X-ray CT apparatus further includes a reference frame that is made of a material and has a structure less susceptible to environmental changes, and sensors that are located on the reference frame and intended to successively obtain calibration values of the geometrical positional relationship between the focus of the X-ray source and the X-ray detector during the CT scan. The calibration values are used as parameters of the CT reconstruction.

A visible test system includes a test chamber system, a heating system, a pressure control system, and a high-energy accelerator CT detection system configured to scan and detect the seepage and migration of magnetic fluid in fractures in a sample. The test chamber system includes a pressure chamber and a sample encapsulation device immersed in hydraulic oil arranged inside the pressure chamber. The heating system includes a magnetic fluid heating device, a resistance wire heating device and a temperature detection device. The magnetic fluid heating device includes a magnetic fluid loading pump configured to supply the magnetic fluid injected into the sample encapsulation device and an alternating magnetic field control device configured to provide an alternating magnetic field for heating the magnetic fluid. The resistance wire heating device is configured to heat the hydraulic oil. The present invention makes the fracture connectivity change during rock mass fracture visible.

A vacuum chuck for clamping workpieces, in particular wafers, and a measuring device and a method for checking workpieces by way of X-ray fluorescent radiation. The vacuum chuck has a clamping plate having a support surface, having at least one suction connection arranged on a base body for connecting to a negative-pressure device and for clamping the workpiece on the clamping plate by negative pressure received by the base body and having several suction grooves arranged in the clamping plate and are open towards the support surface. The support surface has concentric suction grooves having a suction opening to which a negative-pressure line is connected or which is connected to a work channel. Each suction groove having a separate negative pressure, which is separate to the adjacent suction groove, is selectively controlled by a control valve by a control for supplying the respective negative pressure in the respective suction groove.

The present invention relates to a magnetic holder for immunoelectron microscopy grids. The holder comprises a frame, a magnet and a hydrophobic layer. The device can use a magnetic force to simultaneously attach the outer rings of nickel grids to the frame, so that a batch operation (such as rinsing, immunolabeling and dyeing) of the nickel grids can be realized. In addition, due to the hydrophobic effect of the hydrophobic layer, the holder can reduce the amount of the liquid carried by the nickel grids in the process of continuously transferring the nickel grids between different types of liquids to almost zero. Compared with the prior art, the magnetic holder effectively reduces the probability of cross-contamination between reagents.

The present invention relates to a dual-arm clamping type holder for transmission electron microscopy grids and preparation method thereof. The preparation method comprises: firstly manufacturing a frame with two adjacent arms located on a same plane and have a clamping structure by a hard material; then putting the frame in a molten adhering liquid so that the frame is dipped with the adhering liquid; and finally, taking out the frame dipped with the adhering liquid, and waiting for the adhering liquid to solidify into adhering layers along the arms. The dual-arm clamping type holder manufactured by the method of the present invention comprises a frame and adhering layers; and the adhering layers adhere to the inner sides of the clamping structure between the two adjacent arms of the frame.

A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, an x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.