A method and system is disclosed for acquiring image data of a subject. The image data can be collected with an imaging system in a selected manner and/or motion. More than one projection may be combined to generate and create a selected view of the subject.

A spectrum measurement and estimation method for tomographic reconstruction, beam hardening correction, dual-energy CT and system diagnosis, etc., comprises determining the spectra for combinations of source acceleration voltage, pre-filters and/or detectors and after measuring the transmission values of several pre-filters, calculating corrected spectra for the combinations of the source acceleration voltage, pre-filters and/or detectors.

A masking apparatus surrounds a specimen and eliminates the presence of voids and gaps between a specimen and a radiation sensitive imaging surface. Voids and gaps allow radiation to become trapped or diffracted therein and lead to noise in the resulting image. A system of radiological imaging associates both a filter and a masking assembly to a specimen for an optimal radiation exposure that permeates the specimen to an imaging array there under.

An X-ray detector according to a present embodiment includes: an optical sensor array configured to generate an electric signal by receiving X-rays; a substrate including at least an element that performs A/D conversion on the electric signal; a first support plate configured to hold a separator for removing scattered radiation; and a second support plate that is formed of a material being higher in thermal conductivity than the first support plate and is provided in contact with the substrate at least in part.

A system for X-ray topography, the system includes a source assembly, a detector assembly, a filter and a processor. The source assembly is configured to direct at least an X-ray beam to impinge, at an angle, on a first surface of a sample, the X-ray beam is divergent when impinging on the first surface. The detector assembly is configured to detect the X-ray beam that had entered the sample at the first surface, diffracted while passing through the sample and exited the sample at a second surface that is opposite to the first surface, and to produce an electrical signal in response to the detected X-ray beam. The filter is mounted between the source assembly and the first surface, and is configured to attenuate an intensity of a selected spectral portion of the X-ray beam. The processor is configured to detect one or more defects in the sample based on the electrical signal.

An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.

A filter system is for the local attenuation of X-radiation. In an embodiment, the filter system includes a filter device, arranged in a beam path of an X-ray apparatus and including a channel arrangement, the channel arrangement including a multiplicity of channel sections extending in parallel on a plane; a supply device to provide a 2-phase fluid flow containing drops of an absorber liquid, to absorb X-radiation and a carrier liquid transparent to X-radiation; and a sorting section, including an input connected to the supply device, a first output connected to the channel arrangement, a second output, and a deflection device to direct individual drops of the absorber liquid to the first output or the second output.

An improved dual energy CT imaging system for providing improved imaging and improved material identification.

Described are system and method embodiments for measuring a thickness of a material layer using electromagnetic radiation. In some embodiments, a system includes a radiation source configured to direct first radiation towards a first surface of a layer of material having a thickness between the first surface and a second surface opposite the first surface. The first radiation causes the material layer to emit secondary radiation. A filter is positioned between the material layer and a radiation detector and in the beam path of the second radiation in order to attenuate a portion of the second radiation associated with fluorescence of the material to emit third radiation. Then, the radiation detector is configured to detect the third radiation and a controller is configured to provide a measurement corresponding to the thickness of the material layer based on the detected third radiation.

To correctly acquire image data of an inspected article by preventing a difference in shade between images caused by a difference in position or sensitivity between sensor elements. An X-ray generation source irradiates an inspection region where an inspected article passes with an X-ray. X-ray detection means receives the X-ray passing through the inspection region using a plurality of sensor elements. Image data generation means generates image data of the inspected article from an output of the X-ray detection means. Incidence condition changing means changes two or more kinds of X-ray incidence conditions common for all of the plurality of sensor elements of the X-ray detection means in a state of absence of the inspected article in the inspection region. Correction data generation means acquires correction data that is needed for making a shade of an image uniform for each incidence condition.