G01N2223/316

SCANNING SYSTEM AND METHOD FOR SCANNING VESSELS

A method of scanning an industrial chemical vessel to monitor a chemical process within the industrial chemical vessel, the method comprising: positioning a first unmanned aerial vehicle (UAV) carrying a gamma radiation source on one side of the vessel, positioning a second UAV carrying a gamma radiation detector on an opposite side of the vessel, moving the first and second UAVs to scan the vessel by passing gamma radiation through the vessel from the radiation source carried by the first UAV to the radiation detector carried by the second UAV thereby measuring a density profile, identifying a location of one or more fluid layers within the industrial chemical vessel, and determining if a chemical process within the industrial chemical vessel is operating correctly based on the location of the one or more fluid layers within the industrial chemical vessel identified using the first and second UAVs.

RADIOGRAPHIC IMAGING APPARATUS AND RADIATION DETECTOR
20230076183 · 2023-03-09 ·

A radiographic imaging apparatus and a radiation detector are provided, which are capable of sufficiently reducing the sensitivity difference between pixels even if the incident photon rate is high. A radiographic imaging apparatus includes: a radiation source for irradiating an object with radiation; a plurality of detection element modules each having a semiconductor layer that generates electrical charges depending on photon energy of the radiation, and a photon counting circuit for counting the electrical charges for each pixel; and a collimator that is disposed between the radiation source and the semiconductor layer, and has a plurality of walls forming a plurality of passage holes through which the radiation passes. A plurality of subpixels is formed on the semiconductor layer, and when one or more subpixels defined by the walls of the collimator are grouped as a macro pixel, a plurality of macro pixels arranged from each end of each of the detection element modules is smaller in size than a macro pixel other than the plurality of macro pixels arranged from the end of the detection element module.

Scatter correction for computed tomography imaging
11662321 · 2023-05-30 · ·

Systems and methods for scatter correction of x-ray images are provided. A scatter image of an object can be corrected using partial-scatter free images acquired using an aperture plate. The plate is positioned between an object and a radiation detector and includes apertures in a grid. The original x-rays pass through the apertures and scattered x-rays can be blocked by the aperture plate. The aperture plate can be moved to different positions, allowing partial scatter-free images to be acquired at each position of the aperture plate. A full scatter-free image can be generated by combining partial scatter-free images. The scatter and scatter-free images can be further used to train scatter correction models.

Combined scanning x-ray generator, composite inspection apparatus, and inspection method for hybrid

Embodiments of the present disclosure disclose a combined scanning X-ray generator, a composite inspection apparatus and an inspection method. The combined scanning X-ray generator includes: a housing; an anode arranged in the housing, the anode including a first end of the anode and a second end of the anode opposite the first end of the anode; a pencil beam radiation source arranged at the first end of the anode and configured to emit a pencil X-ray beam; and a fan beam radiation source arranged at the second end of the anode and configured to emit a fan X-ray beam; wherein the pencil beam radiation source and the fan beam radiation source are operated independently.

X-ray analysis apparatus and x-ray generation unit
11467107 · 2022-10-11 · ·

The X-ray analysis apparatus contains an X-ray generation unit. The X-ray generation unit includes a target plate having a target that is irradiated with an electron beam from an electron beam source and generates X-rays, X-ray convergence optics that converges X-rays generated from the target in conjunction with a movement of the target plate, and a driving unit that changes a position of the target plate or the X-ray convergence optics relative to the electron beam source.

Sample inspection system

There is presented an apparatus for identifying a sample. Such an apparatus may be used to detect unwanted items as part of a security screening system. The apparatus includes a platform for receiving the sample, at least one electromagnetic radiation emitter, a plurality of detectors and a calculator. The electromagnetic radiation emitter is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell. The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter includes a lattice spacing of the sample.

Serial Moire scanning phase contrast x-ray imaging

Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.

X-ray fluoresence apparatus for a measurement of mineral slurries
11644431 · 2023-05-09 · ·

Disclosed is a measurement probe for a measurement of elements in a mineral slurry. The measurement probe includes a housing having an X-ray window. The housing encloses: an X ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control an operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine a quantity of one or more elements of interest in the mineral slurry. The measurement probe further includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.

X-RAY DIFFRACTOMETER
20170363550 · 2017-12-21 · ·

An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of the angles about a center point of goniometer circles, the X-ray diffractometer having a pinhole member provided with a pinhole, the pinhole allowing X-rays diffracted from the sample to pass so that the diffracted X-rays pass through the center point of the goniometer circle, and other diffracted X-rays are shielded by the pinhole member.

X-ray imaging apparatus and method
11681068 · 2023-06-20 · ·

An x-ray imaging apparatus includes an x-ray source module configured to output source x-rays, a pencil-beam-forming module having input and output ports, and a module engagement interface that enables a user to select aligned and non-aligned configurations of the source and pencil-beam-forming modules. In the aligned configuration, the pencil-beam-forming module is aligned with the source module to receive source x-rays at the input port and to output a scanning pencil beam through the output port toward a target. In the non-aligned configuration, the pencil-beam-forming module is not aligned with the x-ray source module to receive the source x-rays nor to output the pencil beam, but instead enables the source x-rays to form a stationary, wide-area beam directed toward the target. Example embodiments can be handheld, can enable both backscatter imaging and high-resolution transmission imaging using the same apparatus, and can be employed in finding and disarming explosive devices.