Provided is an X-ray analysis apparatus including: a goniometer including an incident-side arm extending in a first direction, a fixing portion, and a receiving-side arm; an X-ray source portion, which is arranged on the incident-side arm and generates an X-ray source extending in a second direction, which crosses the first direction; a support base, which is arranged on the fixing portion, and is configured to support a sample; a parallel slit, which is arranged on the fixing portion, and is configured to limit a line width along the second direction of the X-ray source generated by the X-ray source portion; and a detector, which is arranged on the receiving-side arm, and is configured to detect a scattered X-ray generated by the sample.

A neutron imaging system that includes a central neutron source configured to produce source neutrons, wherein the central neutron source comprises a beam target, a moderator chamber surrounding at least a portion of the beam target, the moderator chamber housing a moderator, and a re-entrant cone extending into the moderator chamber. The re-entrant cone includes an entrance surface facing the beam target. The entrance surface encloses a cone chamber, isolating the cone chamber from the moderator. Furthermore, the entrance surface is shaped such that source neutrons produced at the beam target impinge the entrance surface with a neutron flux that varies by 10% or less along the entrance surface.

A device adapted for examining and detecting foreign objects in a flat plate-shaped material comprises a transport device for transporting a flat plate-shaped material to be examined through the device in a transport direction. The device comprising a first X-ray source and a second X-ray source adapted for, in operation, emitting a first X-ray beam and a second X-ray beam. The device comprising a first sensor unit and a second sensor unit arranged to detect the first and second X-ray beam. The first and second sensor unit being adapted for detecting data indicative of the presence and the indirect or direct position in the transport direction of a foreign object in a flat plate-shaped material. The first and second sensor unit comprise or are connected to a data processing unit adapted for processing the detected data to determine the presence of a foreign object in the flat plate-shaped material.

The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

A diffraction analysis device and a method for a full-field X-ray fluorescence imaging analysis are disclosed. The device includes a switching assembly, collimation assemblies, an X-ray source, an X-ray detector, a laser indicator, and a computer control system. The switching assembly combines with the collimation assemblies to achieve a functional effect that is previously achieved by two different types of devices through only one device by changing the positioning layout of the X-ray source and the X-ray detector. The full-field X-ray fluorescence imaging analysis can be realized, and the crystal phase composition information and the element distribution imaging information of the sample can be quickly obtained through the same device without scanning, which not only greatly improves the utilization rate of each assembly in the device, reduces the assemblies cost of the device, makes the device structure more compact, but also greatly improves the analysis efficiency and detection accuracy.

A neutron imaging system that includes a central neutron source configured to produce source neutrons, wherein the central neutron source comprises a beam target, a moderator chamber surrounding at least a portion of the beam target, the moderator chamber housing a moderator, and a re-entrant cone extending into the moderator chamber. The re-entrant cone includes an entrance surface facing the beam target. The entrance surface encloses a cone chamber, isolating the cone chamber from the moderator. Furthermore, the entrance surface is shaped such that source neutrons produced at the beam target impinge the entrance surface with a neutron flux that varies by 10% or less along the entrance surface.

A neutron emission unit is configured to emit neutrons such that a center axis (Nh) of a neutron emission intersects a center axis direction of collimators (23a to 23e). A calculation unit is capable of generating information about an inspection object in the center axis direction of the collimators, based on position information of a neutron detector and/or position information of the neutron emission unit, information about an angle (θ1) at which the center axis of the neutron emission intersects the center axis direction of the collimators, and a neutron amount detected by the neutron detector.

A method includes acquiring a first dataset of projection measurements at a first energy spectrum and a second dataset of projection measurements at a second energy spectrum different from the first energy spectrum by switching between acquiring the first dataset for a set number of consecutive views at different projection angles at the first energy spectrum and acquiring the second dataset for the set number of consecutive views at different projection angles at the second energy spectrum. The set number of consecutive views is greater than one. The method includes supplementing both the first dataset with estimated projection measurements at the first energy spectrum and the second dataset with estimated projection measurements at the second energy spectrum to provide missing projection measurements at different projection angles not acquired during the imaging scan for the first dataset and the second dataset.

A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.

A material characterization system and method for characterizing a stream of material emanating from a material identification, exploration, extraction or processing activity, the system including a source of incident radiation configured to irradiate the stream of material in an irradiation region, one or more detectors adapted to detect radiation emanating from within or passing through the stream of material as a result of the irradiation by the incident radiation and thereby produce a detection signal, and one or more digital processors configured to process the detection signal to characterise the stream of material, wherein the source of incident radiation and the one or more detectors are adapted to be disposed relative to the stream of material so as to irradiate the stream of material and detect the radiation emanating from within or passing through the stream as the stream passes through the irradiation region.