Patent classifications
G01N2223/316
Collimator assembly and ray detection apparatus
The disclosure provides a collimator assembly, comprising at least at least two collimators configured to be moveable relative to each other such that the collimator assembly is switchable between at least two collimation modes; in respective collimation modes, the at least two collimators are superposed with each other in a thickness direction of the collimator assembly, such that the collimator assembly presents different combined patterns for collimating and shielding rays incident onto the collimator assembly and that the collimator assembly has corresponding ray shielding thickness for effectively shielding rays.
SCATTER CORRECTION FOR COMPUTED TOMOGRAPHY IMAGING
Systems and methods for scatter correction of x-ray images are provided. A scatter image of an object can be corrected using partial-scatter free images acquired using an aperture plate. The plate is positioned between an object and a radiation detector and includes apertures in a grid. The original x-rays pass through the apertures and scattered x-rays can be blocked by the aperture plate. The aperture plate can be moved to different positions, allowing partial scatter-free images to be acquired at each position of the aperture plate. A full scatter-free image can be generated by combining partial scatter-free images. The scatter and scatter-free images can be further used to train scatter correction models.
SCATTER CORRECTION FOR COMPUTED TOMOGRAPHY IMAGING
Systems and methods for scatter correction of x-ray images are provided. A scatter image of an object can be corrected using partial-scatter free images acquired using an aperture plate. The plate is positioned between an object and a radiation detector and includes apertures in a grid. The original x-rays pass through the apertures and scattered x-rays can be blocked by the aperture plate. The aperture plate can be moved to different positions, allowing partial scatter-free images to be acquired at each position of the aperture plate. A full scatter-free image can be generated by combining partial scatter-free images. The scatter and scatter-free images can be further used to train scatter correction models.
RADIOGRAPHIC IMAGING APPARATUS
There is provided a radiographic imaging apparatus capable of alignment of a detector with a collimator with a position of a radiation source fixed. The radiographic imaging apparatus includes the radiation source which irradiates a subject with radioactive rays, a plurality of detecting elements which detect photons in the radioactive rays, and a collimator which is disposed between the radiation source and the detecting elements and has a plurality of walls which form a plurality of passing holes that the radioactive rays pass. The detecting element and the collimator are aligned with each other in a direction which is orthogonal to a direction that the subject is irradiated with the radioactive rays such that a ratio or a difference between output signals from the detecting elements which are mutually adjacent with the wall being interposed falls within a predetermined range.
Methods and Means for the Measurement of Tubing, Casing, Perforation and Sand-Screen Imaging Using Backscattered X-Ray Radiation in a Wellbore Environment
An x-ray-based cased wellbore tubing and casing imaging tool is disclosed, the tool including at least a shield to define the output form of the produced x-rays; a two-dimensional per-pixel collimated imaging detector array; a parallel hole collimator format in one direction that is formed as a pinhole in another direction; Sonde-dependent electronics; and a plurality of tool logic electronics and PSUs. A method of using an x-ray-based cased wellbore tubing and casing imaging tool is also disclosed, the method including at least: producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from materials surrounding a wellbore; determining an inner and an outer diameter of tubing or casing from the backscatter x-rays; and converting image data from said detectors into consolidated images of the tubing or casing.
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
A nondestructive inspecting device (10) includes a neutron emission device (2) that emits a neutron beam to a local irradiation location on a surface (la) of an inspection target (1), a detection device (3) that detects, at each of inspection positions facing the surface (la), scattered neutrons returned from the inspection target (1) as a result of emission of the neutron beam to the irradiation location, and measures the detected number of the scattered neutrons at each of the detection positions, and a ratio calculation unit (5) that calculates, for each of the detection positions, a ratio of the detected number at the detection position to a reference value for the detection position, and outputs the ratios. The reference value is set as the detected number at each of the detection positions in an assumed case of no defects existing in the inspection target (1).
APPARATUS FOR THE MEASUREMENT OF MINERAL SLURRIES
Disclosed is a measurement probe for measurement of elements in a mineral slurry. The probe includes a housing having an X-ray window. The housing encloses: an X-ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine the quantity of one or more elements of interest in the mineral slurry. The measurement probe includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF PARTS
Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.
A SAMPLE INSPECTION SYSTEM
There is presented an apparatus for identifying a sample. Such an apparatus may be used to detect unwanted items as part of a security screening system. The apparatus includes a platform for receiving the sample, at least one electromagnetic radiation emitter, a plurality of detectors and a calculator. The electromagnetic radiation emitter is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell. The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter includes a lattice spacing of the sample.
COMBINED SCANNING X-RAY GENERATOR, COMPOSITE INSPECTION APPARATUS, AND INSPECTION METHOD
Embodiments of the present disclosure disclose a combined scanning X-ray generator, a composite inspection apparatus and an inspection method. The combined scanning X-ray generator includes: a housing; an anode arranged in the housing, the anode including a first end of the anode and a second end of the anode opposite the first end of the anode; a pencil beam radiation source arranged at the first end of the anode and configured to emit a pencil X-ray beam; and a fan beam radiation source arranged at the second end of the anode and configured to emit a fan X-ray beam; wherein the pencil beam radiation source and the fan beam radiation source are operated independently.