An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to an inspection target surface of the inspection target object, an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X ray generation portion and totally reflected by the inspection target surface, and an adjustment mechanism configured to adjust a relative position between the inspection target surface and the X-ray detector.

An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy includes an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by the product sample and generating a signal received that can be analysed to determine a chemical composition of the product sample and selecting a type of product corresponding to said chemical composition of the product sample. The apparatus includes a first vacuum chamber located between an output of the apparatus facing the product sample and the X-ray source, and a second vacuum chamber located between the output of the apparatus facing the product sample and the detector. The apparatus also includes an optical module with polycapillary lens located downstream of the X-ray source, which is configured for focusing the X-ray beam and is associated in a vacuum-tight way to the first vacuum chamber.

A method for imaging a sample by means of an X-ray detector is disclosed, including providing an electron beam interacting with a target to generate X-ray radiation emitted from an X-ray spot on the target, moving the sample relative to the target, deflecting the electron beam such that the X-ray spot is moved over the target simultaneously and in accordance with the movement of the sample, and detecting X-ray radiation emitted from the X-ray spot and interacting with the sample.

The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.

Systems and methods inspect a fastener installed at least partially through a hole in a part, by measuring fastener concentricity, measuring fastener flushness with a surface, and/or detecting foreign object debris near the fastener. Systems include an x-ray imaging system, a first camera device, a second camera device, a first support structure, and at least one processing unit. The first camera device produces a first image of the fastener from a first vantage point, and the second camera device produces a second image of the fastener from a second vantage point, such that a 3D image of the fastener can be created from the first image and the second image. The system inspects the fastener based on the x-ray image and/or the 3D image, to determine concentricity and/or flushness of the fastener. Systems may be automated and mounted on robot arms to be positioned relative to the fasteners being inspected.

A redundant positioning table device with six or fewer degrees of freedom having four modular legs extended from a base to a table, each legs being with three levels and the same types of joints. In one embodiment, the bottom joint is planar and active, the middle joint is prismatic and passive, and the top joint is spherical and passive. In another embodiment, the bottom joint is prismatic and passive, the middle joint is planar and active, and the top joint is spherical and passive. Fewer than six degrees of freedom is achieved by reducing the number of degrees of freedom of designated joints.

A sequential X-ray fluorescence spectrometer according to the present invention includes a total analysis time display unit configured to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component. The total analysis time display unit is further configured to calculate, for each component, a counting time which gives a specified analytical precision by using the standard value and the measured intensity and to calculate a total counting time as a sum of the counting times of respective components. The total analysis time display unit is configured to calculate a total analysis time as a sum of the total counting time and a total non-counting time and to output the calculated total analysis time and the calculated counting times of the respective components.

The disclosure provides a collimator assembly, comprising at least at least two collimators configured to be moveable relative to each other such that the collimator assembly is switchable between at least two collimation modes; in respective collimation modes, the at least two collimators are superposed with each other in a thickness direction of the collimator assembly, such that the collimator assembly presents different combined patterns for collimating and shielding rays incident onto the collimator assembly and that the collimator assembly has corresponding ray shielding thickness for effectively shielding rays.

A system for imaging includes an X-ray source for transmitting X-rays through a subject and a measurement sensor to acquire measurement data related to the subject. A detector is provided in the system to receive the X-ray energy of the X-rays after having passed through the subject. The system further includes a controller that receives the measurement data from the measurement sensor and processes the measurement data using an image processing algorithm to determine varying thickness of the subject at a plurality of locations within an area of interest. The controller further positions a filter between the X-ray source and the subject based on varying thickness of the subject and generates the image of the subject based on the detected X-ray energy at the X-ray detector.