An X-ray diffraction measurement method includes an arranging step of arranging a shielding plate and a two-dimensional detector on an outgoing optical axis, and a calculating step of calculating a diffraction profile indicating an X-ray intensity with respect to a diffraction angle of the object to be measured, on the basis of a two-dimensional X-ray image detected by the two-dimensional detector. In the arranging step, the shielding plate is arranged in a manner so that the slit is inclined at least in a direction about the outgoing optical axis with respect to an orthogonal direction which is orthogonal to both the incident optical axis and the outgoing optical axis.

An X-ray imaging apparatus capable of covering outer peripheral portions of a fixed supporting column and a moving supporting column by a cover even when an SID is set to be large in a configuration in which an imaging system is rotated about an axis extending in a horizontal direction. The supporting column mechanism 17 is provided with a fixed supporting column 34, a moving supporting column 35 movable relative to the fixed supporting column 34, and a moving mechanism for moving the moving supporting column 35. A fixed cover 33 is arranged at the outer peripheral portion of the fixed supporting column 34. Further, at the outer peripheral portion of the moving supporting column 35, a moving cover 31 which moves together with the moving supporting column 35 is arranged. An intermediate cover 32 movable in the same direction as the moving cover 31 is arranged between the fixed cover 33 and the moving cover 31. Between the fixed supporting column 34 and the moving cover 31, a constant force spring 41 as an energizing member for energizing the intermediate cover 32 to the side of the fixed cover 33 is arranged.

The present disclosure discloses a radiation inspection system and a radiation inspection method. The radiation inspection system comprises a radiation source and a beam modulating device. The beam modulating device comprises a first collimating structure disposed at a beam exit side of the radiation source and a second collimating structure disposed at a beam exit side of the first collimating structure. The second collimating structure is movable relative to the first collimating structure to change a relative position of the first collimating port of the first collimating structure with the second collimating port of the second collimating structure, and the beam modulating device is shifted between a first operational state in which the beam modulating device modulates an initial beam into a fan beam, and a second operational state in which the beam modulating device modulates the initial beam into a pencil beam variable in position.

A human body security inspection apparatus, a method of operating the same, and an associated filter device are disclosed. The human body security inspection apparatus includes a radiation beam exit configured for emitting a radiation beam; a beam guiding box configured for guiding the radiation beam; and a filter device configured between the radiation beam exit and the beam guiding box. The filter device includes a housing and a filter cage having a central axis. The filter cage is formed by arranging two or more pairs of filtering sheets, which are made of different materials and/or have different thicknesses, in an encircling way. The filter cage is rotatable about its central axis such that at least one pair of filtering sheets is capable of filtering the radiation beam to adjust an outputted dosage of the radiation beam of the human body security inspection apparatus.

An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

An X-ray phase imaging apparatus includes an X-ray source; a detector; a plurality of gratings; a rotation mechanism; an image processor configured to generate a phase contrast image and to generate a preview image prior to capture of the phase contrast image; and a controller configured to control function of displaying on a display the preview image, and function of discriminatively displaying on the display an image coverage area for the phase contrast image that is associated with a relative rotation angle between the plurality of gratings and a subject.

The radiation detection device includes: a sample holding unit; an optical microscope configured to observe a sample held by the sample holding unit; an irradiation unit that irradiates the sample with radiation; a detection unit that detects radiation generated from the sample; an adjustment unit that adjusts a relationship between a focal position of the optical microscope and a position of the sample such that the optical microscope is focused on one portion of the sample; a change unit that changes a position, on which the optical microscope is to be focused, on the sample; an imaging unit that creates a partial image captured by the optical microscope at the changed position on the sample in a state in which the adjustment unit performs adjustment for focusing; and a sample image creation unit that creates a sample image by combining a plurality of partial images created by the imaging unit.

A system for inspecting an object, includes: a source of X-ray radiation; a horizontal array of detectors, wherein the source and the array of detectors are positioned substantially on a first plane; a platform configured to rotate as well as translate in a vertical trajectory, wherein the platform is positioned on a second plane between the source and the array of detectors, and wherein the object is disposed on the platform; and a computing device configured to: cause the source to fire a substantially horizontal fan beam in a third plane, wherein the third plane is above a top of the object; acquire calibration data from the array of detectors while the third plane is above the top of the object; cause the platform to simultaneously rotate and raise the object vertically upwards; acquire scan data of the object; and generate a three dimensional scan image of the object.

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface.

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector has an energy resolution not less than 1 keV or the X-ray detector has no energy analysis function.