An image processing apparatus comprises a processing unit configured to performing energy subtraction processing using information concerning a plurality of attenuation rates corresponding to a plurality of radiation energies that are different from each other and are obtained by performing imaging in which an object is irradiated with radiation. The processing unit estimates attenuation information of a decomposition target material contained in the object using at least one image obtained by the energy subtraction processing, and generates an image concerning the decomposition target material using the attenuation information and the information concerning the plurality of attenuation rates.

Regarding to a fiber-reinforced material formed by deforming a reinforcing material composed of a plurality of fiber layers from an initial shape and molding into a predetermined shape, an identification device, an identification method, and an identification program generate a first data in which a physical quantity distribution inside the fiber-reinforced material is mapped to the initial shape, perform binarization of the first data to generate a second data in which a label identifying the fiber layer is mapped to the initial shape, and map the second data to a predetermined shape, based on a deformation data.

This disclosure presents systems and processes to collect elemental composition of target fluid and solid material located downhole of a borehole. Waveguides can be utilized that include capillary optics to deliver emitted high energy into a container or a conduit and then to detect the high energy. A source waveguide can be used to emit the high energy into the target fluid and a detector waveguide can collect resulting measurements. Each waveguide can include a protective sheath and a pressure cap on the end of the capillary optics that are proximate the target fluid, to protect against abrasion and target fluid pressure. In other aspects, a pulsed neutron tool can be utilized in place of the waveguides to collect measurements. The collected measurements can be utilized to generate chemical signature results that can be utilized to determine the elemental composition of the target fluid or of the solid material.

A method generates a crystalline orientation map of a surface portion of a sample. A crystalline orientation map represents crystalline orientations at a plurality of sample locations of the surface portion. The method comprises recording an image of the surface portion including a central location using particles of a charged particle beam directed to the surface portion and backscattering from the surface portion for each of a plurality of different orientation settings. Each of the orientation settings is defined by an azimuthal angle and an elevation angle under which the charged particle beam is incident onto the central location during the recording of the respective image. The method also includes generating the crystalline orientation map based on the recorded images.

The disclosure provides methods and systems for identifying materials using charged particle beam systems combined with x-ray spectroscopy systems.

A surface analyzer is provided with a measuring unit, a scatter diagram generation unit, a cluster analysis unit, and a cluster region detection unit. The measuring unit acquires a signal reflecting a quantity of each of a plurality of components or elements that are analysis targets at a plurality of positions on a sample. The scatter diagram generation unit generates a scatter diagram based on a measurement result by the measuring unit. The cluster analysis unit performs the clustering of points in the scatter diagram. The cluster region detection unit acquires, based on clustering information given to each point in the scatter diagram by the cluster analysis unit, for each cluster, cluster region boundary information on a polygon having a predetermined number or less of vertices.

In an analyzer, an image processing unit performs processing of: dividing a measurement image into a plurality of partial measurement images, and dividing a reference image into a plurality of partial reference images; calculating a positional deviation amount of each of the partial measurement images relative to a corresponding partial reference image among the partial reference images; determining whether the positional deviation amount is a threshold or less; and correcting positional deviation of the measurement image based on the positional deviation amounts of the plurality of partial measurement images when the image processing unit has determined that the positional deviation amount is not the threshold or less.

A photon counting X-ray CT apparatus according to an embodiment includes: data acquiring circuitry, and processing circuitry. The data acquiring circuitry is configured to allocate energy measured by signals output from a photon counting detector in response to incidence of X-ray photons to any of a plurality of first energy bins so as to acquire a first data group as count data of each of the first energy bins. The processing circuitry is configured to determine a plurality of second energy bins obtained by grouping the first energy bins in accordance with a decomposition target material that is a material to be decomposed in a imaging region, allocate the first data group to any of the second energy bins so as to generate a second data group, and use the second data group to generate an image representing a distribution of the decomposition target material.

A detector module for use in an apparatus for analysing a specimen is provided. The detector module comprises a plurality of X-ray sensor elements and one or more electron sensor elements, and is adapted to be positioned below a polepiece of an electron beam assembly of the apparatus from which an electron beam generated by the assembly emerges towards a specimen in use, such that the detector module receives X-rays and backscattered electrons generated by interaction between the electron beam and the specimen. Each of the plurality of X-ray sensor elements is configured to monitor energies of individual received X-ray photons, and the plurality of X-ray sensor elements have a total active area greater than 20 mm.sup.2. The radial extent of the detector module with respect to the electron beam axis in use is less than 10 mm for at least a first portion of the detector module. An apparatus and method for analysing a specimen are also provided.

The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample, and scanning said charged particle beam over at least part of said sample. A first detector is used for obtaining measured detector signals corresponding to emissions of a first type from the sample at a plurality of sample positions. According to the method, a set of data class elements is provided, wherein each data class element relates an expected detector signal to a corresponding sample information value. The measured detector signals are processed, and processing comprises comparing said measured detector signals to said set of data class elements; determining at least one probability that said measured detector signals belong to a certain one of said set of data class elements; and assigning at least one sample information value and said at least one probability to each of the plurality of sample positions. Finally, sample information values and corresponding probability can be represented in data.