Patent classifications
G01N2223/405
Method and system utilizing imaging analysis for golf balls
A method and system for determining concentricity of a multiple layer golf ball are disclosed herein. One or more images of a golf ball are generated using an X-ray source, a camera or a digital detector, and an image intensifier. An edge detection algorithm is preferably utilized. The method also includes calculating Y,Z center coordinates of the a best fit diameter or ellipse of the inner edge layer and outer edge layer of the multiple layer golf ball.
Shape measuring apparatus and shape measuring method
In one embodiment, a shape measuring apparatus includes a memory to store, as information regarding a pattern provided in a sample, two-dimensional information regarding a plane parallel with a surface of the sample, and an irradiation module to irradiate the surface of the sample with a beam. The apparatus further includes an irradiation controller to control an irradiation direction of the beam to the sample in accordance with the two-dimensional information, and an acquisition module to acquire scattering intensity data regarding the beam reflected by the surface of the sample. The apparatus further includes a calculator to calculate predicted scattering intensity data regarding the beam in accordance with a shape model that represents a three-dimensional shape of the pattern with a parameter, and a measurement module to measure the three-dimensional shape by adjusting the parameter and fitting the scattering intensity data and the predicted scattering intensity data.
Techniques for Using Oxide Thickness Measurements for Predicting Crack Formation and Growth History in High-Temperature Metallic Components
A method and system to develop the age and history of a crack by exposing a specimen or component to varying predetermined temperature range that covers the designated service temperatures and measuring the thickness of the oxide across the specimen along the thickness direction.
Multimodality mineralogy segmentation system and method
A multimodality imaging system and method for mineralogy segmentation is disclosed. Image datasets of the sample are generated for one or more modalities, including x-ray and focused ion beam scanning electron microscope (FIB-SEM) modalities. Mineral maps are then created using Energy Dispersive X-ray spectroscopy (EDX) from at least part of the sample covered by the image datasets. The EDX mineral maps are applied as a mask to the image datasets to identify and label regions of minerals within the sample. Feature vectors are then extracted from the labeled regions via feature generators such as Gabor filters. Finally, machine learning training and classification algorithms such as Random Forest are applied to the extracted feature vectors to construct a segmented image representation of the sample that classifies the minerals within the sample.
METHODS AND APPARATUS FOR DETERMINING INFORMATION REGARDING CHEMICAL COMPOSITION USING X-RAY RADIATION
According to some aspects, a method is provided comprising generating first monochromatic x-ray radiation at a first energy, directing at least some of the first monochromatic x-ray radiation to irradiate subject matter of interest, detecting at least some of the first monochromatic x-ray radiation transmitted through the subject matter of interest, and determining information about a chemical composition of the subject matter of interest based, at least in part, on the detected first monochromatic x-ray radiation and the first energy.
Method for mapping crystal orientations in a sample made of a polycrystalline material
The invention relates to a method for mapping the crystal orientations of a polycrystalline material, the method comprising: receiving (21) a series of images of the polycrystalline material, which images are acquired by an acquiring device in respective irradiation geometries; estimating (22) at least one intensity profile for at least one point of the material from the series of images, each intensity profile representing the intensity associated with the point in question as a function of irradiation geometry; and determining (24) a crystal orientation for each point in question of the material by comparing (23) the intensity profile associated with said point in question to theoretical signatures of intensity profiles of known crystal orientations, which signatures are contained in a database.
Ultralow-dose, feedback imaging with laser-Compton X-ray and laser-Compton gamma ray sources
Ultralow-dose, x-ray or gamma-ray imaging is based on fast, electronic control of the output of a laser-Compton x-ray or gamma-ray source (LCXS or LCGS). X-ray or gamma-ray shadowgraphs are constructed one (or a few) pixel(s) at a time by monitoring the LCXS or LCGS beam energy required at each pixel of the object to achieve a threshold level of detectability at the detector. An example provides that once the threshold for detection is reached, an electronic or optical signal is sent to the LCXS/LCGS that enables a fast optical switch that diverts, either in space or time the laser pulses used to create Compton photons. In this way, one prevents the object from being exposed to any further Compton x-rays or gamma-rays until either the laser-Compton beam or the object are moved so that a new pixel location may be illumination.
Method and apparatus pertaining to non-invasive identification of materials
A control circuit having access to information regarding a plurality of models for different materials along with feasibility criteria processes imaging information for an object (as provided, for example, by a non-invasive imaging apparatus) to facilitate identifying the materials as comprise that object by using the plurality of models to identify candidate materials for portions of the imaging information and then using the feasibility criteria to reduce the candidate materials by avoiding at least one of unlikely materials and combinations of materials to thereby yield useful material-identification information.
Spectrum Processing Device, Specimen Analyzing Device, and Spectrum Processing Method
A spectrum processing device includes a data acquiring unit configured to acquire, for each of pixels expressing positions on a specimen, spectrum imaging data in which a pixel spectrum based on a signal from the specimen is stored; an extraction unit configured to compare, for each of the pixels, the pixel spectrum and a representative spectrum selected from the spectrum imaging data, and extract a plurality of the pixel spectra from the spectrum imaging data, based on a comparison result; and a spectrum generating unit configured to generate a phase spectrum, based on the plurality of the extracted pixel spectra.
Magnetic measurement system and apparatus utilizing X-ray to measure comparatively thick magnetic materials
A magnetic measurement system includes an X-ray source, a monochromator that converts right- and left-polarization X-ray into right- and left-monochromatic X-ray, an aperture slit that allows the right- and left-monochromatic X-ray to pass through, an analytical section, and piezoelectric scanning devices. The analytical section has a Fresnel zone plate that receives and focuses the right- and left-monochromatic X-ray on a single point being 10 nm or less wide of a magnetic sample, an order-sorting aperture that allows the focused X-ray to selectively pass through, a sample-stage that sets a comparatively thick magnetic sample that is more than 150 nm thick and less than or equal to 1000 nm thick to be irradiated with the X-ray, and an X-ray-detector that detects transmittance of transmission X-ray passing through the comparatively thick sample and that generates X-ray magnetic circular dichroism (XMCD) data by directly measuring the detected transmittance of the transmission X-ray.