Patent classifications
G01N2223/405
MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING
In a computer-implemented method for material decomposition in dual-energy X-ray imaging, a first X-ray image dataset corresponding to a first X-ray energy spectrum, and a second X-ray image dataset corresponding to a second X-ray energy spectrum are obtained. At least one material-specific image dataset is generated by applying a decomposition module that contains a first sequence of processing steps or machine learning function to input data that depends on the first X-ray image dataset and the second X-ray image dataset. Before applying the decomposition module, a filter module and/or an artifact-reduction module is applied to the input data.
Electron spectroscopy based techniques for determining various chemical and electrical characteristics of samples
A measurement system and method are presented for measuring one or more parameters of a sample. The measurement system comprises an excitation system and a detection system. The excitation system is configured to generate combined exciting radiation comprising one- or multi-parameter modulation of multiple exciting signals of different types to be applied to at least a portion of a sample under measurements to thereby induce electron emission response of said at least portion of the sample to said combined exciting radiation. The detection system is configured for detecting the electron emission response of the at least portion of the sample and generating measured data indicative of a modulated change of an electrical state of the at least portion of the sample, thereby enabling determination of one or more parameters of the sample from the measured data.
Dynamic spectral acquisition for material studies
Method for determining properties of a sample and a charged particle system for implementing the method are disclosed. The method includes providing at least one image of the sample based on first emissions from a plurality of first scan locations; determining at least one or a plurality of second scan location(s) for at least one or a plurality of region(s) of the at least one image; detecting second emissions from at least one of the second scan locations of at least one of the regions; and adjusting a second dwell period with respect to an average segmentation dwell period.
SYSTEMS AND METHODS FOR DETERMINING COMPONENT PREDICTED LIFESPAN
Systems and methods for determining component predicted lifespan are provided. A method includes processing, by a computing system comprising one or more processors, an image of the component to detect a grain structure on the component. The method further includes comparing, by the computing system, the detected grain structure with a stress map of the component. The method further includes determining, by the computing system, based on a localization of the detected grain structure and the stress map, a predicted lifespan of the component.
Work function measurements for surface analysis
A measurement system includes: an excitation system; a detector; and a control unit. The excitation system includes excitation sources generating excitations of different types comprising: a high energy electromagnetic radiation source; at least one electric power supply providing a bias voltage to a sample; and at least one electron beam source generating relatively low energy e-radiation in the form of an electron beam. The excitation system includes first and second sequentially performed measurement modes, for respectively, exciting the sample by the high energy radiation to induce a first-mode secondary electron emission spectral response, and supplying initial bias voltage to the sample and exciting the sample with the e-radiation followed by a gradual variation of the bias voltage from said initial bias voltage to induce a second-mode electric current variations in the sample. The detector detects said first-mode secondary electron emission spectral response and generates first-mode measured data, and monitors the electric current through the sample and generates second-mode measured data indicative of sample current readout.
Phase analyzer, sample analyzer, and analysis method
A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a candidate determination unit that performs multivariate analysis on the spectrum imaging data to determine candidates for the number of phases; a phase analysis unit that creates, for each of the candidates, a phase map group including a number of phase maps corresponding to the number of phases; and a display control unit that causes a display unit to display, for each of the candidates, the phase map group.
Phase analyzer, sample analyzer, and analysis method
A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a phase analysis unit that performs phase analysis based on the spectrum imaging data; a display control unit that displays results of the phase analysis on a first screen; and a condition reception unit that receives an operation for changing a condition for the phase analysis, when the condition reception unit has received the operation for changing the condition, the phase analysis unit performing phase analysis under the changed condition, the display control unit displaying on a second screen the results of the phase analysis performed under the changed condition and when a predetermined operation has been performed, the display control unit reflecting on the first screen the results of the phase analysis displayed on the second screen.
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
An X-ray computed tomography (CT) scanner includes a plurality of X-Ray sources and detectors mounted about an opening where scanning takes place. The X-Ray sources and detectors are arranged to oscillate back and forth in opposing first and second rotational directions about the opening, or in the same rotational direction about the opening, in order to generate a cross-sectional image of an object located within the opening.
GENERATION OF FUSED ENVIRONMENTAL AND COMPOSITIONAL INFORMATION
A compositional visualization system comprises a sensor to collect contextual information, a particle generator to generate a first stream of one or more types of particles, and a detector to receive a second stream of one or more detectable products. The second stream is generated by interaction of the first stream with the environment. The system further comprises computer-executable instructions to cause the system to transform the received second stream into compositional data, and merge the compositional data with the contextual information to generate a merged digital representation. The merged digital representation can be displayed at one or more devices and can also be used directly to drive autonomous robotic systems.