A system and method can determine one or more CT scanner calibration parameters from a plurality of calibration object projections in a plurality of radiographs.

6Examples described herein provide a method that includes obtaining, by a processing device, three-dimensional (3D) voxel data. The method further includes performing, by the processing device, gray value thresholding based at least in part on the 3D voxel data and assigning a classification value to at least one voxel of the 3D voxel data. The method further includes defining, by the processing device, segments based on the classification value. The method further includes filtering, by the processing device, the segments based on the classification value. The method further includes evaluating, by the processing device, the segments to identify a surface voxel per segment. The method further includes determining, by the processing device, a position of a surface point within the surface voxel.

Scatter correction for tomography: for each position, two images are acquired, a first image without and a second image with a scatter reducing aperture plate (50). A scatter image is calculated by subtracting the second image from the first image. The apertures (48) in the scatter reducing plate (50) are arranged hexagonally in order to optimise the packaging density of the apertures.

A method for determining porosity of a part is provided. The method includes: determining scan data of the part, the scan data including data of a plurality of sequential segments; determining a background model for the part, the scan data, or both; and determining a bulk porosity based on a difference between the scan data and the background model.

Disclosed is a real-time nondestructive observation and two-phase seepage test system for a fracture of an in-situ fractured gas-bearing reservoir, which comprises a stress loading system, a high-voltage electric pulse fracturing operation system, a water-gas two-phase seepage system and an in-situ CT scanning system; the stress loading system comprises a pressure chamber, an axial pressure loading module and a confining pressure loading module; the high-voltage electric pulse fracturing operation system comprises a high-voltage electric pulse generation module, a high-voltage electric pulse signal monitoring module and a protection module; the water-gas two-phase seepage system comprises a water-gas pressure loading module and a flow data acquisition module; and the in-situ CT scanning system comprises a radiation source, a flat panel detector and a CT scanning detection mechanism.

An apparatus for analyzing a core sample obtained from a subterranean formation includes a neutron generator, a plurality of detectors, a computed tomography scanner, an information processing device, and a transport system. The neutron generator can operate in a pulsed mode and emit neutrons into the core sample.

In accordance with the invention, an X-ray amplitude analyzer grating adapted for use in an interferometric imaging system, the interferometric imaging system comprising an X-ray source and an X-ray detector with an X-ray fringe plane between the X-ray source and the X-ray detector, wherein an X-ray fringe pattern is formed at the X-ray fringe plane, wherein the X-ray amplitude analyzer grating is provided. The X-ray amplitude analyzer grating comprises a plurality of grating pixels across two dimensions of the X-ray amplitude analyzer grating, wherein each grating pixels of the plurality of grating pixels has a different pattern with respect to all adjacent grating pixels to the grating pixel so that all adjacent grating pixels do not have a same pattern as the grating pixel.

CT scanner comprising a scanning conveyor (9) mounted on a supporting structure and configured to move an object (3) for CT examination forward through a scanning area (8), an input conveyor (10) configured to convey the object until the scanning chamber (2), and an output conveyor (11) configured to convey an object (3) out of the scanning chamber (2), wherein the input conveyor (10), the scanning conveyor (9) and the output conveyor (11) are configured to move forward the object (3) placed on a supporting unit (19) mechanically detached therefore, and wherein the scanning conveyor (9) is configured to rotate the supporting unit (19) and the object (3) on themselves as they travel through the scanning area (8). The input conveyor (10) and the output conveyor (11) are fitted with shields configured in such a way as to intercept all x-rays emitted from the scanning area (8) which escape from the scanning chamber (2) towards the conveyors.

A method and apparatus for diagnosing and/or calibrating underperforming pixels in detectors in a small pixelated photon counting CT system utilizes a series of tests on image data acquired in-situ as part of a series of calibration scans in the CT system. Tests are performed on the acquired data to determine the existence of underperforming pixels within the detectors such that the information acquired by those pixels can be replaced by alternate data from surrounding pixels (e.g. by interpolation). The underperforming pixels are stored in “bad” pixel tables and may be specific to a type of image (e.g., spectral or counting) and a specific protocol.

Systems and methods for representing internal defects of an object to determine defect detectability using a multi-scan computed tomography (CT) approach are disclosed. A defect-free object may be scanned using a CT machine. In one or more separate scans, phantom defects may be imaged and the resulting projections combined and reconstructed to represent internal defects. The air-normalized intensities of the object and the phantom defect may be used to represent voids and inclusions. Subtraction of materials may be represented by the quotient of the air-normalized intensities thereof, and the addition of materials may be represented by the product of the air-normalized intensities thereof. A void may be represented by subtracting a phantom defect scan from the object scan. An inclusion may be represented by creating a void, scanning an additional phantom defect, and adding the additional phantom defect in the volume created by the void.