The presently-disclosed technology improves the resolution of an x-ray microscope so as to obtain super-resolution x-ray images having resolutions beyond the maximum normal resolution of the x-ray microscope. Furthermore, the disclosed technology provides for the rapid generation of the super-resolution x-ray images and so enables real-time super-resolution x-ray imaging for purposes of defect detection, for example. A method of super-resolution x-ray imaging using a super-resolving patch classifier is provided. In addition, a method of training the super-resolving patch classifier is disclosed. Other embodiments, aspects and features are also disclosed.

Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy. An image acquisition device 1 includes: a first X-ray source 10 that applies X-rays having a first focal point size; a first detector 20 that detects X-rays applied from the first X-ray source 10 and having passed through a measured object O; a first image generation means 30 that generates a first X-ray CT image on the basis of the X-rays detected by the first detector 20; a second X-ray source 40 that applies X-rays having a second focal point size smaller than the first focal point size; a second detector 50 that detects X-rays applied from the second X-ray source and having passed through the measured object O; a second image generation means 60 that generates a second X-ray CT image on the basis of the X-rays detected by the second detector 50; and an image correction means 70 that corrects the first X-ray CT image generated by the first image generation means 30 on the basis of the second X-ray CT image generated by the second image generation means 60.

A book digitization apparatus includes an emitter that applies an energy ray to a book, a detector that detects an energy ray radiated from the book in response to a material existing in the book, and a three-dimensional data generator that generates data of a plurality of space points in accordance with the detected ray. The data of the space points associates position information of a position in a three-dimensional space within the book with a physical property value used to identify a layout pattern of the material at the position in a direction of thickness of the book.

A method includes determining a predicted contrast-to-noise ratio sensitivity function (CNR SF) for crack detection of a predetermined target flaw size with the radiographic inspection system in the selected set-up. The method also includes qualifying an inspection image quality indicator (IQI) for the predetermined target flaw size for use in the radiographic inspection system in the selected set-up. The method also includes performing an inspection process. The inspection process includes selecting the qualified inspection IQI for the predetermined target flaw size. The inspection process also includes performing an inspection test on the qualified inspection IQI using the radiographic inspection system in the selected set-up. The inspection process also includes determining one or more inspection output parameters. The inspection process also includes verifying that the one or more inspection output parameters meet or exceed minimum qualified values to qualify the radiographic inspection system in the selected set-up.

A x-ray micro tomography system provides the ability to proscriptively determine regularization parameters for iterative reconstruction of a sample, from projection data of the sample. This allows a less experienced operator to determine the regularization parameters with adequate precision.

A pattern inspection apparatus includes a sample including a plurality of holes having thicknesses that are different from each other, an electron gun configured to generate an input electron beam and emit the input electron beam onto a wafer and the sample, a stage configured to support the wafer and the sample, a detector configured to generate a scanning electron microscope (SEM) image by detecting emitted electrons from the wafer and the sample, and a processor configured to process the SEM image into a three-dimensional profiling image containing depth information of the wafer and determine whether a condition of the input electron beam has changed based on the processing of the SEM image.

An X-ray imaging device includes a color sensor configured to generate a color signal indicating a particular color sensed, an imaging matrix of pixel detector elements that are each configured to detect photon energy and generate an image signal, and a controller that is coupled to the color sensor, the imaging matrix, and the wireless transceiver. The controller is configured to receive a color signal from the color sensor, determine an identifier of the computing device external to the X-ray imaging device based on the color signal, and change at least one operational setting of the X-ray imaging device based on the identifier.

An image acquisition unit acquires first and second radiographic images acquired by irradiating a first radiation detector and a second radiation detector which overlaps the first radiation detector so as to deviate from the first radiation detector by a half pixel with radiation which has been emitted from a radiation source and transmitted through an object. A corresponding positional relationship acquisition unit acquires a corresponding positional relationship between the position of pixels of the first radiographic image and the position of pixels of the second radiographic image. A resolution enhancement unit estimates a pixel value corresponding to a position between the pixels of the first radiographic image, on the basis of the corresponding positional relationship, a pixel value of the first radiographic image, and a pixel value of the second radiographic image, and generates a processed radiographic image having a higher resolution than the first and second radiographic images.

A method is provided for detecting a movement of a body between acquisition times of at least two acquisition data sets, wherein, for virtual sectional planes of the body, a first intermediate function value of attenuation values of all the body elements lying in the sectional plane is determined based on a first acquisition data set, and a second intermediate function value of the attenuation values is determined based on a second acquisition data set. For each sectional plane, a difference value is determined from the intermediate function values. A total error value for the two acquisition data sets is calculated by combining the difference values of all the sectional planes. The virtual sectional planes have a common line of intersection, and for the particular acquisition time, the difference between pairs of the sectional lines is at least one pixel.

Methods and systems for luggage visualization perform virtual unpacking by visually moving an object image away from its original pose. A scanned 3D volume is segmented guided by a confidence measure to create a label volume whose voxels specify the detected object IDs. The luggage dataset and the label volume are visualized by volume rendering. Using an automatic coloring algorithm, any pair of objects whose projections are adjacent in an image are assigned distinct hues. A layered framework efficiently renders a scene mixed with packed luggage, animated unpacking objects, and already unpacked objects put aside for further inspection. A GPU is used to automatically select objects that are not blocked by others and can be unpacked.