A method of detecting defects on a surface or interface of a part is provided. The method includes: providing data from an X-ray scan of the part; processing the scan data to obtain an original 3D or 2D model of a surface or interface topology of the part; and filtering the original 3D or 2D model of the surface or interface topology to identify deviations from the expected surface or interface topology of the part. The identified deviations may be produced by surface or interface defects on the part.

Disclosed herein is a system and method, which utilize primary beam modulation to enable single-scan dual-energy CT (DECT) on a conventional CT scanner. An attenuation sheet with a spatially-varying pattern is placed between the x-ray source and the imaged object. During the CT scan, the modulator selectively hardens the x-ray beam at specific detector locations. Thus, this method simultaneously acquires high and low energy data at each projection angle. High and low energy CT images can then reconstructed from the projections via an iterative CT reconstruction algorithm, which accounts for the spatial modulation of the projected x-rays.

The invention relates to a computer-implemented method for the measurement of an object, wherein the method comprises the following steps: ascertainment of measurement data using a radiographic measurement of the object, wherein the measurement data generates a digital representation of the object with a large number of items of image information of the object; and carrying out the following steps at least before ending the ascertainment of measurement data: analysis of at least one portion of the digital representation of the object; optimization of at least one recording parameter of the radiographic measurement using the analysed portion of the digital representation of the object; and adaptation of the step of ascertainment of measurement data taking the at least one recording parameter into consideration. The invention thus provides a computer-implemented method that has an increased efficiency.

The invention refers to a system for providing a spectral image using a conventional CT system. The system comprises a data providing unit (11) for providing first projection data and second projection data, wherein the first and second projection data have been acquired using different acquisition spectra, wherein the first projection data has been acquired during a scout scan and the second projection data has been acquired during a diagnostic scan, or wherein the first and second projection data have been acquired by a first and second part of the detector, respectively. The first and second part of the detector acquire projection data with different acquisition spectra. A spectral image generation unit (12) generates a spectral image based on the projection data. With this system a spectral image can be provided using a conventional CT system with a decreased acquisition time.

There is provided a method and corresponding system for image reconstruction based on energy-resolved x-ray data. The method comprises collecting (S1) at least one representation of energy-resolved x-ray data, and performing (S2) at least two basis material decompositions based on said at least one representation of energy-resolved x-ray data to generate at least two original basis image representation sets. The method further comprises obtaining or selecting (S3) at least two basis image representations from at least two of said original basis image representation sets, and processing (S4) said obtained or selected basis image representations by data processing based on machine learning to generate at least one representation of output image data.

The invention refers to a system for providing a spectral image using a conventional CT system. The system comprises a data providing unit (11) for providing first projection data and second projection data, wherein the first and second projection data have been acquired using different acquisition spectra, wherein the first projection data has been acquired during a scout scan and the second projection data has been acquired during a diagnostic scan, or wherein the first and second projection data have been acquired by a first and second part of the detector, respectively. The first and second part of the detector acquire projection data with different acquisition spectra. A spectral image generation unit (12) generates a spectral image based on the projection data. With this system a spectral image can be provided using a conventional CT system with a decreased acquisition time.

A method includes acquiring a first dataset of projection measurements at a first energy spectrum and a second dataset of projection measurements at a second energy spectrum different from the first energy spectrum by switching between acquiring the first dataset for a set number of consecutive views at different projection angles at the first energy spectrum and acquiring the second dataset for the set number of consecutive views at different projection angles at the second energy spectrum. The set number of consecutive views is greater than one. The method includes supplementing both the first dataset with estimated projection measurements at the first energy spectrum and the second dataset with estimated projection measurements at the second energy spectrum to provide missing projection measurements at different projection angles not acquired during the imaging scan for the first dataset and the second dataset.

A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a candidate determination unit that performs multivariate analysis on the spectrum imaging data to determine candidates for the number of phases; a phase analysis unit that creates, for each of the candidates, a phase map group including a number of phase maps corresponding to the number of phases; and a display control unit that causes a display unit to display, for each of the candidates, the phase map group.

A material characterization system and method for characterizing a stream of material emanating from a material identification, exploration, extraction or processing activity, the system including a source of incident radiation configured to irradiate the stream of material in an irradiation region, one or more detectors adapted to detect radiation emanating from within or passing through the stream of material as a result of the irradiation by the incident radiation and thereby produce a detection signal, and one or more digital processors configured to process the detection signal to characterise the stream of material, wherein the source of incident radiation and the one or more detectors are adapted to be disposed relative to the stream of material so as to irradiate the stream of material and detect the radiation emanating from within or passing through the stream as the stream passes through the irradiation region.

A method is provided for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material. The method includes acquiring an energy spectrum transmitted through the sample, located in an X and/or gamma spectral band; for each spectrum of a plurality of calibration spectra, calculating a likelihood from said calibration spectrum, and from the spectrum transmitted through the sample, each calibration spectrum corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; and estimating the characteristic thicknesses associated with the sample according to the criterion of maximum likelihood.