In an example, there is disclosed a method for determining a material in a cargo, the cargo including a first object made of a first material and a second object made of a second material. The method includes obtaining image data associated with an inspection image of the cargo, for at least two levels of radiation energy, obtaining equivalence data associated with mass equivalence of at least one of the first material and the second material with respect to a reference material, for the at least two levels of radiation energy, obtaining observation data based on the image data and the equivalence data, and determining at least one of the first material and the second material, based on the obtained observation data.

Described herein are methods and systems for controlling a sensor assembly with a plurality of same type sensors. Sensors are operated in active and inactive states and have a corresponding performance parameter and reliability parameter that may be determined. The activation state of at least one of the sensors is changed based on an operational parameter. The performance parameter and/or the reliability parameter can then be updated.

A radiographic imaging apparatus and a radiation detector are provided, which are capable of sufficiently reducing the sensitivity difference between pixels even if the incident photon rate is high. A radiographic imaging apparatus includes: a radiation source for irradiating an object with radiation; a plurality of detection element modules each having a semiconductor layer that generates electrical charges depending on photon energy of the radiation, and a photon counting circuit for counting the electrical charges for each pixel; and a collimator that is disposed between the radiation source and the semiconductor layer, and has a plurality of walls forming a plurality of passage holes through which the radiation passes. A plurality of subpixels is formed on the semiconductor layer, and when one or more subpixels defined by the walls of the collimator are grouped as a macro pixel, a plurality of macro pixels arranged from each end of each of the detection element modules is smaller in size than a macro pixel other than the plurality of macro pixels arranged from the end of the detection element module.

A radiation detector module includes a frame, a module circuit board connected to the frame, detector units that each include radiation sensors disposed above the frame and electrically connected to the module circuit board, and an optically and infrared radiation opaque, X-ray transparent, electrically insulating detector shield covering a top surface and at least one side surface of the radiation sensors.

An X-ray radiation imaging system is for imaging a tubular object. The X-ray radiation imaging system may include an enclosure, a motorized base to be positioned within the enclosure and configured to rotate the tubular object, and a gantry within the enclosure. The X-ray radiation imaging system may further include an X-ray source coupled to the gantry and being adjacent the motorized base. The X-ray source may be configured to irradiate the tubular object with X-ray radiation while the motorized base rotates the tubular object. The X-ray radiation imaging system may also include an X-ray detector coupled to the gantry and being adjacent the tubular object, and the X-ray detector may receive the X-ray radiation from the tubular object. The X-ray radiation imaging system may include a processor coupled to the X-ray source and the X-ray detector and configured to generate an image of the tubular object.

A computer-tomography (CT) imaging system, comprising an imaging data acquisition system. The imaging data acquisition system includes a plurality of sets of a detector section, a storage section, and an aggregation section. The detector section includes a plurality of detector elements each being configured to convert radiation into electric signals. The aggregation section is configured to aggregate imaging data carried by the electronic signals from the detector section. The storage section is connected with an output of the detector section and an input of the aggregation section. The storage section comprises a predetermined number of non-volatile memories to store the imaging data from the corresponding detector elements.

Disclosed herein is a method of operating an imaging system which comprises (A) an image sensor comprising (a) a top surface, (b) M physically separate active areas on the top surface, and (c) a dead zone on the top surface and between the M active areas, and (B) a radiation source system which comprises an electron bombardment target, the method comprising: for i=1, . . . , N, sequentially causing emission of X-ray photons (i) from a radiation position (i) by causing electrons to bombard a target surface of the electron bombardment target at the radiation position (i); and for i=1, . . . , N, in response to the emission of the X-ray photons (i), capturing M images (i) of portions (i) of a same object, respectively in the M active areas, resulting in M×N images, wherein each point of the object is captured in at least one image of the M×N images.

The present disclosure provides a substance identification device and a substance identification method. The substance identification device comprises: a classifier establishing unit configured to establish a classifier based on scattering density values reconstructed for a plurality of known sample materials, wherein the classifier comprises a plurality of feature regions corresponding to a plurality of characteristic parameters for the plurality of known sample materials, respectively; and an identification unit for a material to be tested, configured to match the characteristic parameter of the material to be tested with the classifier, and to identify a type of the material to be tested by obtaining a feature region corresponding to the characteristic parameter of the material to be tested.

A method and a system for a two-step calibration method for the polychromatic semiconductor-based PCD forward counting model, to account for various pixel summing readout modes for imaging at different resolutions. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at plural tube voltage settings for each detector pixel. To correct the variation of the detector response due to different PCD sub-pixel summing schemes, the embodiments calibrate forward model parameters based on the various pixel readout modes.

A method for inspecting a sample with a multi-electron beam inspection system (100) is described. The method includes: placing the sample on a movable stage (110) extending in an X-Y-plane; generating a plurality of electron beams (105) propagating toward the sample; focusing the plurality of electron beams on the sample at a plurality of probe positions (106) in a two-dimensional array; scanning the sample surface by moving the movable stage in a predetermined scanning pattern while maintaining the plurality of electron beams stationary; and detecting signal electrons emitted from the sample during the movement of the movable stage for inspecting the sample. Further, a multi-electron beam inspection system (100) for inspecting a sample according to the above method is described.