The invention provides a system and method for characterising at least part of a material comprising: a source of incident X-rays (4, 28) configured to irradiate at least part of the material; one or more detectors (300,302,312,1701,1704,1600,1607,1608,1604) adapted to detect radiation emanating from within or passing through the material as a result of the irradiation by the incident radiation (1700) and thereby produce a detection signal (313); and one or more digital processors (304-311,2000-2009) configured to process the detection signal (313) to characterise at least part of the material; wherein the one or more detectors (300,302,312,1701, 1704,1600,1607,1608,1604) and one or more digital processors (304-311,2000-2009) are configured to characterise at least part of the material by performing energy resolved photon counting X-ray transmission spectroscopy analysis.

A digital X-ray imaging system is provided. The digital X-ray imaging system includes an X-ray source and a digital X-ray detector. The digital X-ray detector includes a scintillator configured to absorb radiation emitted from the X-ray source and to emit optical photons in response to the absorbed radiation. The digital X-ray detector also includes multiple pixels, each pixel including a pinned photodiode and at least two charge-storage capacitors coupled to the pinned photodiode, wherein each pixel is configured to absorb the optical photons emitted by the scintillator and each pinned photodiode is configured to generate a photocharge in response to the absorbed optical photons. The digital X-ray detector further includes control circuitry coupled to each pixel of the multiple pixels and configured to selectively control a respective flow of the photocharge generated by the pinned photodiode to a respective charge-storage capacitor of the at least two charge-storage capacitors during integration.

In one embodiment, an X-ray inspection system may capture one or more X-ray images for samples of interest processed by a first tool. The X-ray inspection system may be inline with the first tool and have an inspection speed of 300 mm.sup.2 per minute or greater. The system may determine, in real-time, metrology information related to the samples of interest based on the X-ray images. The metrology information may indicate that a sample parameter associated with the samples of interest is outside of a pre-determined range. The system may provide instructions or data to one or more of the first tool or one or more second tools to adjust process parameters associated with the respective tools based on metrology information. The adjusted process parameters may reduce a processing error probability, of the respective tool for processing subsequent samples, related to the sample parameter being outside of the pre-determined range.

A radiation logging tool is provided that includes a scintillator detector for use on a wellbore tool string to characterize earth formations. The scintillator detector has a shutter to allow for the collection of data differentiating between incident radiation, such as backscatter signal, and system noise, such as dark current, vibration noise, electronics thermal noise, and electrostatic noise. The radiation logging tool provides for a method of calibrating and measuring incident radiation by the removal of system noise. The shutter is positioned between the photosensor and scintillation member of the scintillator detector, and is able to switch between open and closed states while the scintillation detector is deployed. Measurements of signal noise can be used to calibrate the sampling signal of incident radiation on the scintillator detector.

An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.

A radiation imaging apparatus is provided. The apparatus comprises an image capturing unit that is provided with pixels for converting incident radiation into electrical signals and is configured to output first image data, a storage unit configured to store position information of a first pixel which continuously outputs an abnormal pixel value, a replacing unit configured to generate second image data from the first image data by replacing a pixel value of the first pixel with a preset setting value based on the position information and a correction unit configured to detect a second pixel which is not stored in the storage unit and outputs an abnormal pixel value, and correct the pixel value of the second pixel. The correction unit detects and corrects the second pixel based on the second image data that includes the first pixel whose pixel value has been replaced.

A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.

Disclosed embodiments include perovskite scintillators configured to be operated at a low temperature, detectors with perovskite scintillators configured to be operated at a low temperature, scanners with perovskite scintillators configured to be operated at a low temperature, methods of cooling a perovskite scintillator to a low temperature, and methods of configuring a perovskite scintillator to be operated at a low temperature.

A charged particle beam device includes a detector 109 converting a photon emitted by a scintillator into an electric signal and a signal processing unit 110 processing the electric signal from the detector 109. The signal processing unit 110 detects a peak position of the electric signal, steepness of a rising section associated with the peak position, and steepness of a falling section associated with the peak position and classifies the peak position based on the steepness of the rising section and the steepness of the falling section.

Provided is a detector capable of appropriately and highly accurately detecting radiation even under an environment where a wide range of radiation is irradiated.

The radiation detector is configured in such a manner that a plurality of light receiving devices are arranged in each cell of a scintillator that is divided into a plurality of cells, photoelectric conversion of scintillation light emitted by each individual cell is dividedly performed by the plurality of light receiving devices to reduce a charge amount of an output signal of each light receiving device, and the output signals are input into an integrated circuit to generate a radiation detection signal of each cell.