A quantitative phase analysis device includes: a unit for acquiring a powder diffraction pattern of the sample; a unit for acquiring information on a plurality of crystalline phases; a unit for acquiring a fitting function for each of the plurality of crystalline phases; a unit for executing whole-powder pattern fitting for the powder diffraction pattern by using the acquired fitting functions, to thereby acquire a fitting result; and a unit for calculating a weight ratio of the plurality of crystalline phases based on the fitting result. Each fitting function is selected from the group consisting of a first fitting function using an integrated intensity obtained by whole-powder pattern decomposition, a second fitting function using an integrated intensity obtained by observation or calculation, and a third fitting function using a profile intensity obtained by observation or calculation.

An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer.

An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer.

An image processing apparatus including a processor and a memory, the processor executing a program stored in the memory to: acquire elemental map data representing a distribution of X-ray intensity or a distribution of concentration for each element; generate a phase map indicating a distribution of phases of compounds based on the elemental map data; and generate graphs representing X-ray intensity of each element or a concentration of each element as an area for the respective phases of the compounds included in the phase map and cause a display section to display the graphs.

A method for improving the quality/integrity of an EBSD/TKD map, wherein each data point is assigned to a corresponding grid point of a sample grid and represents crystal information based on a Kikuchi pattern detected for the grid point; comprising determining a defective data point of the EBSD/TKD map and a plurality of non-defective neighboring data points, comparing the position of Kikuchi bands of a Kikuchi pattern detected for a grid point corresponding to the defective data point with the positions of bands in at least one simulated Kikuchi pattern corresponding to crystal information of the neighboring data points and assigning the defective data point the crystal information of one of the plurality of neighboring data point based on the comparison.

The system for in-situ real-time measurements of microstructure properties of 3D-printing objects during 3-D printing processes. An intensive parallel X-ray beam (with an adjustable beam size) impinges on a printing object and is diffracted on a crystal lattice of the printing material. The diffracted radiation impinges on a reflector formed with an array of reflector crystals mounted on an arcuated substrate. The diffracted beams reflected from the reflector crystals correspond to the diffraction intensity peaks produced by interaction of the crystal lattice of the printing material with the impinging X-ray beam. The intensities of the diffraction peaks are observed by detectors which produce corresponding output signals, which are processed to provide critical information on the crystal phase composition, which is closely related to the defects and performance of the printing objects. The subject in-situ technology provides an effective and efficient way to monitor, in real-time, the quality of 3D-printing parts during the 3-D printing process, with a significant potential for effective process control based on the reliable microstructure feedback.

A method for evaluation of a resin alloy includes identifying and quantifying individual materials contained in the resin alloy. In addition, the method can identify encapsulation and whether or not a single phase is formed, without an additional equipment, allowing easier analysis and evaluation of various alloy materials through evaluation of physical properties of resin alloys.

A method of analyzing fines migration in a multiphase flow in a sediment layer using X-ray computed tomography (CT) image includes, preparing an X-ray CT image analysis sample; analyzing an X-ray CT image during a depressurization process; calibrating and calculating a fines content; and estimating a fines migration analysis result.

A method of analyzing fines migration in a multiphase flow in a sediment layer using X-ray computed tomography (CT) image includes, preparing an X-ray CT image analysis sample; analyzing an X-ray CT image during a depressurization process; calibrating and calculating a fines content; and estimating a fines migration analysis result.

A surface analyzer is provided with a measuring unit, a scatter diagram generation unit, a cluster analysis unit, and a cluster region detection unit. The measuring unit acquires a signal reflecting a quantity of each of a plurality of components or elements that are analysis targets at a plurality of positions on a sample. The scatter diagram generation unit generates a scatter diagram based on a measurement result by the measuring unit. The cluster analysis unit performs the clustering of points in the scatter diagram. The cluster region detection unit acquires, based on clustering information given to each point in the scatter diagram by the cluster analysis unit, for each cluster, cluster region boundary information on a polygon having a predetermined number or less of vertices.