A device for the contactless determination of at least one property of a metal product during the metallurgical production of the metal product comprises a housing and at least one measuring device comprising a transmitting unit and a receiving unit. An electromagnetic field is generated by the transmitting unit and directed onto the metal product, thereby inducing a physical interaction in the material of the metal product, and a remaining and/or resulting part of this physical interaction is subsequently received by the receiving unit. At least one component of the measuring device comprising the transmitting unit and/or the receiving unit can be moved relative to the housing or the metal product moving therein, in order to thereby set or selectively change a predetermined distance to the metal product for the transmitting unit and/or the receiving unit.

A scanning electron microscope includes a spin detector configured to measure secondary electron spin polarization of secondary electrons emitted from the sample, and an analysis device configured to analyze secondary electron spin polarization data measured by the spin detector. The analysis device evaluates the strain in the sample by calculating a difference in the secondary electron spin polarization data of adjacent pixels.

Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.

A spin polarimeter includes: a particle beam source or a photon beam source that is a probe for a sample; a sample chamber in which the sample is accommodated; a spin detector that includes a target to be irradiated with an electron generated from the sample by a particle beam or a photon beam from the probe, and a target chamber in which the target is accommodated, and is configured to detect a spin of the sample by detecting an electron scattered on the target; a first exhaust system that is configured to exhaust the sample chamber; a second exhaust system that is configured to exhaust the target chamber; and an orifice that is disposed between the target chamber and the sample chamber.

A ball-mapping system connectable to an X-ray diffraction apparatus, for collecting X-ray diffraction data at measurement points located on a ball-shaped sample is provided. The ball-mapping system includes a sample stage, including a sample-contacting surface and a guide assembly cooperating with the sample-contacting surface for guiding the sample-contacting surface along a first axis and along a second axis unparallel to the first axis. The ball-mapping system includes a sample holder for keeping the ball-shaped sample in contact with the sample stage and a motor assembly in driving engagement with the guide assembly, the motor assembly driving the sample-contacting surface in translational movement along the first axis and the second axis, the translational movement of the sample-contacting surface causing the ball-shaped sample to rotate, on the sample-contacting surface along the first axis and the second axis. A method for mapping the ball-shaped sample is also provided.

An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy comprises an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by said product sample and generating a signal received that can be analysed to determine a chemical composition of said product sample and select a type of product corresponding to said chemical composition of the product sample.

According to the invention, the aforesaid apparatus comprises a first vacuum chamber located between an output of the apparatus facing the product sample and said X-ray source, and a second vacuum chamber located between said output of the apparatus facing the product sample and said detector,

said apparatus further comprising an optical module with polycapillary lens located downstream of said X-ray source, which is configured for focusing said X-ray beam and is moreover associated in a vacuum-tight way to said first vacuum chamber.

A method for measuring a residual stress, including irradiating a cast and forged steel product with X-rays; two-dimensionally detecting intensities of diffracted X-rays originating from the X-rays; and calculating a residual stress based on a diffraction ring formed by an intensity distribution of the diffracted X-rays, wherein the irradiating includes changing a condition for irradiation of the cast and forged steel product with the X-rays, the irradiating is a step of performing the changing each time the cast and forged steel product is irradiated with the X-rays, the calculating is a step of calculating the residual stress each time the cast and forged steel product is irradiated with the X-rays, and the method further includes averaging a plurality of residual stresses calculated in the calculating after the irradiating, the detecting, and the calculating are performed in this order a plurality of times.

A method that measures stress of a test subject including a metal includes: detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays from an irradiation unit to be incident on the test subject and to be diffracted by the test subject; and calculating the stress of the test subject based on detection results during the detection step. Therein, the detection step involves causing X-rays from the irradiation unit to be incident on each of a plurality of sites on the test subject with the irradiation unit angled relative to the test subject in a manner such that the angle of incidence on the test subject is within the range of 5-20, inclusive, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the test subject.

A spin polarimeter includes: a particle beam source or a photon beam source that is a probe for a sample; a sample chamber in which the sample is accommodated; a spin detector that includes a target to be irradiated with an electron generated from the sample by a particle beam or a photon beam from the probe, and a target chamber in which the target is accommodated, and is configured to detect a spin of the sample by detecting an electron scattered on the target; a first exhaust system that is configured to exhaust the sample chamber; a second exhaust system that is configured to exhaust the target chamber; and an orifice that is disposed between the target chamber and the sample chamber.

Provided are a defect display device and method capable of displaying a radiographic image of an industrial product (object) such as a casting so as to support the determination of the severity of the industrial product without interference with the interpretation of the radiographic image. The defect display device includes an image acquisition unit that acquires a radiographic image captured with radiation transmitted through an object, a defect information acquisition unit that acquires defect information indicating defects in the object detected from the radiographic image, a display unit that displays the radiographic image on a screen, an input unit that accepts an instruction input from a user, and a display control unit that generates, based on the defect information, a contour corresponding to a distribution of a plurality of defects among the defects in the object, displays the contour on the screen, and changes display of the contour in accordance with a generation condition of contour accepted through the input unit.