Patent classifications
G01N2223/631
Non-destructive inspection device and non- destructive inspection system
A non-destructive inspection system includes a non-destructive inspection apparatus and a management apparatus. The non-destructive inspection apparatus includes: a neutron emission unit capable of emitting a neutron beam; a gamma-ray detector capable of detecting a gamma ray; an apparatus case covering the neutron emission unit and the gamma-ray detector and including an opening; an outer shutter configured to open and close the opening; dose monitors each provided on the apparatus case and configured to detect a radioactive dose; an apparatus communication unit capable of transmitting apparatus information including the detected radioactive dose to the management apparatus and capable of receiving inspection permission information from the management apparatus; and an apparatus control unit configured to open the outer shutter and allows emission of the neutron beam from the neutron emission unit upon acquisition of the inspection permission information.
Integrated backscatter X-ray assemblies for detecting backscatter X-rays reflected by target area of article under test and associated methods
Integrated backscatter X-ray assemblies for detecting backscatter X-rays reflected by a target area of an article under test are disclosed. The integrated backscatter X-ray assembly includes an enclosure, an X-ray power supply, an X-ray tube, a backscatter X-ray detector and a cooling fluid. The X-ray power supply disposed within the enclosure. The X-ray tube disposed within the enclosure and operatively coupled to the X-ray power supply. The backscatter X-ray detector is disposed within the enclosure. The cooling fluid disposed within the enclosure such that the X-ray power supply, the X-ray tube and the backscatter X-ray detector are immersed in the cooling fluid. In various examples, integrated backscatter X-ray assemblies may also include a movable base and/or a mobile platform. Methods for detecting backscatter X-rays reflected by a target area of an article under test are also disclosed.
BACKSCATTER IMAGING SYSTEM FOR INSPECTION OF EQUIPMENT THROUGH INSULATION
Embodiments are provided to facilitate X-ray backscatter imaging of equipment that is covered by insulation or other materials that it is undesirable to remove and/or that is difficult to access (e.g., due to distance from the ground and/or catwalks or other support structures). These embodiments include improved collimators or other elements to facilitate scanning of the X-ray beam in at least one direction while also maintaining a low size, weight, and power (SWaP). These embodiments also include improved detectors to more readily allow improved X-ray backscatter images and material composition (including detection of the presence of oxides or other evidence or corrosion or degradation) to be detected, even in SWaP-limited applications like remote vessel inspection.