A method for preparing surrogate calibration standards for web gauging, is provided. The method includes providing linearizations for one or more radiometric gauges, each linearization associated with a radiometric gauge and relating the basis weight of real standards, comprising a lithium ion battery (LIB) electrode material, to transmission of the radiation through the LIB electrode material. The method also includes providing one or more surrogate standards comprising an inert material having an effective Z (Z.sub.surrogate) substantially the same as an effective Z (Z.sub.real) of the LIB material in the real standards. The method further includes assigning to each surrogate standard a surrogate basis weight based on a transmission of radiation through the surrogate standard and the linearizations

An X-ray fluorescence analyzer includes a sample stage, a sample moving mechanism, an X-ray source, a detector detecting a fluorescent X-ray generated from the sample irradiated with a primary X-ray, an imaging device imaging the sample, a display device displaying the image on a screen, a pointing device designating a specific position on the screen for allowing an input at the specific position, an image processing device displaying a mark at the input position on the screen by the pointing device and a control device controlling the sample moving mechanism and the image processing device and, when the sample stage is moved, controlling the image processing device to display the mark on the screen with moving the mark in the same moving direction as that of the sample stage by the same moving distance.

Systems and process are provided to make X-ray radiographs sufficiently quantitative and standardized for bone and other biological material or non-biologic material density evaluations. The X-ray radiograph methodology and system provide a cost effective diagnostic tool that may be used with existing X-ray radiography sources already present in many clinics and hospitals to ultimately produce large volumes of scientifically valid data and useful diagnostic and prognostic information. A calibration bar is added to a conventional X-ray film cartridge and images thereof subsequently incorporated into radiographs for interpretation or a cartridge is designed to integrate a calibration function. The calibration standard affords a standard against which material density is measured. A software program is provided to interpret tissue densities (including bone) to ultimately identify values compared to preselected thresholds.

Determining a property of a layer of an integrated circuit (IC), the layer being formed over an underlayer, is implemented by performing the steps of: irradiating the IC to thereby eject electrons from the IC; collecting electrons emitted from the IC and determining the kinetic energy of the emitted electrons to thereby calculate emission intensity of electrons emitted from the layer and electrons emitted from the underlayer calculating a ratio of the emission intensity of electrons emitted from the layer and electrons emitted from the underlayer; and using the ratio to determine material composition or thickness of the layer. The steps of irradiating IC and collecting electrons may be performed using x-ray photoelectron spectroscopy (XPS) or x-ray fluorescence spectroscopy (XRF).

A method of measuring a flow line deposit comprising: providing a pipe comprising the flow line deposit; measuring unattenuated photon counts across the pipe; and analyzing the measured unattenuated photon counts to determine the thickness of the flow line deposit and associated systems.

The method of inspecting a degraded area of a metal structure covered by a composite repair generally comprises operating a Compton scattering inspection device onto the degraded area, including emitting a beam of radiation particles directed towards and across the composite repair, detecting at least some backscattered photons scattered back from the metal structure, and acquiring Compton scattering data from the detected backscattered photons, the Compton scattering data being indicative of remaining wall thickness of the degraded area.

A method according to some embodiments comprises obtaining a formation sample from a borehole, identifying minerals present in a first portion of the formation sample and determining densities of the minerals. The method also comprises determining, using a second portion of the formation sample, material properties associated with the mineral densities. The method further comprises associating the material properties with the identified minerals using the mineral densities, and generating a log comprising the associations.

Provided is a method for non-destructively measuring an electrode density and an electrode porosity of an electrode active material coated on an electrode base material using X-ray diffraction. According to the methods of the present invention, a value of I.sub.peak in parallel direction/I.sub.peak in perpendicular direction of the electrode active material is obtained by X-ray diffraction and an electrode density and an electrode porosity are calculated according to previously obtained correlations between the electrode density and I.sub.peak in parallel direction/I.sub.peak in perpendicular direction and between the electrode porosity and I.sub.peak in parallel direction/I.sub.peak in perpendicular direction.

A method is provided of measuring the mass thickness of a target sample for use in electron microscopy. Reference data are obtained which is representative of the X-rays (28) generated within a reference sample (12) when a particle beam (7) is caused to impinge upon a region (14) of the reference sample (12). The region (14) is of a predetermined thickness of less than 300 nm and has a predetermined composition. The particle beam (7) is caused to impinge upon a region (18) of the target sample (16). The resulting X-rays (29) generated within the target sample (16) are monitored (27) so as to produce monitored data. Output data are then calculated based upon the monitored data and the reference data, the output data including the mass thickness of the region (18) of the target sample (16).

A measurement system is provided, including a measurement machine and a computer. The measurement machine is configured to measure a thickness T1 of a to-be-tested circuit board and a drilling depth D1 of the to-be-tested circuit board. The computer calculates a length S1 of a residual conductive portion in a back drilled hole of the to-be-tested circuit board according to a thickness T of a reference circuit board, a drilling depth D of the reference circuit board, a length S of a residual conductive portion in a back drilled hole of the reference circuit board, the thickness T1 of the to-be-tested circuit board and the drilling depth D1 of the to-be-tested circuit board.