The present disclosure relates to a measuring chamber, a working method of the measuring chamber, a chemiluminescence measurement method of the measuring chamber and a chemiluminescence detector. The measuring chamber includes a dark chamber, a first substrate nozzle, a photomultiplier detection component, a waste liquor adsorption needle component, a reaction cup turntable and a plurality of reaction cup processing stations; the reaction cup turntable is provided in the measuring chamber rotationally; and the plurality of reaction cup processing stations are sealed in a mutually light-isolated manner. When the instrument works, reaction cups in the reaction cup turntable are moved in the dark chamber; and after the reaction cups are moved to corresponding processing stations for processing the reaction cups, the plurality of different processing stations for processing, the reaction cups may simultaneously process the reaction cups moved to the corresponding reaction cup processing stations.

An X-ray detection method and an X-ray detector are provided. The X-ray detection method according to embodiments of the present disclosure includes: dividing an energy range of photons emitted by an X-ray source into a number N of energy windows, where N is an integer greater than 0; obtaining a weighting factor for each of the number N of energy windows based on linear attenuation coefficients of a substance of interest and a background substance of an imaging target; obtaining a weighting factor matrix for M output channels of an X-ray detector based on the weighting factor for each of the number N of energy windows, where M is an integer greater than 0; and obtaining output results of the M output channels based on the weighting factor matrix and numbers of photons having an energy range falling into individual energy windows of the number N of energy windows.

The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.

A sample (106) is irradiated with electromagnetic radiation such as X-Rays and diffraction data is sampled at inner and outer caustic rims formed at a sensor surface (108) and defined by a continuum of Debye cones (130, 132) formed by diffraction of the incident radiation. Intensities of the inner and outer rims while translating and rotating the sample are converted using a tomographic technique into X-ray diffraction images and material discrimination is also possible.

The present invention includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays. The present invention also includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered on one side of the plate by a detachable cover forming a water-tight seal against the plate. The cover is substantially free of the elements osmium, yttrium, iridium, phosphorus, zirconium, platinum, gold, niobium, mercury, thallium, molybdenum, sulfur, lead, bismuth, technetium, ruthenium, chlorine, rhodium, palladium, argon, silver, and thorium. The holes are less than about 500 micrometers across in one dimension where the cover covers the holes. The present invention also includes a method for preparing samples for measurement by x-ray fluorescence spectrometry. The method comprises providing a solution of with less than 10 micromolar solute and a volume of between about 2 microliters and about 2 milliliters. The solution is concentrated and analyzed using x-ray fluorescence spectrometry.

This invention provides a multi-spot, digitally-addressable X-ray source operable so as to emit X-ray flux from separate spots in the source to separate, defined samples or sample areas outside the source. The x-ray flux maybe used for irradiation or for imaging. The source may be configured with reflective, transmission or forward flux channel anodes. A system made using this source comprises the source itself, a power supply, controls and cooling system for the source, a means to locate the sample array on or near the source and a radiation shielded cabinet. One or more x-ray detectors for measuring dose intensity or for imaging may be included in the system.

An X-ray diffraction apparatus for measuring crystal orientation of crystalline samples is provided. The apparatus comprises a turntable comprising at least one tray; a turntable support platform defining a plane; and a motorized turntable displacement system for remotely displacing the turntable linearly along a first axis parallel to the plane, linearly along a second axis perpendicular to the plane, and rotatably about the second axis; an X-ray assembly provided within the enclosure; and a motorized X-ray assembly displacement system for displacing the X-ray assembly linearly along a third axis, the third axis being parallel to the plane and non-parallel to the first axis; wherein for each one of the crystalline samples, at least one of the motorized turntable displacement system and the motorized X-ray assembly displacement system is actuated to align the collimated X-ray beam with the corresponding measuring position and measure the crystal orientation of the crystalline sample.

There is provided a transmission X-ray diffraction (XRD) apparatus, the transmission XRD apparatus including an X-ray source for generating a direct X-ray beam; sample holder for receiving the sample, the sample being positioned to receive the direct X-ray beam when held by the sample holder; a detector for receiving X-rays transmitted through the sample and outputting an X-ray diffraction pattern therefrom; and an optical element positioned between the X-ray source and the detector, the optical element including a Montel optic and a secondary pin-hole collimator collectively adapted to focus the direct X-ray beam on the detector, wherein a ratio between a dimension of the direct X-ray beam projected on the detector and a sample-to-detector distance is equal or smaller than 1/570. Related methods are also provided.

The present disclosure relates to the field of radiation imaging for testing and/or quality assurance of items in a wide range of industrial applications. Specifically, in the present disclosure a method and system are described by which the item inspection accuracy and efficiency using radiation imaging technology can be improved.

An X-ray tomography sample changing hardware including a support bracket configured to attach to an X-ray tomography support; a mounting arm attached to the support bracket, the mounting arm having a beam, at least one slot formed in the beam, the at least one slot including a mouth configured to receive a sample stage; the sample stage including a body having an axis with an upper portion and a lower portion axially opposite the upper portion; the lower portion configured to mate with a receiver on a sample manipulator for an X-ray tomography machine; and multiple chambers formed in the body and aligned axially between the upper portion and the lower portion, each of the multiple chambers including a mounting feature configured to support a part within each of the multiple chambers.