G01N2223/643

INSPECTION APPARATUS
20170356860 · 2017-12-14 · ·

An inspection apparatus includes a feed-in preparation chamber, an imaging chamber, and a feed-out preparation chamber. Each preparation chamber includes a feed-in unit that receives an inspection object through a first opening, a traverser that translates the received object to a second opening in a direction different from the receiving direction of the object, and a feed-out unit that moves the object in a direction different from a moving direction of the traverser and discharges the object through the second opening. The imaging chamber includes an imaging unit that images the object fed from the feed-in preparation chamber. The traverser includes a mount for the object, and a shield that moves together with the mount and prevents radioactive rays entering one of the first and second openings and propagating in the moving direction of the traverser from reaching the other opening.

X-RAY INSPECTION DEVICE
20170350831 · 2017-12-07 · ·

An X-ray inspecting apparatus, with which X-rays of a broad energy band can be detected while manufacturing costs are suppressed, comprises an X-ray radiation device, a line sensor assembly, and other components. The line sensor assembly has a plurality of detection units and other components. Each detection unit has a scintillator, a detection main body including a plurality of elements disposed thereon, and a ceramic substrate supporting the scintillator and detection main body. In the line sensor assembly, the plurality of detection units etc. are aligned in a forward-backward direction so that the scintillators and the detection main bodies of the detection units etc. are aligned without gaps with the scintillators and detection main bodies of adjacent detection units.

METHOD AND PLANT FOR INSPECTING AN ANIMAL CARCASS
20230180770 · 2023-06-15 ·

An animal carcass is moved along a movement trajectory which passes through an inspection zone between at least one X-ray emitter and at least one X-ray detector, which are stationary relative to the inspection zone. X-ray detections are performed at successive moments during movement of the animal carcass through the inspection zone, the animal carcass being made to rotate around an axis of rotation which is transversal to lines of propagation of X-rays emitted by the at least one X-ray emitter in the inspection zone, so that what is obtained is a plurality of two-dimensional radiographic images of the animal carcass in different angular positions around the axis of rotation . The two-dimensional radiographic images are processed to determine a cutting pattern and/or a structure of the animal carcass, such as a position of bones, fat and/or lean parts in the animal carcass.

X-RAY INSPECTION APPARATUS, X-RAY INSPECTION SYSTEM, AND X-RAY INSPECTION METHOD
20230175984 · 2023-06-08 ·

An X-ray inspection apparatus includes a transport unit configured to transport an article, an electromagnetic wave irradiation unit configured to irradiate the article with a first electromagnetic wave in a first energy band and a second electromagnetic wave in a second energy band, an electromagnetic wave sensor configured to detect the first electromagnetic wave and the second electromagnetic wave, and a control unit to which a detection result is input. The control unit is configured to generate a first transmission image based on a detection result of the first electromagnetic wave and a second transmission image based on a detection result of the second electromagnetic wave, to perform image processing including a subtraction process on the first transmission image and the second transmission image, and to determine whether or not a foreign material is included in the article on the basis of a difference image.

Defect Inspection Device, Display Device, and Defect Classification Device

A defect inspection device is provided with an illumination optical system that irradiates light or an electron beam onto a sample, a detector that detects a signal obtained from the sample through the irradiation of the light or electron beam, a defect detection unit that detects a defect candidate on the sample through the comparison of a signal output by the detector and a prescribed threshold, and a display unit that displays a setting screen for setting the threshold. The setting screen is a two-dimensional distribution map that represents the distribution of the defect candidates in a three dimensional feature space having three features as the axes thereof and includes the axes of the three features and the threshold, which is represented in one dimension.

DEVICE FOR SORTING MATERIALS, IN PARTICULAR SCRAP PARTICLES, BY MEANS OF X-RAY FLUORESCENCE
20170328845 · 2017-11-16 ·

A device for identifying materials on a conveyor belt (101) by means of X-ray fluorescence comprising an X-ray source (102), from which X-ray radiation (103) is guided onto material parts (104), comprising a detector head (107) containing an X-ray detector array (108) having a multiplicity of detector elements (113, 114, 115) arranged in a planar fashion for receiving X-ray radiation (105) and for converting said X-ray radiation into electrical charge signals, and also an electronic unit (109) for reading out and processing the charge signals, which comprises for each individual detector element a signal channel (120) having in each case: a discriminator unit (117) having at least two adjustable discriminator thresholds (116, 122) for detecting all Gaussian curve-like signals (119) whose amplitude is greater than one of the two or simultaneously greater than both discriminator thresholds, and also one counting unit (118, 121) per discriminator threshold for converting the signals into digital counting events,
wherein the individual detector elements of the X-ray detector array have a spatial resolution of 50 μm to 500 μm with a sensitivity to X-ray radiation in an energy range of between 500 eV and 30 keV, with an energy resolution of less than 0.5 keV at counting rates of up to 100 kcps and relative to an energy of 8.04 keV, the electronic unit comprises a signal channel for each individual detector element of the X-ray detector array,
and each discriminator unit for a specific detector element is in each case electrically connected to the discriminator units of the detector elements that are spatially directly adjacent to said detector element, wherein all the discriminator units are interconnected with one another via a digital and/or analog circuit in such a way that simultaneous occurrence of signals on more than one detector element can be identified and treated electrically separately.

INSPECTION DEVICE, PACKAGING MACHINE, AND PACKAGE INSPECTION METHOD

An inspection device includes: an electromagnetic wave irradiator that irradiates, with a predetermined electromagnetic wave from a first film side, the package that is conveyed along a predetermined direction and that has the spaces at a plurality of positions in a width direction; an imaging device that is disposed opposed to the electromagnetic wave irradiator across the package, includes an electromagnetic wave detector including a plurality of detection elements that is arrayed along the width direction and that detects the electromagnetic wave radiated from the electromagnetic wave irradiator and transmitted through the package, and sequentially outputs an obtained electromagnetic wave transmission image every time the package is conveyed by a predetermined amount; and an image processing device that processes an image signal output from the imaging device.

System and method for material characterization

The invention provides a system and method for characterising at least part of a material comprising: a source of incident X-rays (4, 28) configured to irradiate at least part of the material; one or more detectors (300,302,312,1701,1704,1600,1607,1608,1604) adapted to detect radiation emanating from within or passing through the material as a result of the irradiation by the incident radiation (1700) and thereby produce a detection signal (313); and one or more digital processors (304-311,2000-2009) configured to process the detection signal (313) to characterise at least part of the material; wherein the one or more detectors (300,302,312,1701, 1704,1600,1607,1608,1604) and one or more digital processors (304-311,2000-2009) are configured to characterise at least part of the material by performing energy resolved photon counting X-ray transmission spectroscopy analysis.

INSPECTION AND SORTING SYSTEM
20170225200 · 2017-08-10 ·

An inspection and sorting system sorts conveyed articles. The system is provided with a conveyance device, an X-ray inspection device, and a sorting device. The conveyance device conveys inspection articles. The X-ray inspection device inspects the conveyed inspection articles. The sorting device has an air sorting mechanism that sorts the conveyed inspection articles in a sorting operation. The sorting device has a sorting information receiving component, a reference signal receiving component, and a sorting mechanism control component. The sorting information receiving component receives sorting information relating to the sorting of the inspection articles based on an inspection result of the X-ray inspection device. The reference signal receiving component receives a fixed-interval reference signal relating to the conveyance by the conveyance device. The sorting mechanism control component controls the air sorting mechanism to execute the sorting operation based on the sorting information at a timing adjusted by the reference signal.

X-RAY INSPECTION DEVICE
20170227477 · 2017-08-10 ·

Provided is a highly reliable X-ray inspection device having two line sensors, in which accurate inspection results can be obtained even when there is displacement of the mounting position of the line sensors. The X-ray inspection device is provided with a conveyor unit for conveying an article, an X-ray emitter, a first line sensor, a second line sensor, a detection unit, and a corrected-image generation unit. The X-ray emitter emits X-rays to the article conveyed by the conveyor unit. The first line sensor detects, in a low energy band, X-rays that have passed through the article. The second line sensor detects, in a high energy band, X-rays that have passed through the article. The detection unit detects positional displacement of the second line sensor with respect to the first line sensor in horizontal direction and vertical direction.