An X-ray inspection apparatus includes: an X-ray irradiation unit; a transport unit; an X-ray detection unit; and an X-ray shielding door. An inclined portion that is inclined downward from the one side toward the other side in the width direction when seen in the transport direction in the closed state is formed in at least a part of an inner surface of the X-ray shielding door. In the closed state, a lower end portion of the inclined portion in the vertical direction is located closer to the other side of the width direction than a position of an end portion of the transport unit on the one side of the width direction.

A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.

According to an embodiment, an inspection apparatus includes a communication interface and a processor. The communication interface acquires results of single-item determination, which are inspection results for individual parcels that are successively conveyed, and number-of-items information for identifying, as one parcel group, a plurality of parcels among the individual parcels. The processor identifies a plurality of parcels as one parcel group, based on the number-of-items information, determines a result of multiple-item determination, which is an inspection result for the parcel group, based on the results of the single-item determination for the individual parcels included in the parcel group, and distributes the individual parcels included in the parcel group, based on the result of the multiple-item determination.

A multi-channel static CT device is provided, and the multi-channel static CT device includes: a scanning channel including a plurality of scanning sub-channels; a distributed X-ray source including a plurality of ray emission points arranged around the scanning channel; and a detector module including a plurality of detectors arranged around the scanning channel, wherein the plurality of detectors are arranged corresponding to the plurality of ray emission points.

A training data generation device that can rapidly generate a large amount of training data to be input into a learning program is provided. The training data generation device generates training data to be used in machine learning. A learned model generated by the machine learning using the training data generated by the training data generation device is used in an inspection device that performs inspection for determining whether or not an inspection target is a normal product by inputting an image capturing the inspection target into the learned model. The training data generation device includes the following: a determination-target image extraction unit that extracts, from an input image capturing the inspection target, one or more determination-target images containing a determination target that satisfies a predetermined condition; a sorting unit that associates, on the basis of a sorting operation of sorting the inspection target captured in the determination-target image into either a normal product or a non-normal product, each of the determination-target images and a result of the sorting with each other; and a training data memory unit that stores training data in which each of the determination-target images and a result of the sorting are associated with each other.

In one embodiment, a system and method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a predetermined movement path, as the substance moves along said path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of said overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.

A test apparatus for challenging contaminant monitoring apparatus. The test apparatus includes contaminant provisions having a pre-selected property including any one or more of the group including composition, material, mass, size and/or shape of a contaminant. The test apparatus also includes identification provisions for identifying the presence of the contaminant provisions and/or for identifying the identity of the test apparatus. The contaminant provisions and the identification provisions are detectable and/or discriminateable by X-rays.

There is presented an apparatus for identifying a sample. Such an apparatus may be used to detect unwanted items as part of a security screening system. The apparatus includes a platform for receiving the sample, at least one electromagnetic radiation emitter, a plurality of detectors and a calculator. The electromagnetic radiation emitter is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell. The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter includes a lattice spacing of the sample.

A core analysis system having a trailer and an analysis assembly secured to the trailer. The analysis assembly includes an X-ray Fluorescence (XRF) detection subassembly defining a sample analysis area. The analysis assembly further includes a conveyor subassembly configured to selectively deliver one or more core samples to the sample analysis area of the XRF detection subassembly.

An X-ray detection device 30 comprises a low energy scintillator 31 configured to convert an X-ray of a low energy range into scintillation light, a low energy line sensor 32 configured to detect the scintillation light to output image data, a high energy scintillator 33 configured to convert an X-ray of a high energy range into scintillation light, and a high energy line sensor 34 configured to detect the scintillation light to output image data. Pixels L of the low energy line sensor 32 and pixels H of the high energy line sensor 34 are identical in number and are aligned at an identical pixel pitch, and a minimum filtering process is executed on the image data from the low energy line sensor 32, while an averaging process is executed on the image data from the high energy line sensor 34.