Method for detecting at least one critical defect in a ceramic rolling element providing the steps of capturing a plurality of two-dimensional digital radiographic images of the rolling element; digitally filtering each radiographic image; delineating, on the basis of the filtered image, at least one region liable to comprise the critical defect; constructing stereoscopically a virtual model of the rolling element having the region; comparing the dimensions of the delineated region with a plurality of predetermined threshold values, and, when the dimensions are greater than the threshold values, generating an alarm signal.

A multi-scale inspection and intelligent diagnosis system and method for tunnel structural defects includes: a traveling section; a supporting section, disposed on the traveling section, and including a rotatable telescopic platform, where two mechanical arms working in parallel are disposed on the rotatable telescopic platform; an inspection section, mounted on the supporting section, and configured to perform multi-scale inspection on surface defects and internal defects in different depth ranges of a same position of a tunnel structure, and transmit inspected defect information to a control section; and the control section, configured to: construct a deep neural network-based defect diagnosis model; construct a data set by using historical surface defect and internal defect information, and train the deep neural network-based defect diagnosis model; and receive multi-scale inspection information in real time, and automatically recognize types, positions, contours, and dielectric attributes of the internal and surface defects.

Testing systems and methods are provided for a smoking article to determine a characteristic of the smoking article, such as density of a material used therewith. The testing system may include a test fixture and an electromagnetic energy generating device The testing methods may be carried out by subjecting the material to the electromagnetic energy and determining the amount of energy absorbed by the material.

Provided is a method for investigating a cylindrical shape of a battery. The method for investigating a battery with an x-ray image comprises determining a center line of an inspected battery; setting a ROI (Region of Interest) of each partial area formed on base of the center line and obtaining each x-ray image of each partial area; and combining each x-ray image and obtaining a total x-ray image of the battery, wherein the partial areas are formed according to a transferring speed of the battery.

A method for calculating a laminate state of a CFRP laminate according to an embodiment includes acquiring a plurality of images of a cross section of the CFRP laminate orthogonal to a lamination direction by imaging the CFRP laminate with X-rays at a plurality of different positions in the lamination direction, the CFRP laminate including first layers including carbon fibers oriented in a first direction orthogonal to the lamination direction and second layers including carbon fibers oriented in a second direction orthogonal to the lamination direction and different from the first direction, and calculating a parameter correlated with a quantity of voids formed in the first layers and the second layers from the plurality of acquired images, and distinguishing between the first layers and the second layers using the calculated parameter.

A diagnostic support for a skin includes a radio-transparent structure that defines a folding surface of the skin and on which the skin may be stretched and consequently folded, thereby defining folded, mutually superimposed portions spaced apart from each other. The support may be used for radiographic inspection of a folded animal skin.

It is necessary to guarantee performance by quantitatively evaluating the defect detection sensitivity of an inspection device for using the mirror electron image to detect defect in a semiconductor substrate. The size and position of accidentally formed defects are random, however, and this type of quantitative evaluation has been difficult. This semiconductor substrate 101 for evaluation is for evaluating the defect detection sensitivity of an inspection device and comprises a plurality of first indentations 104 that are formed through the pressing, with a first pressing load, of an indenter having a prescribed hardness and shape into the semiconductor substrate for evaluation. Further, a mirror electron image of the plurality of first indentations of the semiconductor substrate for evaluation is acquired, and the defect detection sensitivity of an inspection device is evaluated through the calculation of the defect detection rate of the plurality of first indentations in the acquired mirror electron image.

Dynamic band contrast image (DBCI) is constructed with scattering patterns acquired at multiple scanning locations of a sample using a charged particle beam. Each pixel of the DBCI is generated by integrating the corresponding scattering pattern along a diffraction band. The DBCI includes charged particle channeling condition and can be used for detecting sample defects.

A method of non-destructive detection of surface and near surface abnormalities in a metallic product. The method comprises positioning a sample having a surface under a source of an incident radiation. The surface of the sample is then irradiated with the incident radiation from the source. A scattered radiation is detected and a radiation pattern from the detected scattered radiation is produced. Said radiation pattern is then analysed and the output indicative of the scattered radiation from the sample is produced. Said produced output is then compared with a threshold value, the threshold value indicative of a maximum acceptable detected surface abnormality. Finally, the presence of a surface abnormality is identified when the output exceeds the threshold value.

An inspection line comprises: at a finish inspection station, a finish inspection installation capable of detecting without contact, by light rays, check-type defects in the neck of the containers; at a base inspection station, a base inspection installation capable of detecting without contact, by light rays, check-type defects in the base of the containers; and at a radiographic measuring station, a radiographic installation for automatically measuring linear dimensions of at least one region to be inspected of containers. The three installations are each arranged at stations distinct from each other along a trajectory of displacement of the containers. In each installation, a section of the transport device ensures, in the inspection area of the installation, the transport of the containers along a rectilinear portion of the trajectory (T) in a horizontal conveying plane (Pc) perpendicular to the central axis of the containers.