In a method and a system for authenticating an object marked with XRF marking, a wavelength spectral profile is provided of a detected portion of an X-Ray signal arriving from an object in response to X-Ray or Gamma-Ray radiation applied to the object and the wavelength spectral profile is filtered to suppress trend and periodic components from the wavelength spectral profile to obtain a filtered profile with improved signal to noise or signal to clutter ratio. The object can be authenticated by processing the filtered profile and identifying one or more peaks therein, which satisfy a predetermined condition, whereby the wavelengths of the identified peaks are indicative of the signatures of materials included in the object.

A method for detecting defects in a product (10), such as food packaging, having a range of thicknesses of cross-section through which detection will take place; the method comprising: scanning the product (10), with for instance x-rays, to identify one or more light regions, and one or more dense regions of the product; and creating a first signal path and a second signal path from a single set of scanning data, and conditioning: the first signal path for detection of defects in the one or more dense regions; and the second signal path for detection of defects (14a, 14b, 14c) in the one or more light regions. Advantageously, detection of defects in the contents (dense region) of a product and the seal (light region) of the product is conducted simultaneously.

An ion beam analysis method to quantitatively measure the presence of fluorinated compounds in aqueous samples. The method is a quick, cost effective, nondestructive and quantitative, screen for the presence of fluorinated compounds in solution. The present invention includes a novel method of using an ion beam analysis method (such as PIGE) in air (ex vacuo) to unambiguously easily, quickly, accurately, precisely and cost effectively identify the presence of fluorinated compounds (such as PFASs) that have been extracted from aqueous solutions. The present invention may be used with a wide variety of aqueous solutions, including environmental groundwater samples, with little processing.

A system according to an exemplary aspect of the present disclosure includes, among other things, a generator-detector configured to be attached to a pipe. The generator-detector is configured to measure the concentration of mercury in the pipe in a non-destructive manner. A method is also disclosed.

Methods of preventing the formation of lamellar silica formation in a borosilicate glass container storing a pharmaceutical formulation in an interior of the glass container in accordance with embodiments of the disclosure can include washing the container and drying the container under extended dry conditions of at least 3000 ms.

A sample analysis system is provided with: a reference substance database including measurement results and component classification information of reference substances obtained by each analysis device on information of each reference substance; a reference substance designation unit; a measurement result collation unit to obtain the commonality of the components, the difference between the physical quantities of the respective components, and the degree of coincidence of the measurement results for each analysis device for the designated reference substance; an integration coincidence degree calculation unit to obtain an integration degree of coincidence; and a judgment unit to judge whether or not the difference between the contents of contained components is within an allowable range and classify the corresponding component based on the component classification information.

An inspection device inspects of goods that include plural articles that sometimes overlap each other. An X-ray inspection device irradiates goods containing plural articles having a predetermined shape and inspects the goods on the basis of inspection images obtained from radiation that has passed through the goods or radiation that has reflected off the goods. The X-ray inspection device includes a storage component, a learning component, and an inspection component. The storage component stores, as teaching images, at least the inspection images of the goods that are in a state in which the plural articles overlap each other. The learning component acquires, by machine learning using the teaching images stored in the storage component, features relating to the goods that are in a state in which the plural articles overlap each other. The inspection component inspects the goods using the features that the learning component has acquired.

A method and system for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising the steps of: surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof; sub-surface mapping the gemstone, mineral or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process; determining a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry; determining relative positioning between the surface normal and the optical beam path; and determining the location of artefacts and/or inclusions in the gemstone, mineral or sample thereof based on the sub-surface mapping step and the determined relative positioning.

Unknown particles on a surface of a semiconductor wafer are classified by applying a range of particles of known chemical composition and different sizes onto a test wafer, measuring the sizes of a plurality of the particles and spectrally analyzing a makeup of the particles by energy-dispersive x-ray spectroscopy, followed by ascertaining a substantive content therefrom; creating a best-fit curve to the size and substantive content of the particles; measuring the particle size of an unknown particle and recording its spectrum by energy-dispersive x-ray spectroscopy and classifying the unknown particle as the result of a comparison of the size and the substantive content of the unknown particle with the best-fit curve.

A nondestructive inspection apparatus makes a neutron beam incident on an inspection target, detects a specific gamma ray deriving from a target component in the inspection target, among gamma rays generated by the neutron beam, and determines a depth at which the target component exists, based on a result of the detecting. The nondestructive inspection apparatus includes a neutron source that emits a neutron beam to a surface of the inspection target, a gamma ray detection device that detects, as detection intensities, intensities of a plurality of types of specific gamma rays whose energy differs from each other, and a ratio calculation unit that determines a ratio between the detection intensities of a plurality of types of the specific gamma rays.