Patent classifications
G01Q30/16
Scanning probe microscope
Disclosed herein is a scanning probe microscope including a cantilever, a three-dimensional moving mechanism moving a sample stage in three dimensions, and a measurement chamber sealed not to be exposed to external air. At least the cantilever, the sample stage, and the three-dimensional moving mechanism are accommodated in the measurement chamber. The measurement chamber is provided with a pair of guide rails used to transport the sample stage. The sample stage has an engagement portion. The three-dimensional moving mechanism is disposed in the vicinity of a predetermined position and between the guide rails. The three-dimensional moving mechanism can be moved to above the guide rails and below the guide rails. When the sample stage is transported to the predetermined position in a horizontal direction, the three-dimensional moving mechanism is lifted up to the bottom surface of the sample stage so that the scanning probe microscope can perform measurement.
Damping base for modular scanning probe microscope head
An apparatus, including a scanning probe microscope base that includes a configured to be secured to an end of an insert in a cryostat; a top configured to be connected to a base of a scanning probe microscope head that is configured to be disposed inside the insert; and a damping system disposed between the frame and the top and comprising a bellows that seals the end of the insert. This sealing separates an ultra-high vacuum (UHV) environment in the insert from a high vacuum (HV) environment surrounding the end of the insert and also positions an upper surface of the top in the UHV environment.
Damping base for modular scanning probe microscope head
An apparatus, including a scanning probe microscope base that includes a configured to be secured to an end of an insert in a cryostat; a top configured to be connected to a base of a scanning probe microscope head that is configured to be disposed inside the insert; and a damping system disposed between the frame and the top and comprising a bellows that seals the end of the insert. This sealing separates an ultra-high vacuum (UHV) environment in the insert from a high vacuum (HV) environment surrounding the end of the insert and also positions an upper surface of the top in the UHV environment.
FROZEN SOLUTION SAMPLE PREPARATION DEVICE APPLICABLE TO ULTRA-HIGH VACUUM SYSTEM
Disclosed is a frozen solution sample preparation device applicable to an ultra-high vacuum system. The frozen solution sample preparation device includes: a sample stage, a compressible linear shift, a sample transfer chamber, a gate valve, a solution vessel and a vacuum pump; where the sample stage includes a cooling system and a sample preparation system; an interior of the compressible linear shift has a hollowed structure; a top end of the sample transfer chamber is hermetically connected to a bottom end of the compressible linear shift, the sample transfer chamber is connected to the interior of the compressible linear shift to form a connected chamber, and the connected chamber is connected to the vacuum pump; and the solution vessel is connected to a bottom end of the sample transfer chamber through the gate valve.
KITS, SYSTEMS, AND METHODS FOR TRANSFERRING SAMPLES BETWEEN VACUUM INSTRUMENTS
An adapter kit for transferring a sample between a first vacuum instrument and a second vacuum instrument. The kit includes a substantially planar sample holder comprising at least one holder tab, a transfer plate comprising a sample region, at least one plate tab, and at least one connection site, all disposed outside of the sample region, and a transfer adaptor comprising at least one protrusion adapted to be connected to the transfer plate via the at least one connection site to enable rotation and translation of the transfer plate. The plate tab is insertable behind a backside of the holder tab by a rotational movement of the transfer plate.
KITS, SYSTEMS, AND METHODS FOR TRANSFERRING SAMPLES BETWEEN VACUUM INSTRUMENTS
An adapter kit for transferring a sample between a first vacuum instrument and a second vacuum instrument. The kit includes a substantially planar sample holder comprising at least one holder tab, a transfer plate comprising a sample region, at least one plate tab, and at least one connection site, all disposed outside of the sample region, and a transfer adaptor comprising at least one protrusion adapted to be connected to the transfer plate via the at least one connection site to enable rotation and translation of the transfer plate. The plate tab is insertable behind a backside of the holder tab by a rotational movement of the transfer plate.