A scattering-type scanning near-field optical microscope at cryogenic temperatures (cryo-SNOM) configured with Akiyama probes for studying low energy excitations in quantum materials present in high magnetic fields. The s-SNOM is provided with atomic force microscopy (AFM) control, which predominantly utilizes a laser-based detection scheme for determining the cantilever tapping motion of metal-coated Akiyama probes, where the cantilever tapping motion is detected through a piezoelectric signal. The Akiyama-based cryo-SNOM attains high spatial resolution, good near-field contrast, and is able to perform imaging with a significantly more compact system capable of handling simultaneous demands of vibration isolation, low base temperature, precise nano-positioning, and optical access. Results establish the potential of s-SNOM based on self-sensing piezo-probes, which can easily accommodate near-IR and far-infrared wavelengths and high magnetic fields. Using a tuning fork-based Akiyama probe provides nano-imaging capability at room and low temperatures and is used for near-field photocurrent mapping.

System and method for optical alignment of a near-field system, employing reiterative analysis of amplitude (irradiance) and phase maps of irradiated field obtained in back-scattered light while adjusting the system to arrive at field pattern indicative of and sensitive to a near-field optical wave produced by diffraction-limited irradiation of a tip of the near-field system. Demodulation of optical data representing such maps is carried out at different harmonics of probe-vibration frequency. Embodiments are operationally compatible with methodology of chemical nano-identification of sample utilizing normalized near-field spectroscopy, and may utilize suppression of background contribution to collected data based on judicious coordination of data acquisition with motion of the tip. Such coordination may be defined without knowledge of separation between the tip and sample. Computer program product with instructions effectuating the method and operation of the system.

A probe for atomic force microscopy comprises a tip for atomic force microscopy oriented in a direction referred to as the longitudinal direction and protrudes from an edge of a substrate in the longitudinal direction, wherein the tip is arranged at one end of a shuttle attached to the substrate at least via a first and via a second structure, which structures are referred to as support structures, at least the first support structure being a flexible structure, extending in a direction referred to as the transverse direction, perpendicular to the longitudinal direction and anchored to the substrate by at least one mechanical linkage in the transverse direction, the support structures being suitable for allowing the shuttle to be displaced in the longitudinal direction. An atomic force microscope comprising at least one such probe is also provided.

The invention provides a nanoantenna scanning probe tip for microscropy or spectroscopy. The nanoantenna scanning probe tip includes a sharp probe tip covered with a contiguous film of predetermined sized and shaped plasmonic nanoparticles. A method for forming the nanoantenna scanning probe tip by trapping nanoparticles having a predetermined size and shape at a liquid surface using surface tension, forming a uniform and organized monolayer film on the liquid surface, and then transferring portions of the film to a sharp probe tip. In preferred embodiments, the sharp probe tip is one of a conductive STM (scanning tunneling microscopy) tip, a tuning fork tip or an AFM (atomic force microscopy) tip. The sharp tip can be blunted with an oxide layer.

Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (TERS), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.

A method of imaging a sample via scanning resonator microscopy is provided comprising positioning a whispering gallery mode (WGM) optical resonator at a first location over the surface of the sample, the WGM optical resonator characterized by at least one resonance frequency, wherein the WGM optical resonator is mounted to the free end of an atomic force microscopy (AFM) cantilever such that the WGM optical resonator moves with the AFM cantilever, and wherein the AFM cantilever is operably coupled to an AFM system configured to provide a topographical image of the sample; evanescently coupling excitation light into the WGM optical resonator; detecting light derived from the excitation light to monitor for a shift in the at least one resonance frequency induced by the surface of the sample; and repeating steps (a)-(c) at least at a second location over the surface of the sample.

A method of imaging a sample via scanning resonator microscopy is provided comprising positioning a whispering gallery mode (WGM) optical resonator at a first location over the surface of the sample, the WGM optical resonator characterized by at least one resonance frequency, wherein the WGM optical resonator is mounted to the free end of an atomic force microscopy (AFM) cantilever such that the WGM optical resonator moves with the AFM cantilever, and wherein the AFM cantilever is operably coupled to an AFM system configured to provide a topographical image of the sample; evanescently coupling excitation light into the WGM optical resonator; detecting light derived from the excitation light to monitor for a shift in the at least one resonance frequency induced by the surface of the sample; and repeating steps (a)-(c) at least at a second location over the surface of the sample.

Systems and methods that enable both spectroscopy and rapid chemical and/or optical imaging using a broadband light source. Broadband light sources may be advantageous for spectroscopy as they simultaneously illuminate a sample with a plurality of wavelengths and use interferometric techniques to determine a material response as a function of wavelength (or equivalently wavenumber). Some embodiments may enable the same radiation sources to be used to efficiently map the spatial distribution of chemical species or optical property variations. This may be achieved via selection of specific optical phase delays within an interferometer that are selected to maximize the contrast between different absorption bands or resonances within the sample. By optimally selecting specific interferometer phases it may be possible to construct images that substantially represent the material response to a specific wavelength excitation, without the necessity to obtain entire spectra at each sample location. This can provide orders of magnitude improvements in the measurement speed for required with a broadband source to provide compositional/optical property mapping.

Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (TERS), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.

System and method for measuring an optical property of a sub micrometer region of a sample including interacting a probe tip of a probe microscope with a region of the sample, illuminating the sample with a beam of light from a radiation source such that light is scattered from the probe-sample interaction region, interfering a reference beam with the scattered light wherein the reference beam has an adjustable optical phase, measuring with a detector at least a portion of the light scattered from probe-sample and background regions at a substantially constant reference phase, and constructing a signal indicative of the optical property of the sample wherein contributions from background scattered light are substantially suppressed.