G01Q60/16

Nano-indent Process for Creating Single Photon Emitters in a Two-dimensional Materials Platform

A nano-indent process for creating a single photon emitter in a two-dimensional materials platform comprising the steps of providing a substrate, providing a layer of polymer, providing a layer of two-dimensional material, utilizing a proximal probe, applying mechanical stress to the layer of two-dimensional material and to the layer of polymer, deforming the layer of two-dimensional material and the layer of polymer, and forming a nano-indent in the two-dimensional material. A single photon emitter in a two-dimensional materials platform comprising a substrate, a deformable polymer film, a two-dimensional material, and a nano-indent in the two-dimensional material.

Nano-indent Process for Creating Single Photon Emitters in a Two-dimensional Materials Platform

A nano-indent process for creating a single photon emitter in a two-dimensional materials platform comprising the steps of providing a substrate, providing a layer of polymer, providing a layer of two-dimensional material, utilizing a proximal probe, applying mechanical stress to the layer of two-dimensional material and to the layer of polymer, deforming the layer of two-dimensional material and the layer of polymer, and forming a nano-indent in the two-dimensional material. A single photon emitter in a two-dimensional materials platform comprising a substrate, a deformable polymer film, a two-dimensional material, and a nano-indent in the two-dimensional material.

Device integrated with scanning probe for optical nanofocusing and near-field optical imaging

A method for generating a high-intensity light source at a probe tip, the method includes exciting a TM.sub.0 mode of a surface plasmon polariton (SPP) in a sharp-tip metal nanowire (AgNW) waveguide with a linearly-polarized mode (LP.sub.01) in a tapered optical fiber (OF); and compressing the TM.sub.0 mode through a chemically-sharpened taper to a tip apex of the sharp-tip silver nanowire (AgNW).

Device integrated with scanning probe for optical nanofocusing and near-field optical imaging

A method for generating a high-intensity light source at a probe tip, the method includes exciting a TM.sub.0 mode of a surface plasmon polariton (SPP) in a sharp-tip metal nanowire (AgNW) waveguide with a linearly-polarized mode (LP.sub.01) in a tapered optical fiber (OF); and compressing the TM.sub.0 mode through a chemically-sharpened taper to a tip apex of the sharp-tip silver nanowire (AgNW).

ACTIVE NOISE ISOLATION FOR TUNNELING APPLICATIONS (ANITA)
20210025919 · 2021-01-28 ·

An active noise isolation apparatus and method for cancelling vibration noise from the probe signal of a scanning tunneling microscope by generating a correction signal by convolution based on the probe signal and the sensor signal, which is based on the ambient vibration that adds noise to the probe signal.

ACTIVE NOISE ISOLATION FOR TUNNELING APPLICATIONS (ANITA)
20210025919 · 2021-01-28 ·

An active noise isolation apparatus and method for cancelling vibration noise from the probe signal of a scanning tunneling microscope by generating a correction signal by convolution based on the probe signal and the sensor signal, which is based on the ambient vibration that adds noise to the probe signal.

Handling Device for Handling a Measuring Probe
20200326518 · 2020-10-15 ·

A handling apparatus for handling a measuring probe of a scanning probe microscope is disclosed. The measuring probe has a probe body and a probe tip which is coupled with the probe body by a cantilever. The handling apparatus includes a receiving device for receiving the measuring probe at a receiving area, a guide structure, in which the measuring probe is guidable while at the same time the probe body is at least partially limited and the cantilever and the probe tip are supported without contact, and a transport device for transporting the measuring probe from the receiving area along the guide structure to a target area.

Handling Device for Handling a Measuring Probe
20200326518 · 2020-10-15 ·

A handling apparatus for handling a measuring probe of a scanning probe microscope is disclosed. The measuring probe has a probe body and a probe tip which is coupled with the probe body by a cantilever. The handling apparatus includes a receiving device for receiving the measuring probe at a receiving area, a guide structure, in which the measuring probe is guidable while at the same time the probe body is at least partially limited and the cantilever and the probe tip are supported without contact, and a transport device for transporting the measuring probe from the receiving area along the guide structure to a target area.

DEVICE INTEGRATED WITH SCANNING PROBE FOR OPTICAL NANOFOCUSING AND NEAR-FIELD OPTICAL IMAGING

A method for generating a high-intensity light source at a probe tip, the method includes exciting a TM.sub.0 mode of a surface plasmon polariton (SPP) in a sharp-tip metal nanowire (AgNW) waveguide with a linearly-polarized mode (LP.sub.01) in a tapered optical fiber (OF); and compressing the TM.sub.0 mode through a chemically-sharpened taper to a tip apex of the sharp-tip silver nanowire (AgNW).

DEVICE INTEGRATED WITH SCANNING PROBE FOR OPTICAL NANOFOCUSING AND NEAR-FIELD OPTICAL IMAGING

A method for generating a high-intensity light source at a probe tip, the method includes exciting a TM.sub.0 mode of a surface plasmon polariton (SPP) in a sharp-tip metal nanowire (AgNW) waveguide with a linearly-polarized mode (LP.sub.01) in a tapered optical fiber (OF); and compressing the TM.sub.0 mode through a chemically-sharpened taper to a tip apex of the sharp-tip silver nanowire (AgNW).