A method for determining antifouling ability of a material surface is provided. The method includes (a) providing a determining device. The determining device includes a probe and a determining unit with a spring characteristic structure. The probe includes a micro particle or a micro particle and a pollutant fixed on a surface of the micro particle. The probe is fixed at one end of the spring characteristic structure. After the step (a), the method further includes (b) contacting the probe with a material surface-to-be-determined, (c) deforming the spring characteristic structure until the probe departs from the material surface-to-be-determined to recover the spring characteristic structure, and determining the level of the deformation, (d) determining the adhesion value of the probe to the material surface-to-be-determined using the deformation and (e) determining the antifouling ability of the material surface.

A method for determining antifouling ability of a material surface is provided. The method includes (a) providing a determining device. The determining device includes a probe and a determining unit with a spring characteristic structure. The probe includes a micro particle or a micro particle and a pollutant fixed on a surface of the micro particle. The probe is fixed at one end of the spring characteristic structure. After the step (a), the method further includes (b) contacting the probe with a material surface-to-be-determined, (c) deforming the spring characteristic structure until the probe departs from the material surface-to-be-determined to recover the spring characteristic structure, and determining the level of the deformation, (d) determining the adhesion value of the probe to the material surface-to-be-determined using the deformation and (e) determining the antifouling ability of the material surface.

A method of forming a micropattern, a substrate surface inspection apparatus, a cantilever set for an atomic force microscope, and a method of analyzing a surface of a semiconductor substrate, and a probe tip the method including forming pinning patterns on a semiconductor substrate; forming a neutral pattern layer in spaces between the pinning patterns; and inspecting a surface of a guide layer that includes the pinning patterns and the neutral pattern layer by using an atomic force microscope (AFM).

A method of forming a micropattern, a substrate surface inspection apparatus, a cantilever set for an atomic force microscope, and a method of analyzing a surface of a semiconductor substrate, and a probe tip the method including forming pinning patterns on a semiconductor substrate; forming a neutral pattern layer in spaces between the pinning patterns; and inspecting a surface of a guide layer that includes the pinning patterns and the neutral pattern layer by using an atomic force microscope (AFM).

A method for characterizing the interaction force between lignin and cellulase is provided. The method includes the following steps: (1) preparation of lignin film: preparing a lignin solution, then dropwise adding the solution onto a silicon wafer, repeatedly spin-coating with a spin coater, and vacuum-drying the prepared lignin film; (2) AFM probe modification: modifying an AFM probe coated with a gold film on the surface with HS-PEG-COOH and then activating the carboxyl group, immersing the AFM probe after the carboxyl group activation in a PBS solution of cellulase for incubation, and after the modification is completed, placing the washed AFM probe in a PBS buffer solution for storage for later use; (3) testing the lignin-cellulase interaction force by using an AFM instrument in a liquid phase environment. AFM is used to quantitatively characterize the interaction between the cellulase and lignin in a liquid environment.

A method for characterizing the interaction force between lignin and cellulase is provided. The method includes the following steps: (1) preparation of lignin film: preparing a lignin solution, then dropwise adding the solution onto a silicon wafer, repeatedly spin-coating with a spin coater, and vacuum-drying the prepared lignin film; (2) AFM probe modification: modifying an AFM probe coated with a gold film on the surface with HS-PEG-COOH and then activating the carboxyl group, immersing the AFM probe after the carboxyl group activation in a PBS solution of cellulase for incubation, and after the modification is completed, placing the washed AFM probe in a PBS buffer solution for storage for later use; (3) testing the lignin-cellulase interaction force by using an AFM instrument in a liquid phase environment. AFM is used to quantitatively characterize the interaction between the cellulase and lignin in a liquid environment.

A method for characterizing the interaction force between lignin and cellulase is provided. The method includes the following steps: (1) preparing a lignin solution, then dropwise adding the solution onto a silicon wafer, repeatedly spin-coating with a spin coater, and vacuum-drying the prepared lignin film; (2) modifying an AFM probe coated with a gold film on the surface with HS-PEG-COOH and then activating the carboxyl group, immersing the AFM probe after the carboxyl group activation in a PBS solution of cellulase for incubation, and after the modification is completed, placing the washed AFM probe in a PBS buffer solution for storage for later use; (3) testing the lignin-cellulase interaction force by using an AFM instrument in a liquid phase environment.

A method for characterizing the interaction force between lignin and cellulase is provided. The method includes the following steps: (1) preparing a lignin solution, then dropwise adding the solution onto a silicon wafer, repeatedly spin-coating with a spin coater, and vacuum-drying the prepared lignin film; (2) modifying an AFM probe coated with a gold film on the surface with HS-PEG-COOH and then activating the carboxyl group, immersing the AFM probe after the carboxyl group activation in a PBS solution of cellulase for incubation, and after the modification is completed, placing the washed AFM probe in a PBS buffer solution for storage for later use; (3) testing the lignin-cellulase interaction force by using an AFM instrument in a liquid phase environment.

A processing system cooperates with an atomic force microscope operating in ramp mode at a ramp frequency is configured to collect data indicative of at least one of physical and chemical properties of a sample. The system collects data indicative of probe movement at a frequency that is higher than the ramp frequency. This data comprises a second-order portion of the probe's signal. Based at least in part on the second-order portion, the processor obtains a parameter that is indicative at least one of a physical and a chemical property of a sample.