A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

The resonance structure is that two rows of ground via holes are placed symmetrically along two sides of the CB-CPW central conductor; each row of the via holes are equally spaced; every via hole connects a top shield plane layer, a first middle layer and a bottom shield plane layer of the magnetic probe; every via hole is placed out of a rectangle gap at the bottom of the magnetic probe; the via holes form a fence. The construction method: 1. constructing a simulation model formed by the magnetic probe and a 50 microstrip in a CST microwave studio; 2. simulation setting; 3. placing via holes along two sides of the central conductor; 4. connecting a 50 matching load to the second end of the microstrip and defining the first end as microstrip port1; defining the end on which mount a SMA connector as probe port2; simulating S21.

The resonance structure is that two rows of ground via holes are placed symmetrically along two sides of the CB-CPW central conductor; each row of the via holes are equally spaced; every via hole connects a top shield plane layer, a first middle layer and a bottom shield plane layer of the magnetic probe; every via hole is placed out of a rectangle gap at the bottom of the magnetic probe; the via holes form a fence. The construction method: 1. constructing a simulation model formed by the magnetic probe and a 50 microstrip in a CST microwave studio; 2. simulation setting; 3. placing via holes along two sides of the central conductor; 4. connecting a 50 matching load to the second end of the microstrip and defining the first end as microstrip port1; defining the end on which mount a SMA connector as probe port2; simulating S21.

The present invention provides a cantilever for a scanning type probe microscope, the cantilever including a support portion, a lever portion extending from the support portion, a protrusion portion formed on a free end side of the lever portion, an apex angle of the protrusion portion being an acute angle, and a probe in which a fine wire formed at a distal end of the protrusion portion is coated with a functional film, and a major axis/minor axis ratio of a cross-sectional shape of the probe is smaller than a major axis/minor axis ratio of a cross-sectional shape of the fine wire.

The present invention provides a cantilever for a scanning type probe microscope, the cantilever including a support portion, a lever portion extending from the support portion, a protrusion portion formed on a free end side of the lever portion, an apex angle of the protrusion portion being an acute angle, and a probe in which a fine wire formed at a distal end of the protrusion portion is coated with a functional film, and a major axis/minor axis ratio of a cross-sectional shape of the probe is smaller than a major axis/minor axis ratio of a cross-sectional shape of the fine wire.

Micro magnetic trap comprising a holder and a sample cell on said holder (5); means for providing a controllable homogeneous magnetic field (3) surrounding the sample cell; a modified micro-cantilever comprising a cantilever (1) having dimensions in the micron range and at least three paramagnetic microbeads with a diameter from 1 to 3 microns (2) attached to a bendable tip of the micro-cantilever such that they form a triangular arrangement; means for measuring the deflection of the micro-cantilever when the latter is in use (4). The trap does not require a specific surface functionalization in order to ensure an appropriate and selective linkage to a particular molecule.

Micro magnetic trap comprising a holder and a sample cell on said holder (5); means for providing a controllable homogeneous magnetic field (3) surrounding the sample cell; a modified micro-cantilever comprising a cantilever (1) having dimensions in the micron range and at least three paramagnetic microbeads with a diameter from 1 to 3 microns (2) attached to a bendable tip of the micro-cantilever such that they form a triangular arrangement; means for measuring the deflection of the micro-cantilever when the latter is in use (4). The trap does not require a specific surface functionalization in order to ensure an appropriate and selective linkage to a particular molecule.

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.