The present disclosure concerns a z-position motion stage for use in a scanning probe microscopy system, a scanning probe microscopy system, and a method of operating the motion stage. The motion stage (1) comprises, a scanner body (10) and a driving dither (30) for driving a cantilever (51) of a probe (50) associated to the driving dither in an oscillating motion (31). The stage further comprises at least a first force balancing means (60), that acts onto the scanner body at a position opposite the driving dither (30) across a neutral center (N) of the motion stage (1), wherein the force balancing means (60) comprises at least a first balance dither (61) configured to oscillate in harmony with the driving dither.

The present disclosure concerns a z-position motion stage for use in a scanning probe microscopy system, a scanning probe microscopy system, and a method of operating the motion stage. The motion stage (1) comprises, a scanner body (10) and a driving dither (30) for driving a cantilever (51) of a probe (50) associated to the driving dither in an oscillating motion (31). The stage further comprises at least a first force balancing means (60), that acts onto the scanner body at a position opposite the driving dither (30) across a neutral center (N) of the motion stage (1), wherein the force balancing means (60) comprises at least a first balance dither (61) configured to oscillate in harmony with the driving dither.

A scanning probe microscope is provided comprising a scanning probe (10), a holder (5) for holding a sample (SMP) in an environment free from liquid. A scanning arrangement (20) is provided therein for inducing a relative motion of the scanning probe (10) with respect to said sample (SMP) along a surface of the sample (SMP). A driver (30) generates a drive signal (Sd) to induce an oscillating motion of the scanning probe (10) relative to the surface of the sample to be scanned. A measuring unit (40) measure a deflection of the scanning probe (10), and provides a deflection signal (S) indicative for said deflection. An amplitude detector (50) detects an amplitude of the oscillating motion as indicated by the deflection signal (S) and provides an amplitude signal (Sa) indicative for the amplitude. The scanning probe (10) is at least partly arranged in a liquid (L) to dampen motion of said scanning probe, and therewith has a quality factor Q which is less than or equal than 5. The scanning probe (10) is accommodated in a casing (90) comprising said liquid (L), the scanning probe (10) comprising a flexible carrier (11), the flexible carrier having a movable part provided with a tip (12), which tip (12) extends through an opening (91) in said casing.

A scanning probe microscope is provided comprising a scanning probe (10), a holder (5) for holding a sample (SMP) in an environment free from liquid. A scanning arrangement (20) is provided therein for inducing a relative motion of the scanning probe (10) with respect to said sample (SMP) along a surface of the sample (SMP). A driver (30) generates a drive signal (Sd) to induce an oscillating motion of the scanning probe (10) relative to the surface of the sample to be scanned. A measuring unit (40) measure a deflection of the scanning probe (10), and provides a deflection signal (S) indicative for said deflection. An amplitude detector (50) detects an amplitude of the oscillating motion as indicated by the deflection signal (S) and provides an amplitude signal (Sa) indicative for the amplitude. The scanning probe (10) is at least partly arranged in a liquid (L) to dampen motion of said scanning probe, and therewith has a quality factor Q which is less than or equal than 5. The scanning probe (10) is accommodated in a casing (90) comprising said liquid (L), the scanning probe (10) comprising a flexible carrier (11), the flexible carrier having a movable part provided with a tip (12), which tip (12) extends through an opening (91) in said casing.

An active noise isolation apparatus and method for cancelling vibration noise from the probe signal of a scanning tunneling microscope by generating a correction signal by convolution based on the probe signal and the sensor signal, which is based on the ambient vibration that adds noise to the probe signal.

An active noise isolation apparatus and method for cancelling vibration noise from the probe signal of a scanning tunneling microscope by generating a correction signal by convolution based on the probe signal and the sensor signal, which is based on the ambient vibration that adds noise to the probe signal.